A phase-locked loop (PLL) includes a spur cancellation circuit that receives a residue signal indicative of a first frequency and receives a residual phase error signal and generates a spur cancellation signal. A summing circuit combines the spur cancellation signal and a first phase error signal corresponding to a phase difference between a reference signal and a feedback signal in the PLL and generates a second phase error signal with a reduced spurious tone at the first frequency.

An automated test equipment for analyzing an analog time domain output signal of an electronic device under test includes: an analog-to-digital converter configured for converting an analog time domain signal; a sampling clock configured for producing a clock signal; a time-to-frequency converter configured for converting the digital time domain signal into a digital frequency domain signal so that the digital frequency domain signal is represented by frequency bins; a memory device configured for storing a set of empirically determined operating parameters; and a jitter components removal module for removing jitter components produced by the analog-to-digital converter, wherein the jitter removal module is configured for subtracting the lower spur and the upper spur of each frequency bin of the frequency bins from the digital frequency domain signal so that the cleaned digital frequency domain signal is produced.

A time-interleaved analog to digital converter (TI-ADC) includes a first sub-ADC configured to sample and convert an input analog signal to generate a first digital signal and a second sub-ADC configured to sample and convert said input analog signal to generate a second digital signal. Sampling by the second sub-ADC occurs with a time skew mismatch. A multiplexor interleaves the first and second digital signals to generate a third digital signal. A time skew mismatch error determination circuit processes the first and second digital signals to generate a time error corresponding to the time skew mismatch. A slope value of said third digital signal is determined and multiplied by the time error to generate a signal error. The signal error is summed with the third digital signal to generate a digital output signal which eliminates the error due to the time skew mismatch. This correction is performed in real time.

A receiver circuit includes an interleaved ADC, a first delay circuit, a second delay circuit, a first processing channel, a second processing channel, and an interleaving ADC timing error detector circuit. The interleaved ADC includes a first ADC and a second ADC in parallel. The first delay circuit delays a first clock signal provided to the first ADC. The second delay circuit delays a second clock signal provided to the second ADC. The first processing channel processes data samples provided by the first ADC, and includes a first slicer. The second processing channel processes data samples provided by the second ADC, and includes a second slicer. The interleaving ADC timing error detector circuit controls delay of the first delay circuit and the second delay circuit based on an output signal of the first slicer, and an output signal or an input signal of the second slicer.

Described are apparatus and methods for low power frequency clock generation and distribution. A device includes a low power generation and distribution circuit configured to generate and distribute a differential 1/N sampling frequency (F.sub.S)(F.sub.S/N) clock, wherein N is larger or equal to 2, and a differential frequency doubler configured to generate a single-ended multiplied frequency clock from the differential F.sub.S/N frequency clock, and convert the single-ended multiplied frequency clock to a differential multiplied frequency clock for use by one or more data processing channels.

A multi-layer time-interleaving (TI) device and method of operation therefor. This device includes a plurality of TI layers configured to receive a plurality of input clock signals and to output a plurality of output clock signals, each of which can be configured to drive subsequent devices. The layers include at least a first and second layer including a fine-grain propagation device and a barrel-shifting propagation device configured to retime the plurality of input clock signals to produce divided output clock signals. The device can include additional barrel-shifting propagation devices to time interleave an initial two layers to produce one or more additional layers. Using negative phase stepping, the plurality of output clock signals is produced with optimal timing margin and synchronized on a single clock edge.

An analog-to-digital converter (ADC) system includes a main ADC, a reference ADC, a sampling control circuit, and a calibration circuit. The main ADC obtains a first sampled input voltage by sampling an analog input according to a first sampling clock, and performs analog-to-digital conversion upon the first sampled voltage to generate a first sample value. The reference ADC obtains a second sampled voltage by sampling the analog input according to a second sampling clock, and performs analog-to-digital conversion upon the second sampled voltage to generate a second sample value. The sampling control circuit controls the second sampling clock to ensure that the second sampling clock and the first sampling clock have a same frequency but different phases, and adjusts the second sample value to generate a reference sample value. The calibration circuit applies calibration to the main ADC according to the first sample value and the reference sample value.

An interleaved analog-to-digital conversion (ADC) system may have timing errors in a time domain that is corrected using phase compensation in a phase domain. The ADC system may include sub-ADCs, each receiving a clock signal, which is associated with a representation of a timing skew value, reflecting an undesired timing error. A mixer may have sub-mixers, each receiving a sub-ADC output signal and a compensated numerically controlled oscillator (NCO) value. A combiner may combine the sub-mixer output signals. A decimator may decimate the output of the combiner. Each timing skew value is in a time domain. A compensated NCO value is determined using a respective phase skew value. Each phase skew value is an offset value in phase and is not a value in time. Each phase skew value in a phase domain compensates the respective timing skew value in a time domain. Multiple ADC systems and methods are described.

Described herein are techniques for mitigating bandwidth mismatch in time-interleaved (TI) analog-to-digital converters (ADC). The techniques described herein involve spreading the energy associated with spurious tones resulting from bandwidth mismatch across the frequency spectrum, thereby reducing the overall impact of each individual tone. In some embodiments, for example, the tones may disappear under the noise floor. Spreading the energy associated with the spurious tones can be achieved by increasing the periodicity of the phase oscillation. This, in turn, can be achieved by introducing, in the phase oscillation, artificial phase shifts in addition to the phase shifts arising due to bandwidth mismatch. In one example, increasing the periodicity of a phase oscillation from 4 phase samples to 8 phase samples can result in a reduction in the power of a tone as high as 7 dB.

In certain aspects, a method for providing a first drive clock signal and a second drive clock signal to a first sub-digital-to-analog converter (sub-DAC) and a second sub-DAC includes receiving an input clock signal, and dividing the input clock signal to generate a first divided clock signal and a second divided clock signal. The method also includes gating the input clock signal using the first divided clock signal to generate the first drive clock signal, and inputting the first drive clock signal to a clock input of the first sub-DAC. The method further includes gating the input clock signal using the second divided clock signal to generate the second drive clock signal, and inputting the second drive clock signal to a clock input of the second sub-DAC.