An analog-to-digital converter system includes an analog compute-in-memory and transform circuitry. The transform circuitry is (i) configured to receive one or more codes from corresponding one or more analog-to-digital converters of the analog compute-in-memory, (ii) configured to provide, responsive to receipt of the one or more codes, one or more transformed codes to digital circuitry configured to perform one or more digital operations on the one or more transformed codes, and (iii) configured to determine the one or more transformed codes in accordance with a distribution of results of the analog compute-in-memory.

A test and measurement instrument includes one or more channels to receive a signal under test, each channel comprising an input port, a filter, and a sampler, at least one analog-to-digital converter (ADC), the at least one ADC having two pipes connected to the sampler of one of the one or more channels, the at least one ADC to produce digital samples of the signal at a sample rate, and one or more processors configured to execute code that causes the one more processors to acquire a spectrum of the digital samples for each pipe in the at least one ADC, and use the spectrums of the digital samples for each pipe in the at least one ADC to reconstruct the spectrum of the signal under test. A method of operating a test and measurement instrument, and a method a method of calibrating a test and measurement instrument is included.

An analog-to-digital converter system includes an analog compute-in-memory and transform circuitry. The transform circuitry is (i) configured to receive one or more codes from corresponding one or more analog-to-digital converters of the analog compute-in-memory, (ii) configured to provide, responsive to receipt of the one or more codes, one or more transformed codes to digital circuitry configured to perform one or more digital operations on the one or more transformed codes, and (iii) configured to determine the one or more transformed codes in accordance with a distribution of results of the analog compute-in-memory.