A spur correction system for a transmit chain having an interleaving multiplexer. In some embodiments, the spur correction system includes a spur sense chain, a correction controller, and a Q path corrector. The interleaving multiplexer combines signals from multiple bands in response to a clock signal. The spur sense chain estimates an error that is in phase with the clock signal (an I-phase error) and an error that is a derivative of the clock signal (a Q-phase error). The correction controller compensates for the estimated I-phase error by injecting an I-phase correction signal into the transmit chain. The Q path corrector compensates for the estimated Q-phase error by selectively connecting one or more capacitors within the interleaving multiplexer.

A device, which includes an input, configured to read in an analog signal, an analog/digital converter, configured to convert the analog signal into a digital value, and a processor, configured to determine a digital measured value. The processor is further configured to derive a calibrated digital value from the digital value with the aid of a linear calibration function and to derive the digital measured value from the calibrated digital value with the aid of a nonlinear measurement function. The processor modifies the linear calibration function in response to a calibration signal, based on an algorithm, which is based on the nonlinear measurement function, and a number of predefined comparison measured values.

A dither capacitor, separate from the capacitor sampling the input signal, can be used to inject the additive dither in the switched-capacitor network of the track and hold circuit. This implementation can be referred to as a split-capacitor dither injection. The dither capacitor can be connected to a summing node of the switched-capacitor network. Using a separate capacitor allows the dither to be isolated from the capacitor that is sampling the input signal and avoids kick-back errors.

A method for outputting a current includes performing a sorting operation on a plurality of current sources according to intensities of currents generated by the current sources, dividing the plurality of current sources into N current source sets according to a result of the sorting operation and a predetermined selection order, and enabling at least one current source set of the N current source sets to output the current according a target output value. The plurality of current sources have a same target current value. Each of the N current source sets includes at least one current source. In the N current source sets, a total quantity of current sources of the n.sup.th current source set is twice a total quantity of current sources of the (n−1).sup.th current source set.

VCO ADCs consume relatively little power and require less area than other ADC architectures. However, when a VCO ADC is implemented by itself, the VCO ADC can have limited bandwidth and performance. To address these issues, the VCO ADC is implemented as a back end stage in a VCO-based continuous-time (CT) pipelined ADC, where the VCO-based CT pipelined ADC has a CT residue generation front end. Optionally, the VCO ADC back end has phase interpolation to improve its bandwidth. The pipelined architecture dramatically improves the performance of the VCO ADC back end, and the overall VCO-based CT pipelined ADC is simpler than a traditional continuous-time pipelined ADC.

A pipeline analog to digital converter includes converter circuitries and a calibration circuitry. The converter circuitries sequentially convert an input signal into first digital codes. A first converter circuitry in the converter circuitries performs a quantization according to a first signal to generate a first corresponding digital code in the first digital codes, and the first signal is a signal, which is processed by the first converter circuitry, of the input signal and a previous stage residue signal. The calibration circuitry combines the first digital codes to output a second digital code, detects whether the quantization is completed to generate first and second valid signals, and determines whether to set the second digital code to be a first predetermined digital code or a second predetermined digital code according to the first and the second valid signals. The second valid signal is a delay signal of the first valid signal.

An analog to digital converter device includes a capacitor array, a digital logic circuit, and a comparator circuit. The capacitor array includes first capacitors, a capacitor to be calibrated, and compensation capacitors. The digital logic circuit performs a calibration on the capacitor to be calibrated, in order to calibrate a weighed value of the capacitor to be calibrated according to a decision signal, and converts an input signal to bits via the capacitor array after the calibration is performed. The comparator circuit compares a testing signal with a predetermined voltage to generate the decision signal. The testing signal is generated by the first capacitors and the capacitor to be calibrated in response to the calibration. The digital logic circuit further selects at least one of the compensation capacitors, in order to adjust a digital code corresponding to a calibrated weighed value to be an integer expressed by the bits.

Provided is a receiver device including a first A/D converter (203), a second A/D converter (204), an amplifier (205) which is provided at a previous stage of the second A/D converter (204), and a digital signal processing unit (207). The digital signal processing unit (207) includes an amplitude comparison unit (211) configured to compare an amplitude of a digital signal output from the first A/D converter (203) and an amplitude of a digital signal output from the second A/D converter (204) to make a determination, and to output a determination result, and a selector (212) configured to select one of the digital signal output from the first A/D converter (203) or the digital signal output from the second A/D converter (204) based on the determination result.

A n-bit Successive Approximation Register Analog-to-Digital Converter, SAR ADC, is provided. The SAR ADC comprises a respective plurality of sampling cells for each bit of the n-bit of the SAR ADC. Each sampling cell comprises a capacitive element coupled to a cell output of the sampling cell in order to provide a cell output signal. Further, each sampling cell comprises a first cell input for receiving a first signal, and a first switch circuit capable of selectively coupling the first cell input to the capacitive element. Each cell additionally comprises a second cell input for receiving a second signal, and a third cell input for receiving a third signal. The third signal exhibits opposite polarity compared to the second signal. Each sampling cell comprises a second switch circuit capable of selectively coupling one of the second cell input and the third cell input to the capacitive element. The SAR ADC further comprises at least one comparator circuit coupled to the sampling cells. The at least one comparator circuit is configured to output a comparison signal based on the cell output signals of the sampling cells. Additionally, the SAR ADC comprises a calibration circuit configured to supply at least one respective control signal to the respective second switch circuit of the sampling cells for controlling the second switch circuits.

The present invention discloses a method of calibrating time interleaved analog to digital converter comprising: sampling a common input signal, said sampling is performed by an array of sub analog to digital converters, each generating individual digital analog equivalent outputs with sampling time errors, said digital outputs are fed to sampling time error estimation circuitry to calculate a digital output proportional to sampling time error between two consecutive channels, without any restriction on input signal or ADC channel design, said timing skew estimator circuitry composed of generating a delayed output of one of the two consecutive ADC channels, channel first and channel second and subtracting the said delayed output with digital output of the said second channel and producing the first subtracted output and output of said second channel subtracted with said first channel output delayed by sampling delay between the two consecutive channels and producing the second subtracted delayed output, absolute value of the said first subtracted output and said second subtracted delayed output is monitored for peak value of both for a fixed time duration and then subtracted values of the said peak values are the estimation of sampling time error between the said two consecutive channels, same process is repeated to each consecutive ADC channels of the said ADC array.