A method for precise acquisition of a signal of a sensor, by an evaluation and control unit which has a multiplexer at whose inputs there is at least one reference voltage whose voltage value is known, a ground potential of the reference voltage, a measurement signal of the exhaust gas sensor, and a ground potential of the measurement signal. A computer is connected downstream from the multiplexer via a transmission path and via an ADC that converts a voltage between its two inputs into a digital value. The method provides that a plurality of individual measurements are carried out in which switching states of the multiplexer are modified, and digital values are subsequently acquired at the output of the ADC. The computer calculates a measurement value, corrected with regard to offset and gain, from these digital values.

An input buffer circuit for an analog-to-digital converter is provided. The input buffer circuit includes a buffer amplifier. The buffer amplifier includes a first input node and a second input node each configured to receive a respective one of a first input signal and a second input signal forming a differential input signal pair for the analog-to-digital converter. The buffer amplifier further includes a first output node and a second output node each configured to output a respective one of a first buffered signal and a second buffered signal. In addition, the input buffer circuit includes feedback circuitry. The feedback circuitry is configured to generate, based on the first buffered signal and the second buffered signal, a first feedback signal and a second feedback signal for mitigating a respective unwanted signal component at the first input node and the second input node related to a limited reverse isolation of the amplifier buffer. The feedback circuitry is further configured to supply the first feedback signal to the first input node and the second feedback signal to the second input node.

An integrated circuit may include a full-scale reference generation circuit that corrects for variation in the gain or full scale of a set of interleaved analog-to-digital converters (ADCs). Notably, the full-scale reference generation circuit may provide a given full-scale or reference setting for a given interleaved ADC, where the given full-scale setting corresponds to a predefined or fixed component and a variable component (which may specify a given full-scale correction for a given full scale). For example, the full-scale reference generation circuit may include a full-scale reference generator replica circuit that outputs a fixed current corresponding to the fixed component. Furthermore, the full-scale reference generation circuit may include a full-scale reference generator circuit that outputs a first voltage corresponding to the given full-scale setting based at least in part on the fixed current and a variable current that, at least in part, specifies the given full-scale correction.

A digitizing circuit includes a port connectable to a device under test (DUT), an integrating analog-to-digital converter (ADC), a high-speed ADC, one or more processors to apply a digital filter to output samples of the high-speed ADC to produce filtered samples, find differences between the filtered samples and samples from the integrating ADC to produce error values, and add the error values to the output samples of the high-speed ADC. A method of producing a digital signal includes receiving an input analog signal at an integrating analog-to-digital converter (ADC) and a high-speed ADC, applying a digital filter to output samples of the high-speed ADC to produce filtered samples, the digital filter matched to timing and filtering of the integrating ADC, finding differences between the filtered samples to output samples of the integrating ADC to produce error values, and adding the error values to the output samples of the high-speed ADC.

According to one embodiment, a semiconductor integrated circuit includes a first converter, a second converter, and an adjustment circuit. The first converter is configured to sample an analog signal and convert the sampled analog signal to a first digital value based on a first clock signal. The second converter is configured to sample the analog signal and convert the sampled analog signal to a second digital value based on a second clock signal shifted a first phase from the first clock signal. The adjustment circuit is configured to adjust at least one of a gain of each of the first digital value and the second digital value and a phase of each of the first clock signal and the second clock signal based on the first digital value and the second digital value.

A signal converting apparatus includes a comparing device, a first digital-slope quantizer, and a second digital-slope quantizer. The comparing device having a first input terminal and a second input terminal for receiving a first received signal and a second received signal, and for generating an output signal at an output port. The first digital-slope quantizer generates a first set of digital signals to monotonically adjust the first received signal and the second received signal at the first input terminal and the second input terminal during a first phase according to a first quantization unit. The second digital-slope quantizer generates a second set of digital signals to monotonically adjust the first received signal and the second received signal at the first input terminal and the second input terminal during a second phase after the first phase according to a second quantization unit.

A signal converting apparatus includes a comparing device, a first digital-slope quantizer, and a second digital-slope quantizer. The comparing device has a first input terminal and a second input terminal for receiving a received signal and an adjustable reference voltage respectively, and for generating an output signal at an output port. The first digital-slope quantizer is coupled to the output port and the second input terminal for generating a first set of digital signals to monotonically adjust the adjustable reference voltage at the second input terminal during a first phase according to a first quantization unit. The second digital-slope quantizer is coupled to the output port and the second input terminal for generating a second set of digital signals to monotonically adjust the adjustable reference voltage at the second input terminal during a second phase after the first phase according to a second quantization unit.

An N-channel interleaved Analog-to-Digital Converter (ADC) has a variable delay added to each ADC's input sampling clock. The variable delays are each programmed by a Successive-Approximation-Register (SAR) during calibration to minimize timing skews between channels. Each channel receives a sampling clock with a different phase delay. The sampling clocks are overlapping multi-phase clocks rather than non-overlapping. Overlapping the multi-phase clocks allows the sampling pulse width to be enlarged, providing more time for the sampling switch to remain open and allow analog voltages to equalize through the sampling switch. Higher sampling-clock frequencies are possible than when non-overlapping clocks are used. The sampling clock is boosted in voltage by a bootstrap driver to increase the gate voltage on the sampling switch, reducing the ON resistance. Sampling clock and component timing skews are reduced to one LSB among all N channels.

An analog-to-digital conversion system includes: a first conversion device configured to communicate with a first analog-to-digital converter configured to convert a first analog signal into a first digital signal; a second conversion device configured to communicate with a second analog-to-digital converter configured to convert a second analog signal into a second digital signal; a first reference low power supply; and a second reference low power supply. The first conversion device is configured to correct the first digital signal, based on a variation amount of a second reference low voltage or a second reference low current. The second conversion device is configured to correct the second digital signal, based on a variation amount of a first reference low voltage or a first reference low current.

An integrated circuit may include a full-scale reference generation circuit that corrects for variation in the gain or full scale of a set of interleaved analog-to-digital converters (ADCs). Notably, the full-scale reference generation circuit may provide a given full-scale or reference setting for a given interleaved ADC, where the given full-scale setting corresponds to a predefined or fixed component and a variable component (which may specify a given full-scale correction for a given full scale). For example, the full-scale reference generation circuit may include a full-scale reference generator replica circuit that outputs a fixed current corresponding to the fixed component. Furthermore, the full-scale reference generation circuit may include a full-scale reference generator circuit that outputs a first voltage corresponding to the given full-scale setting based at least in part on the fixed current and a variable current that, at least in part, specifies the given full-scale correction.