Patent classifications
H03M1/0634
Multi-path analog front end and analog-to-digital converter for a signal processing system
In accordance with embodiments of the present disclosure, a processing system may include multiple selectable processing paths for processing an analog signal in order to reduce noise and increase dynamic range. Techniques are employed to transition between processing paths and calibrate operational parameters of the two paths in order to reduce or eliminate artifacts caused by switching between processing paths.
Cyclic ADC with voting and adaptive averaging
A cyclic analog to digital converter for digitizing an output from a photoplethysmography sensor has a buffer amplifier for setting a voltage of the feedback capacitance. Additionally, digital averaging circuit is preferably provided for averaging the digital output from the cyclic analog to digital converter for the several conversions. Finally, voting logic is additionally provided for declaring the digital bits based on successive comparisons by the one or more comparators.
Method to detect blocker signals in interleaved analog-to-digital converters
A time-skew adjustment circuit includes an input to receive a series of samples of an input signal from a plurality of channels of an interleaved ADC. A first subtractor calculates distances between consecutive samples in the received series of samples, and a plurality of average circuit code and a plurality of memory banks to calculate a plurality of first average distance, each corresponding to an average of the distance between consecutive samples from a respective pair of channels of the interleaved ADC. Time-skew detection circuitry calculates respective time skews between each of the pairs of channels by comparing each of the first average distances with an average of the distances between consecutive samples from the plurality of channels. Divergence control circuitry determines an accuracy of the time skews based at least in part on the first average distances and a Nyquist zone associated with the input signal.
A/D converter circuit and semiconductor integrated circuit
An analog-to-digital converter circuit having a simple design and capable of preventing an increase in surface area and other problems. An analog-to-digital converter circuit for converting an analog input signal to a digital quantity includes an analog-to-digital converter unit that converts analog input signals to pre-correction digital values, and a corrector unit that digitally corrects the pre-connection digital values output from the analog-to-digital converter unit. The corrector unit includes a weighting coefficient multiplier unit that outputs a post-correction digital value obtained by multiplying the weighting coefficients provided for each bit by each bit of the pre-correction digital value output from the A/D converter unit and summing them, and a weighting coefficient search unit that searches for weighting coefficients so as to minimize an error signal generated based on the post-correction digital value and an approximate value for the post-correction digital value.
Ramp analog-digital converter able to provide an average of two signals directly
Ramp analog-digital converters used in matrix image sensors to provide a digital value representative of a level of illumination of a pixel are provided. Two voltage samples are applied to a comparator, a counter is used to count pulses at a frequency F from a starting instant of the ramp until a toggling of the comparator. Two other voltage samples, one of which is added to a linear voltage ramp having an identical starting instant and slope to the first ramp, are applied to a second comparator, a half counting frequency F/2 is applied to the counter from the toggling of one of the comparators, and the content of the counter at the moment of toggling of the other comparator is stored. Two measurements of samples of the same signal or of two different signals are averaged without undergoing a digital conversion for each signal and a digital addition.
Analog to digital conversion device, illuminance sensor device, and electronic apparatus comprising the illuminance sensor device
An analog to digital conversion device has a plurality of, two, for example, analog to digital converters, and a reference charge quantity interchange section arranged and configured to interchange, among the plurality of analog to digital converters, reference quantities of electric charge (e.g., reference currents or reference capacitances) to be used therein during an analog to digital conversion period.
A/D CONVERTER CIRCUIT AND SEMICONDUCTOR INTEGRATED CIRCUIT
An analog-to-digital converter circuit having a simple design and capable of preventing an increase in surface area and other problems. An analog-to-digital converter circuit for converting an analog input signal to a digital quantity includes an analog-to-digital converter unit that converts analog input signals to pre-correction digital values, and a corrector unit that digitally corrects the pre-connection digital values output from the analog-to-digital converter unit. The corrector unit includes a weighting coefficient multiplier unit that outputs a post-correction digital value obtained by multiplying the weighting coefficients provided for each bit by each bit of the pre-correction digital value output from the A/D converter unit and summing them, and a weighting coefficient search unit that searches for weighting coefficients so as to minimize an error signal generated based on the post-correction digital value and an approximate value for the post-correction digital value.
A/D converter circuit and semiconductor integrated circuit
An analog-to-digital converter circuit having a simple design and capable of preventing an increase in surface area and other problems. An analog-to-digital converter circuit for converting an analog input signal to a digital quantity includes an analog-to-digital converter unit that converts analog input signals to pre-correction digital values, and a corrector unit that digitally corrects the pre-connection digital values output from the analog-to-digital converter unit. The corrector unit includes a weighting coefficient multiplier unit that outputs a post-correction digital value obtained by multiplying the weighting coefficients provided for each bit by each bit of the pre-correction digital value output from the A/D converter unit and summing them, and a weighting coefficient search unit that searches for weighting coefficients so as to minimize an error signal generated based on the post-correction digital value and an approximate value for the post-correction digital value.
Measurement unit configured to provide a measurement result value
A measurement unit is disclosed and includes a converter unit and a processing unit is configured to provide a measurement result value, based on a first input signal and a second input signal. The converter unit is configured to provide a first digital, quantized values based on the first input signal or derived from the first input signal and the second input signal. The converter unit is further configured to provide second digital, quantized values based on the second input signal. The measurement unit is configured to change the one or more control signals of the converter unit between determination of different first values or a determination of the different second values, wherein different first values and/or different second values are provided using different converter quantization step sizes.
Signal processing device
There is provided a signal processing device comprising a combination unit (3) configured to combine plural element signals based on plural physical quantity signals including signal components in accordance with desired physical quantities, respectively, by the number of times equal to or greater than a number of the plural physical quantity signals, and to output combined signals different from each other; a measuring unit (4) configured to sequentially receive the combined signals output from the combination unit (3); and a computing unit (5) configured to compute signal components based on the desired physical quantities from signals that are generated based on the combined signals sequentially output from the measuring unit.