An apparatus for calibrating a time-interleaved analog-to-digital converter including a plurality of time-interleaved analog-to-digital converter circuits is provided. The apparatus includes a clock generation circuit configured to generate a plurality of phase shifted clock signals for the plurality of time-interleaved analog-to-digital converter circuits and a reference clock signal. Further, the apparatus includes a reference signal generation circuit configured to generate a reference signal based on the reference clock signal. The reference signal is a square wave signal. The apparatus additionally includes a coupling circuit configured to controllably couple an input node of the time-interleaved analog-to-digital converter to either the reference signal generation circuit or to a signal node capable of providing an analog signal for digitization.

Controllable voltage-signal generation circuitry, including: a plurality of segment nodes connected together in series, each adjacent pair of segment nodes connected together via a corresponding coupling capacitor, an end one of the segment nodes serving as an output node; for each of the segment nodes, at least one segment capacitor having a first terminal connected to that segment node and a second terminal connected to a corresponding switch; and switch control circuitry, wherein: each switch is operable to connect the second terminal to one reference voltage source and then instead to another reference voltage source, to apply a voltage change at the second terminal; the reference voltage sources and switches configured such that for each segment node the same voltage change in magnitude is applied by each switch, and such that the voltage change is different in magnitude from the voltage change applied by each switch of another segment node.

An analog to digital converter (ADC) device includes ADC circuitries, a calibration circuitry, and a skew adjustment circuitry. The ADC circuitries are configured to convert an input signal according to interleaved clock signals, in order to generate first quantization outputs. The calibration circuitry is configured to perform at least one calibration operation according to the first quantization outputs, in order to generate second quantization outputs. The skew adjustment circuitry is configured to determine maximum value signals, to which the second quantization outputs respectively correspond during a predetermined interval, and to average the maximum value signals to generate a reference signal, and to compare the reference signal with each of the maximum value signals to generate adjustment signals, in order to reduce a clock skew of the ADC circuitries.

In accordance with an embodiment, a method of monitoring a data converter includes determining a multiplicity of time-associated linearity parameters that describe a linearity of the data converter at a multiplicity of different times, and determining a state of the data converter based on comparing at least one linearity parameter of the multiplicity of time-associated linearity parameters with a comparison parameter.

There provided an AD converter that includes an analog processing part configured to select one of the measurement target voltages and a plurality of reference voltages for each channel, to output an analog voltage signal; a first selection part configured to select one of a plurality of analog voltage signals; a first AD conversion part configured to perform AD conversion on the analog voltage signal to generate a first original digital signal; a second selection part configured to select one of the plurality of analog voltage signals; a second AD conversion part configured to perform AD conversion on the analog voltage signal to generate a second original digital signal; a digital processing part configured to receive the first original digital signal and the second original digital signal; and a controller configured to control contents selected in the analog processing part, the first selection part, and the second selection part.

An apparatus is provided to calibrate an analog-to-digital converter (ADC). The apparatus includes a calibration circuitry coupled to an output of the ADC, wherein the calibration circuitry is to identify a maximum value and minimum value of the output of the ADC, and is to calibrate one or more performance parameters of the ADC according to the maximum and minimum values. The performance parameters include: gain of the ADC, offset of the ADC, and timing skew between the ADC and a neighboring ADC.

Background calibration techniques can effectively to correct for memory, kick-back, and order-dependent errors in interleaved switched-capacitor track-and-hold (T/H) circuits and amplifiers. The techniques calibrate for errors in both the track/sample phase and the hold-phase, and account for the effects of interleaving, buffer/amplifier sharing, incomplete resetting, incomplete settling, chopping, and randomization on the offset, gain, memory, and kick-back errors. Moreover, the techniques can account for order-dependent and state-dependent hold-phase non-linearities. By correcting for these errors, the proposed techniques improve the noise performance, linearity, gain/offset matching, frequency response (and bandwidth), and order-dependence errors. The techniques also help increase the speed (sample rate and bandwidth) and linearity of T/H circuits and amplifiers while simplifying the analog circuitry and clocking needed. These techniques comprehensively account for various memory, kick-back, and order-dependent effects in a unified framework.

A n-bit Successive Approximation Register Analog-to-Digital Converter, SAR ADC, is provided. The SAR ADC comprises a respective plurality of sampling cells for each bit of the n-bit of the SAR ADC. Each sampling cell comprises a capacitive element coupled to a cell output of the sampling cell in order to provide a cell output signal. Further, each sampling cell comprises a first cell input for receiving a first signal, and a first switch circuit capable of selectively coupling the first cell input to the capacitive element. Each cell additionally comprises a second cell input for receiving a second signal, and a third cell input for receiving a third signal. The third signal exhibits opposite polarity compared to the second signal. Each sampling cell comprises a second switch circuit capable of selectively coupling one of the second cell input and the third cell input to the capacitive element. The SAR ADC further comprises at least one comparator circuit coupled to the sampling cells. The at least one comparator circuit is configured to output a comparison signal based on the cell output signals of the sampling cells. Additionally, the SAR ADC comprises a calibration circuit configured to supply at least one respective control signal to the respective second switch circuit of the sampling cells for controlling the second switch circuits.

A leakage compensation circuit includes a compensation digital to analog converter (DAC) and an adjustment circuit. The compensation DAC is configured to: receive a first digital signal associated with a transmitter of a transceiver; generate a compensation analog signal using the first digital signal; and provide the compensation analog signal to a receiver of the transceiver. The adjustment circuit is configured to generate the first digital signal by adjusting a second digital signal from the transmitter based on one or more adjustment parameters.

An error compensation correction device for a pipeline analog-to-digital converter includes a correction pipeline stage and a conventional pipeline stage. For each correction pipeline stage, a corresponding error estimation circuit, a level edge detection circuit, a random level generation circuit, and MUX circuit being provided. The present disclosure can track and correct non-ideal properties and mismatching errors in real time over time along with the change of the surroundings without interrupting the ADC normal work of the pipeline. Thus the correction value is closer to the real situation.