H03M1/1095

Dynamic current mismatch accumulation schemes for digital-to-analog converters

Techniques and apparatus for determining dynamic current mismatches in a current-steering digital-to-analog converter (DAC) are provided. One example technique generally includes accumulating current mismatches between a DAC cell of a plurality of DAC cells and a reference cell using a capacitive element and changing a polarity of the capacitive element during the accumulating. The timing of the accumulating may be controlled such that a static current mismatch between the DAC cell and the reference cell is at least reduced and a dynamic current mismatch between the DAC cell and the reference cell is enhanced.

Testing ADCs
12542560 · 2026-02-03 · ·

A circuit portion is provided which is arranged to be operable in a test mode. The circuit portion includes a Successive Approximation Register Analog to Digital Converter, SAR ADC, and an input for a reference signal. The SAR ADC is arranged to generate a feedback signal having a duty cycle representing a time taken for the SAR ADC to complete an analogue to digital conversion. The SAR ADC can carry out a comparison of a duty cycle of the reference signal with the duty cycle of the feedback signal, and can generate an output signal comprising a digital representation of the comparison of the reference duty cycle and the feedback duty cycle.