A high resolution analog to digital converter (ADC) with improved bandwidth senses an analog signal (e.g., a load current) to generate a digital signal. The ADC operates based on a load voltage produced based on charging of an element (e.g., a capacitor) by a load current and a digital to analog converter (DAC) output current (e.g., from a N-bit DAC). The ADC generates a digital output signal representative of a difference between the load voltage and a reference voltage. This digital output signal is used directly, or after digital signal processing, to operate an N-bit DAC to generate a DAC output current that tracks the load current. In addition, quantization noise is subtracted from the digital output signal thereby extending the operational bandwidth of the ADC. In certain examples, the operational bandwidth of the ADC extends up to 100s of kHz (e.g., 200-300 kHz), or even higher.

Mechanisms for reducing or eliminating a quantization error caused by a quantizer of a continuous-time (CT) residue generation system are disclosed. In particular, systems and methods described herein are based on using a dither generation and injection circuit that can perform a high-pass filtering of the additive dither signal (i.e., a high-pass shaped dither signal). Using high-pass shaped dither signals is expected to improve quantizer linearity without significantly reducing the available error correction range. The applied dither may be particularly effective at minimizing signal-dependent distortion in ADC output spectrum caused by the quantizer when the quantization error cancellation accuracy may be insufficient.

A reference voltage generator comprises a comparator, a digital-to-analog converter (DAC) and a switched capacitor accumulator. The comparator receives a reference voltage input, a feedback input, and a control signal. The DAC is coupled to an output of the comparator, and the switched capacitor accumulator is coupled to an output of the DAC. In some implementations, a digital filter is coupled between the output of the comparator and the input of the DAC. The switched capacitor accumulator can be coupled to a buffer that outputs the feedback input and a reference voltage for an analog-to-digital converter (ADC). In some implementations, the feedback loop includes N one-bit DACs coupled to the output of the comparator and N switched capacitor accumulators, each of which is coupled to a unique one-bit DAC.

An N-channel interleaved Analog-to-Digital Converter (ADC) has a variable delay added to each ADC's input sampling clock. The variable delays are each programmed by a Successive-Approximation-Register (SAR) during calibration to minimize timing skews between channels. Each channel receives a sampling clock with a different phase delay. The sampling clocks are overlapping multi-phase clocks rather than non-overlapping. Overlapping the multi-phase clocks allows the sampling pulse width to be enlarged, providing more time for the sampling switch to remain open and allow analog voltages to equalize through the sampling switch. Higher sampling-clock frequencies are possible than when non-overlapping clocks are used. The sampling clock is boosted in voltage by a bootstrap driver to increase the gate voltage on the sampling switch, reducing the ON resistance. Sampling clock and component timing skews are reduced to one LSB among all N channels.

An N-channel interleaved Analog-to-Digital Converter (ADC) has a variable delay added to each ADC's input sampling clock. The variable delays are each programmed by a Successive-Approximation-Register (SAR) during calibration to minimize timing skews between channels. In each channel the ADC output is filtered, and a product derivative correlator generates a product derivative factor for correlation to two adjacent ADC channels. A matrix processor arranges the product derivative factors from the product derivative correlators into a matrix that is multiplied by a correlation matrix. The correlation matrix is a constant generated from an N×N shift matrix. The matrix processor outputs a sign-bit vector. Each bit in the sign-bit vector determines when tested SAR bits are set or cleared to adjust a channel's variable delay. Sampling clock and component timing skews are reduced to one LSB among all N channels.

According to an aspect of the inventive concept, there is provided an apparatus for processing an output signal of an analog-digital converter, includes: a first frequency conversion unit for converting a frequency of the output signal of the analog-digital converter so that a band where spurious components exist moves to a band where direct current components exist in the output signal of the analog-digital converter; a spurious component blocking unit for eliminating, from an output signal of the first frequency conversion unit, spurious components which have moved to the band where direct current components exist; and a second frequency conversion unit for restoring a frequency of an output signal of the spurious component blocking unit to the original frequency of the output signal of the analog-digital converter.

In one embodiment, a method for converting an input digital signal into an analog signal is provided. The method comprises modulating the input digital signal into a modulated digital signal, and converting the modulated digital signal into the analog signal using a digital-to-analog converter (DAC). The modulation shapes quantization noise of the DAC to place a notch at a frequency within an out-of-bound frequency band to reduce the quantization noise within the out-of-bound frequency band.

A sampled analog circuit is divided into at least two segments, each segment receiving sampled analog data and a respective subset of bits of a filter coefficient. The at least two segments can have digital-to-capacitance circuits with substantially identical ranges of capacitance values. One or more outputs from the segments can be scaled to reflect a position of the subset of bits in the bits of the filter coefficient, and thereafter added in the analog domain to produce a filtered output signal that may then be digitized. Alternatively, the outputs from the segments may be digitized before being scaled and/or added in the digital domain.

A high resolution analog to digital converter (ADC) with improved bandwidth senses an analog signal (e.g., a load current) to generate a digital signal. The ADC operates based on a load voltage produced based on charging of an element (e.g., a capacitor) by a load current and a digital to analog converter (DAC) output current (e.g., from a N-bit DAC). The ADC generates a digital output signal representative of a difference between the load voltage and a reference voltage. This digital output signal is used directly, or after digital signal processing, to operate an N-bit DAC to generate a DAC output current that tracks the load current. In addition, quantization noise is subtracted from the digital output signal thereby extending the operational bandwidth of the ADC. In certain examples, the operational bandwidth of the ADC extends up to 100s of kHz (e.g., 200-300 kHz), or even higher.

Disclosed are an analog-to-digital converter (ADC), an electronic device including the ADC, and an operating method of the ADC. The ADC includes a first stage that includes a plurality of channels, generates a first sampling signal by sequentially sampling a first analog signal based on time interleaving, and generates a first digital signal and a first residual signal corresponding to the first analog signal by performing analog-to-digital conversion based on the first sampling signal, an amplifier that amplifies the first residual signal, and a second stage that includes a plurality of channels, generates a second sampling signal by sequentially sampling the amplified first residual signal based on time interleaving, and generates a second digital signal and a second residual signal corresponding to the first analog signal by performing analog-to-digital conversion based on the second sampling signal. The number of the plurality of channels included in the first stage is odd-numbered.