Methods and systems are provided for circuits. One method is for increasing device threshold voltage distribution of a plurality of devices of a circuit. The method includes adjusting a device threshold voltage of the plurality of devices by different amounts; and selecting a subset of the plurality of devices with adjusted device threshold voltage by a device selection module for performing a function associated with the circuit. In one aspect, a system for device threshold voltage adjustment is provided. The system includes a sensor module for sensing one or more of temperature and voltage values of a die having a plurality of devices for a circuit; and a threshold temperature and voltage compensation module for receiving an input value from the sensor module to compensate variation in a device threshold voltage caused by changes of one or more of temperature and voltage of the die.

Methods and devices are provided for circuits. One device includes an adjustment circuit having an adjustable resistor for modifying a resistance value of a resistive device, the adjustment circuit connected to an adjustment terminal of the resistive device. The resistance value of the adjustable resistor changes, when a voltage or charge on the adjustment terminal of the adjustable resistor is changed. The adjustable resistor is a phase change element with an adjusting terminal to which different voltage values are applied for adjusting a conversion device threshold value.

A high-speed successive approximation analog-to-digital converter of two bits per cycle, includes three switches, two capacitor arrays, three comparators, an encoding circuit, a first switch array corresponding to the first capacitor array, a second switch array corresponding to the second capacitor array, a shifting register and a digital correction unit. The analog-to-digital converter, featuring doubled speed, realizes a successive approximation process without any fault when a high-bit large capacitor is unsettled. Thus no redundancy bit capacitor is required to compensate for unsettled pre-stage large capacitor. By using the encoding circuit, a thermometer code is converted into a binary code effectively, and inherent errors of comparators are reduced by the randomization of three comparators.

A plurality of devices of a circuit perform a function associated with the circuit. A compensation module obtains a temperature value and/or core voltage value associated with the circuit and uses the temperature value and/or the core voltage value to adjust at least one device of the plurality of devices. The adjustment may include using one or more source resisters connected to the at least one device of the plurality of devices to adjust a device voltage threshold. The plurality of devices may perform analog to digital conversion, and the compensation module may generate a digital offset value using the temperature value and/or the core voltage value and add or subtract the digital offset value from an unadjusted digital output value to compensate for a change in the temperature value and/or the core voltage value.

A digital technique to reduce or minimize switching in a DAC by using a partial DAC data ignore switching mode. In the partial DAC data ignore switching mode, a control circuit compares first and second data, such a first and second digital words, and operates corresponding switches only when the first data differ from the second data. The techniques are applicable to many types of DACs, including voltage output DACs, current output DACs, variable resistance DACs, digital rheostats, digital potentiometers, digiPOTs.

In one aspect a system is provided. The system a plurality of flash compare modules to output a set of unordered output signals based on an analog input signal; a plurality of device selection modules that receive the unordered output signals and generate ordered signals representing the analog input; and a temperature and voltage compensation module for receiving one or more of temperature and voltage signals from at least a temperature and voltage sensor module that senses one or more of temperature and voltage values that are used to compensate for changes in output signals caused by changes in one or more of die temperature and core voltage.

A semiconductor device includes a comparison circuit that compares an input analog voltage with a plurality of reference voltages, which are arranged in an ascending order in voltage level, to thereby obtain a plurality of comparison signals arranged in an order corresponding to the order of the reference voltage, a first correction circuit that corrects each of the comparison signals using another one of the comparison signals adjacent to the each comparison signal at a first side thereof, to thereby output a plurality of first correction signals arranged in an order corresponding to the order of the comparison signals, and a second correction circuit that corrects each of the first correction signals using another one of first correction signals adjacent to the each first correction signal at a second side thereof, to thereby output a plurality of second correction signals. The second side is different from the first side.

In one aspect a system is provided. The system a plurality of flash compare modules to output a set of unordered output signals based on an analog input signal; a plurality of device selection modules that receive the unordered output signals and generate ordered signals representing the analog input; and a temperature and voltage compensation module for receiving one or more of temperature and voltage signals from at least a temperature and voltage sensor module that senses one or more of temperature and voltage values that are used to compensate for changes in output signals caused by changes in one or more of die temperature and core voltage.

An analog to digital converter contain a plurality of comparators, each having a plurality of positive input voltage transistors and a plurality of negative input voltage transistors. Each positive input transistor is in communication with a positive input voltage, and each negative input transistor is in communication with a negative input voltage. Each comparator is configured to adjust a positive reference voltage and a negative reference voltage used to generate a binary comparator output for each comparator indicating a result of a comparison between a voltage differential defined by the positive input voltage and the negative input voltage and a unique voltage range indicated by a unique digital reference signal communicated to each comparator.

A semiconductor device includes a comparison circuit that compares an input analog voltage with a plurality of reference voltages, which are arranged in an ascending order in voltage level, to thereby obtain a plurality of comparison signals arranged in an order corresponding to the order of the reference voltage, a first correction circuit that corrects each of the comparison signals using another one of the comparison signals adjacent to the each comparison signal at a first side thereof, to thereby output a plurality of first correction signals arranged in an order corresponding to the order of the comparison signals, and a second correction circuit that corrects each of the first correction signals using another one of first correction signals adjacent to the each first correction signal at a second side thereof, to thereby output a plurality of second correction signals. The second side is different from the first side.