H03M1/121

Using a sampling switch for multiple evaluation units

In some examples, an integrated circuit device includes a sampling switch configured to sample an input signal. The integrated circuit device also includes a first evaluation unit configured to receive the sampled input signal from the sampling switch and evaluate the sampled input signal. The integrated circuit device further includes a second evaluation unit configured to receive the sampled input signal from the sampling switch and evaluate the sampled input signal. The sampling switch is configured to deliver the sampled input signal to the first evaluation unit and deliver the sampled input signal to the second evaluation unit.

ADC slicer reconfiguration for different channel insertion loss
11489540 · 2022-11-01 · ·

A receiver having analog-to-digital converters (ADC) is disclosed. The ADCs may be reconfigured based on the insertion loss mode of the receiver. For example, different portions of a plurality of time-interleaved successive approximation (SAR) ADC slices included in at least one sub-ADC of each time-interleaved ADC may be enabled depending on which of a plurality of insertion loss modes is selected for operation of the receiver.

Electrical signal measurement using subdivision

A measurement circuit comprises an electronic circuit, multiple measurement channels, and a combining circuit. The electronic circuit includes a first terminal, a second terminal, and a non-resistive circuit element. Each of the multiple measurement channels includes a differential input connected to the electronic circuit. The differential inputs of the multiple measurement channels are connected in series and include a differential input coupled to the non-resistive circuit element. One input of a differential input of a first measurement channel of the multiple measurement channels is connected to the first terminal of the electronic circuit and one input of a differential input of a second measurement channel of the multiple measurement channels is connected to the second terminal of the electronic circuit. The combining circuit receives multiple outputs from the multiple measurement channels and produce a composite output signal.

SEMICONDUCTOR INTEGRATED CIRCUIT AND RECEIVER DEVICE
20220311449 · 2022-09-29 · ·

A semiconductor integrated circuit according to an embodiment includes an A/D converter, first and second equalizer circuits, and first and second controllers. The first equalizer circuit includes a first tap. The first and second equalizer circuits receive a signal based on a digital signal, and output first and second signals, respectively. The first controller adjusts a phase of a clock signal based on the first signal. The second controller an operation of adjusting a control parameter including a tap coefficient. In the operation, the second controller adjusts a tap coefficient of each of taps of the second equalizer circuit, and adjusts a tap coefficient of the first tap based on an adjustment result of each tap coefficient of the second equalizer circuit.

SAR ADC with Alternating Low and High Precision Comparators and Uneven Allocation of Redundancy
20220209780 · 2022-06-30 ·

A Successive Approximation Register, SAR, Analog to Digital Converter, ADC, (50) achieves high speed and accuracy by (1) alternating at least some decisions between sets of comparators having different accuracy and noise characteristics, and (2) unevenly allocating redundancy (in the form of LSBs of range) for successive decisions according to the accuracy/noise of the comparator used for the preceding decision. The redundancy allocation is compensated by the addition of decision cycles. Alternating between different comparators removes the comparator reset time (treset) from the critical path, at least for those decision cycles. The uneven allocation of redundancy—specifically, allocating more redundancy to decision cycles immediately following the use of a lower accuracy/higher noise comparators—compensates for the lower accuracy and prevents the need for larger redundancy (relative to the full-scale range of a decision cycle) later in the ADC process.

Ping pong readout structure in image sensor with dual pixel supply

An image sensor includes a pixel array having a plurality pixels arranged in a plurality of pixel clusters coupled to a plurality of column busses, a plurality of voltage supplies coupled to the plurality of pixel clusters, and ping-pong readout circuitry. Pixel clusters in adjacent column busses are supplied with different voltage supplies. The ping-pong readout circuitry includes multiplexing circuitry coupled to the plurality of column busses, and a plurality of analog-to-digital converters coupled to the multiplexing circuitry. The image sensor also includes a controller configured to selectively couple a pixel signal of a pixel cluster to a column bus to an ADC for signal conversion.

ANALOG-TO-DIGITAL CONVERTER AND ELECTRONIC DEVICE

An analog-to-digital converter has a first digital signal generator that generates a first digital signal based on whether or not a sampling signal of an input signal is equal to or lower than a signal corresponding to a second reference signal higher than a first reference signal, a first slope generator to generate a first slope signal that changes with time from the sampled and held signal equal to or lower than the first reference signal, a second slope generator to generate a second slope signal that changes with time from the sampled and held signal to a signal level equal to or lower than the second reference signal, and a second digital signal generator that generates a second digital signal based on a time at which the first slope signal matches the first reference signal or a time at which the second slope signal matches the second reference signal.

ANALOG TO DIGITAL CONVERSION APPARATUS FOR PROVIDING DIGITAL VALUE TO DRIVER

An analog-digital conversion apparatus includes: an analog-digital converter (ADC) included in an integrated circuit (IC) and configured to operate based on a sampling clock constituting a portion of a plurality of clocks; and a driver included in the IC and configured to operate based on another portion of the plurality of clocks, and produce a driving signal based on a digital value output from the ADC. The ADC and the driver are synchronized with each other based on an interrupt request (Irq) of the IC.

SPUR REDUCTION FOR ANALOG-TO-DIGITAL CONVERTERS

Methods, systems, computer-readable media, and apparatuses for spurious information reduction in a data signal are presented. One example of such an apparatus includes a data converter including a plurality of analog-to-digital converters (ADCs) and configured to produce a plurality of sampled signals, a normalizer configured to obtain a plurality of common-bandwidth signals from at least the plurality of sampled signals, and a common-mode filter configured to produce a digital output signal based on the plurality of common-bandwidth signals.

Differential source follower with current steering devices

Describe is a buffer which comprises: a differential source follower coupled to a first input and a second input; first and second current steering devices coupled to the differential source follower; and a current source coupled to the first and second current steering devices. The buffer provides high supply noise rejection ratio (PSRR) together with high bandwidth.