A sampling assembly and a sampling method are provided. A self-calibration unit controls a first switch to be turned on, to enable a first sampling signal to be input to a sampling unit. The sampling unit processes the first sampling signal to obtain a second sampling signal, and outputs the second sampling signal to the self-calibration unit. The self-calibration unit controls the first switch to be turned off, controls a second switch to be turned on, and outputs a first calibration signal to the sampling unit. The sampling unit processes the first calibration signal to obtain a second calibration signal, and outputs the second calibration signal to the self-calibration unit. The self-calibration unit determines an error signal based on the first calibration signal and the second calibration signal. The self-calibration unit obtains a calibrated third sampling signal based on the second sampling signal and the error signal.

A multi-bit resolution sub-pipeline structure for measuring a jump magnitude of a transmission curve, comprising: a sub-analog-to-digital converter having n-bit resolution configured to quantize input analog voltage signals and output digital voltage signals; a sub-digital-to-analog converter having n-bit resolution configured to convert the digital voltage signals output by the sub-analog-to-digital converter into corresponding analog voltage signals; a decoder having n-bit resolution configured to decode an n-bit binary input signal; and a switched-capacitor amplification unit configured to, when in a normal mode, perform sampling and residue amplification on the input analog voltage signals; and when in a test mode, measure the jump magnitude of the transmission curve corresponding to each decision level. Magnitude measurement of a transmission curve is performed within 2.sup.n clock periods, th and a measurement result is sent to a back-end digital domain of the A/D converter for correction.

The present disclosure relates to a high-speed and low-power successive approximation register analog-to-digital converter (SAR ADC) and an analog-to-digital conversion method. Binary redundancy reassembly is performed to improve a digital-to-analog converter (DAC) capacitor array included in the SAR ADC such that the total number of capacitors included in a capacitor sub-array of the DAC capacitor array is greater than the number of precision bits of the SAR ADC, and the total number of unit capacitors included in all capacitors when the total number of capacitors included in the capacitor sub-array is greater than the number of precision bits of the SAR ADC is equal to the total number of unit capacitors included in all capacitors when the total number of capacitors included in the capacitor sub-array is equal to the number of precision bits of the SAR ADC.

A circuit includes a nonlinear analog-to-digital converter (ADC) configured to provide a first digital output based on an analog input signal. The circuit also includes a linearization circuit having a lookup table (LUT) memory configured to store initial calibration data. The linearization circuit is coupled to the nonlinear ADC and is configured to: determine updated calibration data based on the initial calibration data; replace the initial calibration data in the LUT memory with the updated calibration data; and provide a second digital output at a linearization circuit output of the linearization circuit based on the first digital output and the updated calibration data.

An analog-to-digital converter (ADC) includes: a set of comparators configured to provide comparison results based on an analog signal and respective reference thresholds for comparators of the set of comparators; digitization circuitry configured to provide a digital output code based on the comparison results and a mapping; and calibration circuitry. The calibration circuitry is configured to: receive the comparison results; determine if the analog signal is proximate to one of the respective reference thresholds based on the comparison results; in response to determining the analog signal is proximate to one of the respective reference thresholds, receive ADC values based on different pseudorandom binary sequence (PRBS) values being applied to the analog signal; determine an offset error based on the ADC values; and provide a comparator input offset calibration signal at a calibration circuitry output if the estimated offset error is greater than an offset error threshold.

An analog-to-digital conversion device and analog-to-digital conversion method thereof are provided. The analog-to-digital conversion device includes an analog circuit configured to output an analog input signal, and an analog-to-digital converter configured to receive the analog input signal and configured to outputting a digital output signal corresponding to the analog input signal with the use of first and second capacitor arrays, each of the first and second capacitor arrays including a first capacitor having a calibration capacitor connected thereto and a second capacitor having no calibration capacitor connected thereto, wherein the analog-to-digital converter is configured to calibrate the capacitance of the first capacitor by providing a first calibration voltage to the calibration capacitor and is configured to output the digital output signal corresponding to the analog input signal with the use of the calibrated capacitance of the first capacitor.

A clock product includes a time-to-digital converter responsive to an input clock signal, a reference clock signal, and a time-to-digital converter calibration signal. The time-to-digital converter includes a coarse time-to-digital converter and a fine time-to digital converter. The clock product includes a calibration circuit including a phase-locked loop. The calibration circuit is configured to generate the time-to-digital converter calibration signal. The clock product includes a controller configured to execute instructions that cause the phase-locked loop to generate an error signal for each possible value of a fine time code of a digital time code generated by the time-to-digital converter and to average the error signal over multiple clock cycles to generate an average error signal.

An integrated circuit device includes a digital sine wave generator configured to produce portions of a digital sine wave, a combiner circuit configured to output each of the portions of the digital sine wave combined with a respective calibration code during operation in a post-production dynamic test mode, a digital to analog converter (DAC) configured to output an analog sine wave based on the output of the combiner circuit, and a test analog to digital converter (ADC) including an input terminal directly connected to the output of the DAC, and configured to generate a second digital sine wave based on the analog sine wave.

A control circuit of a pipeline analog-to-digital converter (ADC) is provided. The pipeline ADC includes a multiplying digital-to-analog converter (MDAC) which includes a capacitor. The control circuit includes six switches and two buffer circuits. The first and second switches are respectively coupled between one end of the capacitor and the first and second reference voltages. The output terminals of the first and second buffer circuits are respectively coupled to the first and second switches. The input terminal of the first buffer circuit is coupled to the third reference voltage through the third switch, or receives a control signal through the fifth switch. The input terminal of the second buffer circuit is coupled to the fourth reference voltage through the fourth switch, or receives the control signal through the sixth switch. The first and second reference voltages are different, and the first and second switches are not turned on simultaneously.

A metastable state detection device and method, and an ADC circuit are disclosed. The metastable state detection device includes: a delay unit which is configured to receive a synchronization signal and delay the synchronization signal based on preset step delay values; a first flip-flop unit including a first clock input terminal, a first data input terminal and a first data output terminal, wherein the first clock input terminal is configured to receive a clock signal; the first data input terminal is configured to receive the delayed synchronization signal; a second flip-flop unit including a second clock input terminal, a second data input terminal and a second data output terminal; a processing module connected to the second data output terminal, which is configured to receive a target clock signal and detect a metastable state of the first flip-flop unit according to the target clock signal.