Described herein are related to a device including a digital-to-analog converter (DAC) configured to convert a digital signal into an analog signal. In one aspect, the device includes a first circuit configured to generate a first signal. In one aspect, the device includes a second circuit coupled to the first circuit. The second circuit may be configured to generate a second signal, based on the first signal. The second signal may have a first edge according to the first signal. In one aspect, the device includes a third circuit coupled to the second circuit. The third circuit may be configured to generate a third signal having a second edge, in response to the first edge of the second signal. In one aspect, an amplitude of the third signal may correspond to one bit.

A time-interleaved analog-to-digital converter includes sampling circuits, amplifier circuits, analog-to-digital converter circuits, and a detector circuitry. The sampling circuits are configured to an input signal according to first clock signals, to generate first signals. The amplifier circuits are configured to generate second signals according to the first signals. The analog-to-digital converter circuits are configured to convert the second signals to generate a digital signals. The detector circuitry is configured to adjust a delay time of each of the first clock signals, and calibrate gains of the amplifier circuits according to the digital signals.

Disclosed is a calibration method of a capacitor array type successive approximation register analog-to-digital converter, comprising: obtaining an actual weight value of capacitors of a target bit and an error code between the actual weight value and an ideal weight value of the capacitors of the target bit; calibrating an output code of the SAR ADC to be calibrated with the error code by corresponding addition or subtraction to obtain a final calibrated output code. The calibration method breaks through the requirement that non-binary weights must meet the redundancy, and can realize a weight calibration in a traditional binary ADC and a digital calibration by simple addition and subtraction on the basis of the original code obtained by an analog-to-digital conversion, thus effectively avoiding the error problem in the traditional technology, increasing the calibration precision and accuracy, reducing the circuit complexity and calculation complexity caused by the non-binary weights calibration.

Certain aspects of the present disclosure provide a segmented successive approximation register (SAR) analog-to-digital converter (ADC). One example ADC generally includes a plurality of SAR ADC circuits each associated with a different voltage range segment of a voltage range for the ADC. Each SAR ADC circuit is configured to receive an analog signal input to the ADC and to output a digital signal based on the analog signal, the digital signal being representative of a voltage level of the analog signal when the voltage level of the analog signal is within the segment associated with the SAR ADC circuit. In certain aspects, the SAR ADC may include logic configured to control a digital output of the ADC based on one or more of the digital signals representative of the voltage level of the analog signal output by one or more of the plurality of SAR ADC circuits.

A source driver including: a current source that provides an approximately constant current; a channel coupled to a source electrode and including a digital to analog converters (DAC), the DAC including: a voltage source that applies an output voltage to the source electrode based on the approximately constant current provided by the current source; and a control unit having circuitry that: inputs a digital value; and terminates, based on the digital value, charging of the voltage source by the approximately constant current; and a calibration unit having circuitry that: generates a comparison between a test voltage applied by the voltage source with a target voltage; and modifies the approximately constant current based on the comparison.

Certain aspects of the present disclosure provide a segmented successive approximation register (SAR) analog-to-digital converter (ADC). One example ADC generally includes a plurality of SAR ADC circuits each associated with a different voltage range segment of a voltage range for the ADC. Each SAR ADC circuit is configured to receive an analog signal input to the ADC and to output a digital signal based on the analog signal, the digital signal being representative of a voltage level of the analog signal when the voltage level of the analog signal is within the segment associated with the SAR ADC circuit. In certain aspects, the SAR ADC may include logic configured to control a digital output of the ADC based on one or more of the digital signals representative of the voltage level of the analog signal output by one or more of the plurality of SAR ADC circuits.

Various aspects facilitate gain adjustment associated with an analog to digital converter. A capacitor array comprises a plurality binary-weighted capacitors and generates an output voltage received by a comparator based on an input voltage and a reference voltage. A gain calibration component receives the input voltage and applies a modified input voltage that corresponds to a portion of the input voltage to the output voltage generated by the capacitor array component.

A charge sharing circuit for generating a calibration voltage. The circuit comprises a calibration capacitor for providing at an upper terminal of the calibration capacitor the calibration voltage. The circuit further comprises a series connection of a plurality of N switches, wherein N is an integer>2, and a plurality of at least N1 switching capacitors. Each switching capacitor is coupled to one connecting node connecting two of the N switches. One side of the series connection of the plurality of N switches is coupled to the upper terminal of the calibration capacitor and the other side of the series connection of the N switches is coupled to a fixed voltage. The circuit is configured to transmit at least two clock signals to selectively drive at least two distinct subsets of the switches. There is further provided a corresponding method and a corresponding design structure.

A sampling assembly and a sampling method are provided. A self-calibration unit controls a first switch to be turned on, to enable a first sampling signal to be input to a sampling unit. The sampling unit processes the first sampling signal to obtain a second sampling signal, and outputs the second sampling signal to the self-calibration unit. The self-calibration unit controls the first switch to be turned off, controls a second switch to be turned on, and outputs a first calibration signal to the sampling unit. The sampling unit processes the first calibration signal to obtain a second calibration signal, and outputs the second calibration signal to the self-calibration unit. The self-calibration unit determines an error signal based on the first calibration signal and the second calibration signal. The self-calibration unit obtains a calibrated third sampling signal based on the second sampling signal and the error signal.

An analog-to-digital converter (ADC) system for providing a calibrated voltage measurement without an external reference voltage may include an ADC circuit, including an analog ADC input and a digital ADC output. The ADC system may also include circuitry to generate a first internal reference voltage and a second internal reference voltage. The ADC system may also include circuitry configured to provide a selected output from a number of inputs, wherein the inputs include inputs to receive (1) the first internal reference voltage, (2) the second internal reference voltage, and (3) a user-provided analog signal of interest, wherein the selected output can be connected to the analog ADC input, an external voltage measurement device, or both.