A system may include an output stage for driving a load at an output of the output stage, a pulse-width modulation mode path configured to pre-drive the output stage in a first mode of operation, a linear mode path configured to pre-drive the output stage in a second mode of operation and a loop filter coupled at its input to the output of the output stage and coupled at its output to both of the pulse-width modulation mode path and the linear mode path. The pulse-width modulation mode path and the linear mode path may be configured such that a first transfer function between the output of the loop filter and the output of the output stage is substantially equivalent to a second transfer function between the output of the loop filter and the output of the output stage.

An analog-digital conversion apparatus may include a control unit configured for receiving an analog-digital (AD) conversion request from a plurality of processing modules; and an analog-digital converter (ADC) configured for performing analog-digital conversion according to the AD conversion request received from the control unit, in which the control unit is configured to integrate the AD conversion request according to periodicity of the AD conversion request and to transfer the integrated AD conversion request to the ADC.

An analog-to-digital conversion device includes: a switch connected to input units through signal lines to receive external voltages selecting and outputting one external voltage; an S/H circuit holding a voltage corresponding to an output of the switch; a converter performing AD conversion based on the voltage; and a controller determining the external voltage selected by the switch and performing a disconnection determination whether a disconnection occurs in the signal line. In the disconnection determination, the controller controls the switch to select a reference voltage different from the external voltage before controlling the switch to select the external voltage to be determined, and performs the disconnection determination based on a voltage difference between the reference voltage and the external voltage after controlling the switch to select the external voltage.

In an example, a system includes an input channel and a voltage to delay converter (V2D) coupled to the input channel. The system also includes a first multiplexer coupled to the V2D and an analog-to-digital converter (ADC) coupled to the first multiplexer. The system includes a second multiplexer coupled to the input channel and an auxiliary ADC coupled to the second multiplexer. The system includes calibration circuitry coupled to an output of the auxiliary ADC, where the calibration circuitry is configured to correct a non-linearity in a signal provided by the input channel. The calibration circuitry is also configured to determine the non-linearity of the signal provided to the ADC relative to the signal provided to the auxiliary ADC.

Continuous time pipeline, level-crossing (LC), analog-to-digital converters (ADCs) use a plurality of stages from a first stage to a last stage. Each stage has an array of comparators that are provided with an array of reference voltage levels. Each stage is configured to detect level crossings of increasing fineness compared to the preceding stage such that the accuracy of a digitized representation of an input signal can be increased by adding stages as well as increasing the number of comparators in each stage. The voltage error in the digitized representation of the signal that remains after each stage provides the input to the subsequent stage. The continuous time pipeline LC ADCs are also applied to analog signal processing and software defined radios.

The semiconductor device according to this disclosure includes an analog input terminal, an amplifier circuit, a sample-and-hold circuit, an analog input switch connected between the analog input terminal and the input terminal of the amplifier circuit, a control switch connected between the output terminal of the amplifier circuit and the input terminal of the sample-and-hold circuit, a comparison circuit connected to the output terminal of the sample-and-hold circuit, an analog-to-digital converter connected to the comparator circuit, a control circuit, and a signal conversion circuit for converting the first control signal from the control circuit into a second control signal. The analog input switch is turned on during the activation level of the second control signal. The period of the activation level of the second control signal is longer than that of the first control signal to reduce a conversion error of an analog-to-digital conversion circuit.

An electronic device for compressing sampled data comprises a memory element and a processing element. The memory element is configured to store sampled data points and sampled times. The processing element is in electronic communication with the memory element and is configured to receive a plurality of sampled data points, a slope for each sampled data point in succession, the slope being a value of a change between the sampled data point and its successive sampled data point, and store the sampled data point in the memory element when the slope changes in value from a previous sampled data point.

An embedded system includes a peripheral and system-on-a-chip executing virtual machines and a hypervisor. The peripheral includes a crossbar circuit receiving digital sensor signals and selectively outputting the digital sensor signals to different outputs, queue circuits each receiving a different one of the digital sensor signals from the crossbar circuit, and queue protection circuits associated with the queue circuits and selectively permitting access to one of the queue circuits by the virtual machines. The hypervisor controls the queue protection circuits to set which of the virtual machines may access which queue circuits. A sensor protection circuit selectively permits reading of the digital sensor signals from the crossbar circuit by the queue circuits. The hypervisor controls the sensor protection circuit to set which of the queue circuits may access each of the digital sensor signals from the crossbar circuit.

A successive approximation analog-to-digital converter includes a digital-to-analog converter DAC configured to receive a digital signal. First conversion units of the DAC are configured to sample an analog signal via a first switch and provide a first level voltage. Each first conversion unit includes a first capacitor array and a first switch array controlled from the digital signal. A single second conversion unit of the DAC is configured to provide a second level voltage. The second conversion unit includes a second capacitor array and a second switch array. A comparator operates to compare each of the first level voltages to the second level voltage and to provide a comparison signal based on each comparison and actuation of a set of third switches. A control circuit closes the first switches simultaneously and closes the third switches successively for the conversion of each sampled analog signal.

A circuit arrangement includes a microcontroller having a first analog-to-digital converter whose input is connected to the output of a first multiplexer whose output is connected to a first comparison device for comparing reference voltages, and a first serial interface circuit connected to the first comparison device. A voltage generating circuit includes a second analog-to-digital converter whose input is connected to the output of a second multiplexer whose output is connected to a number of registers, which are connected to a safety value generator and store digital values together with a respective safety value, and a second serial interface circuit connected to the registers. The first and second serial interface circuits are connected to each other for communication of the microcontroller with the voltage generating circuit, the first interface circuit being connected to a second comparison device for comparing supply voltages and/or currents with desired voltages and/or desired currents.