An N-channel interleaved Analog-to-Digital Converter (ADC) has a variable delay added to each ADC's input sampling clock. The variable delays are each programmed by a Successive-Approximation-Register (SAR) during calibration to minimize timing skews between channels. In each channel the ADC output is filtered, and a product derivative correlator generates a product derivative factor for correlation to two adjacent ADC channels. A matrix processor arranges the product derivative factors from the product derivative correlators into a matrix that is multiplied by a correlation matrix. The correlation matrix is a constant generated from an N×N shift matrix. The matrix processor outputs a sign-bit vector. Each bit in the sign-bit vector determines when tested SAR bits are set or cleared to adjust a channel's variable delay. Sampling clock and component timing skews are reduced to one LSB among all N channels.

An N-channel interleaved Analog-to-Digital Converter (ADC) has a variable delay added to each ADC's input sampling clock. The variable delays are each programmed by a Successive-Approximation-Register (SAR) during calibration to minimize timing skews between channels. Each channel receives a sampling clock with a different phase delay. The sampling clocks are overlapping multi-phase clocks rather than non-overlapping. Overlapping the multi-phase clocks allows the sampling pulse width to be enlarged, providing more time for the sampling switch to remain open and allow analog voltages to equalize through the sampling switch. Higher sampling-clock frequencies are possible than when non-overlapping clocks are used. The sampling clock is boosted in voltage by a bootstrap driver to increase the gate voltage on the sampling switch, reducing the ON resistance. Sampling clock and component timing skews are reduced to one LSB among all N channels.

SAR ADC and sampling method based on single-channel TIS. The SAR ADC comprises: a capacitor array comprising a weight capacitor and a compensation capacitor, a first switch array, a second switch array, a channel switch group and a sampling switch; when in a sampling state: a lower plate of the weight capacitor is connected to an input voltage by means of the first switch array, and an upper plate of the capacitor array is connected to a common mode voltage by the sampling switch and the channel switch group; when in a successive approximation state: the lower plate of the weight capacitor is connected to a reference voltage by the second switch array. Input signals are sampled by using a unified to sampling switch, which solves the problem in the traditional technology that sampling moments are mismatched due to different sampling signals in each time-interleaved channel.

An electronic device may include digital circuitry to operate via digital signals and analog circuitry to operate via analog signals. The electronic device may also include a fractal digital to analog converter (DAC) to convert a digital signal into an analog signal. The fractal DAC may include a unit cell array having a branching data path and multiple unit cells disposed in a fractal pattern. The fractal DAC may also include multiple decision units disposed within the unit cell array on the branching data path. Each decision unit may receive an incoming signal representative of at least a portion of the digital signal and direct each decision unit output to different branches of the unit cell array. The unit cells may be enabled based at least in part on the decision unit outputs to generate the analog signal.

The present disclosure relates to a dual-clock generation circuit and method and an electronic device, and relates to the technical field of integrated circuits. The dual-clock generation circuit includes: a first inverter module, configured to access a first signal and output a first clock output signal; a second inverter module, configured to access a second signal and output a second clock output signal, where the first signal and the second signal are opposite clock signals; a first feedforward buffer, disposed between an input terminal of the first inverter module and an output terminal of the second inverter module, and configured to transmit the first signal to compensate for the second clock output signal.

Described are apparatus and methods for low power frequency clock generation and distribution. A device includes a low power generation and distribution circuit configured to generate and distribute a differential 1/N sampling frequency (F.sub.S)(F.sub.S/N) clock, wherein N is larger or equal to 2, and a differential frequency doubler configured to generate a single-ended multiplied frequency clock from the differential F.sub.S/N frequency clock, and convert the single-ended multiplied frequency clock to a differential multiplied frequency clock for use by one or more data processing channels.

An analog to digital converter (ADC) device includes ADC circuits, a calibration circuit and a controlling circuit. The ADC circuits are configured to generate first quantized outputs according to clock signals. The calibration circuit is configured to perform at least one error operation according to the first quantized outputs to generate second quantized outputs, and is configured to analyze time difference information of the clock signals according to the second quantized outputs to generate adjustment signals. The controlling circuit is configured to analyze the first quantized outputs to generate at least one control signal to the calibration circuit, wherein the at least one control signal is configured to control the calibration circuit to selectively perform the at least one error operation and selectively analyze the time difference information of the clock signals.

A method includes receiving, at a radar timing card, radar timing information and a synchronous clock signal. The method also includes generating, using the radar timing card, a timing trigger to indicate a time of transmission for radar return information. The method further includes receiving, at each of multiple digital-to-analog converter (DAC) channels of one or more DAC cards, the synchronous clock signal and the timing trigger. In addition, the method includes simultaneously transmitting, from each of the DAC channels, a dedicated portion of the radar return information based on the time of transmission indicated by the timing trigger. The synchronous clock signal is used to align the simultaneous transmissions of the DAC channels on the one or more DAC cards.

A receiver circuit includes an ADC, a processing channel, and an interference detection path. The processing channel is configured to process data samples provided by the ADC, and includes a notch filter. The interference detection path is configured to detect interference in the data samples, and includes a slicer, a slicer error circuit, and an interference detection circuit. The slicer is configured to slice input of the notch filter. The slicer error circuit is configured to compute an error of the slicer. The interference detection circuit configured to detect an interference signal in the error of the slicer, and set the notch filter to attenuate the interference signal.

A method includes receiving, at a radar timing card, radar timing information and a synchronous clock signal. The method also includes generating, using the radar timing card, a timing trigger to indicate a time of transmission for radar return information. The method further includes receiving, at each of multiple digital-to-analog converter (DAC) channels of one or more DAC cards, the synchronous clock signal and the timing trigger. In addition, the method includes simultaneously transmitting, from each of the DAC channels, a dedicated portion of the radar return information based on the time of transmission indicated by the timing trigger. The synchronous clock signal is used to align the simultaneous transmissions of the DAC channels on the one or more DAC cards.