Aspects of the technology described herein relate to control circuitry configured to turn on and off the ADC driver. In some embodiments, the control circuitry is configured to turn on and off the ADC driver in synchronization with sampling activity of an ADC, in particular based on when an ADC is sampling. The control circuitry may be configured to turn on the ADC driver during the hold phase of the ADC a time period before the track phase and to turn off the ADC driver during the hold phase a time period after the track phase. In some embodiments, the control circuitry is configured to control a duty cycle of the ADC driver turning on and off. In some embodiments, the control circuitry is configured to control a ratio between an off current and an on current in the ADC driver.

Apparatus includes an ADC configured to convert an analog signal to a digital signal, a comparator having a first input responsive to the analog signal, a second input responsive to the digital signal, and an output at which a comparison signal is provided, and an output checker configured to process the comparison signal to generate a fault signal indicative of whether a fault has occurred in the ADC. The comparator can be an analog comparator in which case the digital signal is converted to an analog signal for the comparison or a digital comparator in which case an additional ADC is provided to convert the analog signal into a digital signal for the comparison. Embodiments include more than one ADC in which case summation elements are provided to sum the analog signals and the digital signals for the comparison.

A phase-shifted sampling module for sampling a signal is described. The phase-shifted sampling module includes a primary sampler module, an ADC module, and an equalization module. The primary sampler module includes an analog signal input, a first signal path, and a second signal path. The equalization module includes a primary sampler equalizer sub-module. The primary sampler equalizer sub-module is configured to compensate low-frequency mismatches between the first signal path and the second signal path. Further, a method for determining filter coefficients of an equalization module of a phase-shifted sampling module is described.

An analog to digital conversion circuit includes an analog to digital converter (ADC) circuit operable to convert an analog signal having an oscillation frequency into a first digital signal having a first data rate frequency. The analog signal includes a set of pure tone components. The first digital signal includes n 1-bit channels. The analog to digital conversion circuit further includes a digital decimation filtering circuit including n anti-aliasing filters operable to sample and filter the n 1-bit channels of the first digital signal to produce n second digital signals and n decimator circuits operable to decimate the n second digital signals to produce n third digital signals at a second data rate frequency. The analog to digital conversion circuit further includes a multiplexor operable to output the n third digital signals at the second data rate frequency on a single bus.

A receiver having analog-to-digital converters (ADC) is disclosed. The ADCs may be reconfigured based on the insertion loss mode of the receiver. For example, different portions of a plurality of time-interleaved successive approximation (SAR) ADC slices included in at least one sub-ADC of each time-interleaved ADC may be enabled depending on which of a plurality of insertion loss modes is selected for operation of the receiver.

An apparatus includes a sampling circuit, a sense circuit, and a tuning circuit. The sampling circuit samples an input signal according to a sampling clock signal to produce a sampled signal. The sense circuit determines a scaling factor based on a distortion in the sampled signal caused by the sampling clock signal. The tuning circuit generates an offset signal based on the sampling clock signal and the scaling factor. The offset signal reduces the distortion in the sampled signal caused by the sampling clock signal.

Systems, devices, and methods related to low-noise, high-accuracy single-ended continuous-time sigma-delta (CTSD) analog-to-digital converter (ADC) are provided. An example single-ended CTSD ADC includes a pair of input nodes to receive a single-ended input signal and input circuitry. The input circuitry includes a pair of switches, each coupled to one of the pair of input nodes; and an amplifier to provide a common mode signal at a pair of first nodes, each before one of the pair of switches. The single-ended CTSD ADC further includes digital-to-analog converter (DAC) circuitry; and integrator circuitry coupled to the input circuitry and the DAC circuitry via a pair of second nodes.

An apparatus for analog-to-digital conversion is provided. The apparatus includes a first analog-to-digital converter (ADC) configured to receive an input signal and convert the input signal to a sequence of M-bit digital values. The apparatus further includes a second ADC including a plurality of time-interleaved sub-ADCs each being configured to receive the input signal and at least one M-bit digital value of the sequence of M-bit digital values. Further, each of the plurality of time-interleaved sub-ADCs is configured to convert the input signal to a respective sequence of B-bit digital values using the at least one M-bit digital value of the sequence of M-bit digital values. M and B are integers with M<B.

A signal control device includes a charge/discharge circuit, a sampling capacitor, and an AC conversion circuit. The charge/discharge circuit is capable of charging or discharging the sampling capacitor. The AC conversion circuit performs an AD conversion by converting an analog voltage value charged in the sampling capacitor into an AD conversion value that is a digital value. After a charge operation or a discharge operation to the sampling capacitor with the charge/discharge circuit, the AD conversion circuit performs the AD conversion, and a malfunction of the charge/discharge circuit is determined based on a diagnosis result of the AD conversion value.

A flicker detection circuit is provided. The flicker detection circuit may include a flicker detection correlated double sampling (FD CDS) circuit including first to sixth switches turned on or off based on a control signal, and first to fourth capacitors, the FD CDS circuit being configured to receive a flicker pixel signal output from at least one pixel, summate with an output offset signal, and amplify the summation based on a gain to form a flicker detection signal; and an analog-to-digital converter (ADC) configured to quantize the flicker detection signal.