Patent classifications
H03L7/099
Clock data recovery circuit and display device including the same
A clock data recovery circuit includes the following elements: a phase detector for outputting a phase adjustment signal by comparing a clock signal of a first node and an input signal; a charge pump for adjusting a charge amount of a second node according to the phase adjustment signal; a first switch including one end coupled to the second node and including another end coupled to a third node; a second switch including one end which receives a bias voltage and including another end coupled to the third node; a capacitor including a first electrode coupled to the third node; third switches; and voltage control oscillators including control terminals coupled to the third node and including output terminals coupled to the first node through the third switches.
Clock data recovery circuit and display device including the same
A clock data recovery circuit includes the following elements: a phase detector for outputting a phase adjustment signal by comparing a clock signal of a first node and an input signal; a charge pump for adjusting a charge amount of a second node according to the phase adjustment signal; a first switch including one end coupled to the second node and including another end coupled to a third node; a second switch including one end which receives a bias voltage and including another end coupled to the third node; a capacitor including a first electrode coupled to the third node; third switches; and voltage control oscillators including control terminals coupled to the third node and including output terminals coupled to the first node through the third switches.
PHASE LOCKED LOOP CIRCUITRY
Phase Locked Loop, PLL, circuitry comprising a phase detector configured to generate a first pulse signal comprising at least one first pulse, a property of each first pulse being indicative of a phase difference between a reference signal and a feedback signal; a pulse repeater circuit configured, based on the first pulse signal, to generate a second pulse signal comprising, for each first pulse, a second pulse generated by repeating the corresponding first pulse; and an oscillator configured to generate the feedback signal and control a frequency of the feedback signal based on the second pulse signal.
PHASE LOCKED LOOP CIRCUITRY
Phase Locked Loop, PLL, circuitry comprising a phase detector configured to generate a first pulse signal comprising at least one first pulse, a property of each first pulse being indicative of a phase difference between a reference signal and a feedback signal; a pulse repeater circuit configured, based on the first pulse signal, to generate a second pulse signal comprising, for each first pulse, a second pulse generated by repeating the corresponding first pulse; and an oscillator configured to generate the feedback signal and control a frequency of the feedback signal based on the second pulse signal.
CLOCK CONVERSION DEVICE, TEST SYSTEM HAVING THE SAME, AND METHOD OF OPERATING TEST SYSTEM
Provided are a clock conversion device, a test system including the same, and a method of operating the test system. The clock conversion device includes a first clock generator configured to receive a first input clock signal from test logic and generate a first clock signal of which a frequency is multiplied and a phase is locked; a clock conversion circuit configured to receive the first clock signal and generate one or more second clock signals by converting at least one clock characteristic of the first clock signal; and an output selector configured to output any one of the first clock signal and the one or more second clock signals as an output clock signal, wherein the clock conversion device is configured to provide the output clock signal to a device under test (DUT).
CLOCK CONVERSION DEVICE, TEST SYSTEM HAVING THE SAME, AND METHOD OF OPERATING TEST SYSTEM
Provided are a clock conversion device, a test system including the same, and a method of operating the test system. The clock conversion device includes a first clock generator configured to receive a first input clock signal from test logic and generate a first clock signal of which a frequency is multiplied and a phase is locked; a clock conversion circuit configured to receive the first clock signal and generate one or more second clock signals by converting at least one clock characteristic of the first clock signal; and an output selector configured to output any one of the first clock signal and the one or more second clock signals as an output clock signal, wherein the clock conversion device is configured to provide the output clock signal to a device under test (DUT).
PHASE NOISE PERFORMANCE USING MULTIPLE RESONATORS WITH VARYING QUALITY FACTORS AND FREQUENCIES
Nested phase-locked loops (PLLs) utilize resonators of different quality factors, oscillation frequencies, and tunability. A reference clock signal for a first PLL is based on a free running bulk acoustic wave (BAW) resonator. The first PLL utilizes an LC oscillator as a voltage controlled oscillator. A crystal oscillator supplies a reference clock signal to a second PLL. Feedback dividers of the first and second PLLs are coupled to the LC oscillator. A delta sigma modulator coupled to the loop filter of the second PLL controls the feedback divider of the first PLL. The first PLL utilizes a high update rate to ensure that the jitter power spectral density is spread over a wide frequency range. The nested PLL architecture allows the overall phase noise plot to follow that of the crystal resonator at low frequencies, the BAW resonator at mid-frequencies, and the LC resonator at high frequencies.
Voltage droop monitoring circuits, system-on chips and methods of operating the system-on chips
In one embodiment, the voltage droop monitoring circuit includes a ring oscillator circuit block configured to generate a plurality of oscillation signals and configured to output a selected oscillation signal from one of the plurality of oscillation signals based on a first control signal. The first control signal is based on a power supply voltage of a functional circuit block. The voltage droop monitoring circuit further includes a counter configured to generate a count value based on the selected oscillation signal, and a droop detector configured detect droop in the power supply voltage of the functional circuit block based on the count value and at least one threshold value.
Drift compensation
The present disclosure relates to an electronic device comprising a first capacitor and a quartz crystal coupled in series between a first node and a second node; an inverter coupled between the first and second nodes; a first variable capacitor coupled between the first node and a third node; and a second variable capacitor coupled between the second node and the third node.
Frequency generation with dynamic switching between closed-loop operation and open-loop operation
Some examples relate to a frequency synthesizer. The frequency synthesizer includes an oscillator including an input terminal and an output terminal. A frequency locked-loop or phase-locked loop (FLL/PLL) unit is arranged on a feedback path extending between the output terminal of the oscillator and the input terminal of the oscillator. A switching unit is configured to selectively switch between a first mode of operation in which the feedback path is closed and the FLL/PLL unit is coupled to the input terminal of the oscillator, and a second mode of operation in which the feedback path is open and a ramping unit is coupled to the input terminal of the oscillator while the feedback path is open.