The digital temperature sensing circuit includes a temperature voltage generator configured to generate a temperature voltage varying with a temperature in response to a first reference voltage, divide a supply voltage in response to a second reference voltage, and generate a high voltage and a low voltage, a code voltage generator configured to divide the second reference voltage based on the high voltage and the low voltage and output divided voltages having different voltage levels, and a mode selector supplied with the temperature voltage and the divided voltages, and configured to output a first code or a second code in response to a mode select signal, wherein the first code and the second code have different numbers of bits.

An analog to digital converter (ADC) device includes ADC circuits, a calibration circuit, and a skew adjusting circuit. The ADC circuits are configured to convert an input signal according to interleaved clock signals to generate first quantized outputs. The calibration circuit is configured to perform at least one calibration operation according to the first quantized outputs to generate second quantized outputs. The skew adjusting circuit further includes a first adjusting circuit. The first adjusting circuit is configured to analyze adjacent clock signals according to part of the second quantized outputs to generate adjusting information. The skew adjusting circuit is configured to analyze time difference information within even-numbered sampling periods of the clock signals according to the second quantized outputs and the adjusting information to generate adjustment signals. The adjustment signals are configured to reduce clock skews of the ADC circuits.

A charge sharing circuit includes a charge source having an accumulated first charge and a charge load having an accumulated second charge, where during a charge sharing interval the second charge is less than the first charge. A charge sharing regulator selectively couples between the charge source and the charge load along a charge sharing path. The charge sharing regulator regulates transfer of a shared amount of charge from the charge source to the charge load during the charge sharing interval.

An analog-to-digital converter includes: a voltage-current converter receiving an analog input voltage, generating a first digital signal from the analog input voltage, and outputting a residual current remaining after the first digital signal; a current-time converter converting the residual current into a current time in a time domain; and a time-digital converter receiving the residual time, and generating a second digital signal from the residual time, wherein the first digital signal and the second digital signal are sequences of digital codes representing respective signal levels of the analog input voltage.

An analog-to-digital converting system includes multiple stages of analog-to-digital converters (ADCs) and a skew calibration circuit. The multiple stages of ADCs are configured to sample a test signal according to multiple interleaved clock signals, respectively, so as to respectively generate multiple stages of quantized outputs. The analog-to-digital converting system has a sampling frequency resulting from operations of the multiple stages of ADCs. The test signal has a first frequency and the sampling frequency is N times the first frequency, and N is an odd number larger than 1. The skew calibration circuit is configured to sequentially analysis, for every N stages, the multiple stages of quantized outputs to generate multiple digital codes. The skew calibration circuit is further configured to calibrate a time skew of the analog-to-digital converting system according to a comparison result between the multiple digital codes and a reference code.

A system includes a multiplying digital-to-analog converter (MDAC). The system also includes an input-side component coupled to the MDAC and configured to provide a code to the MDAC. The system also includes a reference voltage source coupled to the MDAC and configured to provide a reference voltage to the MDAC. The MDAC comprises a nonlinear calibration circuit configured to adjust an output of the MDAC nonlinearly based on the code, the reference voltage, and an output of the nonlinear calibration circuit.

A charge sharing circuit includes a charge source having an accumulated first charge and a charge load having an accumulated second charge, where during a charge sharing interval the second charge is less than the first charge. A charge sharing regulator selectively couples between the charge source and the charge load along a charge sharing path. The charge sharing regulator regulates transfer of a shared amount of charge from the charge source to the charge load during the charge sharing interval.

A system includes a multiplying digital-to-analog converter (MDAC). The system also includes an input-side component coupled to the MDAC and configured to provide a code to the MDAC. The system also includes a reference voltage source coupled to the MDAC and configured to provide a reference voltage to the MDAC. The MDAC comprises a nonlinear calibration circuit configured to adjust an output of the MDAC nonlinearly based on the code, the reference voltage, and an output of the nonlinear calibration circuit.

The present disclosure provides an error compensation correction system and method for an analog-to-digital converter with a time interleaving structure, the system includes an analog-to-digital converter with a time interleaving structure, a master clock module, a packet clock module, an error correction module, an adaptive processing module and an overall MUX circuit. Through the error compensation correction system and method for the analog-to-digital converter with a time interleaving structure according to the present disclosure, lower correction hardware implementation complexity and higher stability are ensured. The system and method according to the present disclosure are particularly suitable for interchannel mismatch error correction of dense channel time interleaving ADC, and the performance of the time interleaving ADC is improved.

A sensor circuit includes at least one ring oscillator having a supply port supplied by at least one current source and a reference frequency. A comparator compares a frequency output of the at least one ring oscillator with the reference frequency to yield a measurement, such as a temperature measurement.