Provided is an AD converter, including: an analog signal input circuit, configured to be input with an analog input signal, and output a first analog output signal based on the analog input signal and a second analog output signal based on the analog input signal at different timing; an integral circuit, configured to integrate the first analog output signal and the second analog output signal and output the first integral signal and the second integral signal; a predictive circuit, configured to predict an integral signal output after the output by the integral circuit based on the first integral signal and the second integral signal output by the integral circuit, and output a predictive integral signal; and a quantization circuit, configured to generate a digital signal with the predictive integral signal quantized.

A method is provided. In some examples, the method includes receiving, at a sequencer circuit of an analog-to-digital converter (ADC), a first request to perform a first conversion. In addition, the method includes determining, by the sequencer circuit, that the ADC is not busy. The method further includes responsive to determining that the ADC is not busy, and by the sequencer circuit, causing the ADC to perform the first conversion. The method also includes receiving, at the sequencer circuit, a second request to perform a second conversion. The method includes determining, by the sequencer circuit, that the ADC is busy and, responsive to determining that the ADC is busy, and by the sequencer circuit, waiting to cause the ADC to perform the second conversion.

An analog-to-digital converter (ADC) is provided. In some examples, the ADC includes a first reference voltage supply input, a second reference voltage supply input, a comparator comprising an input node, and a first reference switch coupled between the second reference voltage supply input and the input node of the comparator. The ADC also includes a set of capacitors, where each capacitor of the set of capacitors comprises a first terminal. In addition, the ADC includes a second reference switch coupled between the first reference voltage supply input and the first terminal of each capacitor of the set of capacitors. The ADC further includes a third switch coupled between the input node of the comparator and the first terminal of each capacitor of the set of capacitors.

Various exemplary embodiments are directed to methods including obtaining an input sample magnitude, filtering the obtained input sample magnitude, generating a sample-to-sample difference based on the filtered input sample magnitude, and engaging an actuator in accordance with a determination that the sample-to-sample difference satisfies a rate threshold. In addition, various exemplary embodiments are directed to devices including a processor, a control sensor operatively coupled to the processor and operable to obtain an input sample magnitude, an input filter operatively coupled to the processor and operable to filter the at least one obtained input magnitude sample, a non-transitory computer-readable medium operatively coupled to the processor and including a rate engine operable to generate a sample-to-sample difference based on the filtered input sample magnitude, and to generate a determination that the sample-to-sample difference satisfies a rate threshold, and a control actuator operatively coupled to the processor and operable to engage an operation mechanism in accordance with the determination that the sample-to-sample difference satisfies a rate threshold.

In an analog-to-digital converter, primary latches respectively latch an output of a corresponding one of delay units at respective sample times of different first clocks. The primary latches include at least first and second primary latches, and secondary latches include at least first and second secondary latches respectively corresponding to the at least first and second primary latches. Each of the at least first and second secondary latches is configured to latch, at a sample time of a common second clock, an output of a corresponding one of the at least first and second primary latches. The common second clock is based on at least one of the first clocks.

A circuit system for weight modulation and image recognition of a memristor array includes a personal computer (PC), a field-programmable gate array (FPGA) chip, a digital-to-analog conversion unit, a switch unit, a memristor array unit, an integration and signal amplification circuit, and an analog-to-digital converter. The circuit system selects a to-be-realized function such as array reading and writing, weight modulation or image recognition, converts a command or an RGB value of an image collected by the PC into a corresponding grayscale value, and sends the grayscale value to the FPGA chip. The FPGA chip controls and selects a to-be-modulated memristor array unit through the digital-to-analog conversion unit and the switch unit. An application program of the PC controls the FPGA chip in real time to realize array reading and writing, weight modulation, and image recognition, and then the FPGA chip displays a result on the PC in real time.

Sampling circuits and methods for sampling are provided. In a first operating phase, sampling capacitors are coupled to inputs, and in a second operating phase, to a common-mode signal.

An analog-to-digital converter (1) includes an S/H circuit (10) configured to sample and hold an analog input signal (IN) in synchronization with a sampling clock signal (CLK), a delay circuit (20) configured to delay the sampling clock signal (CLK), an ADC circuit (30) configured to sample an output signal (S/H_out) of the S/H circuit (10) in synchronization with the sampling clock signal (CLK_delay) that is delayed, and output a digital signal (OUT) corresponding to an amplitude of the output signal that is sampled, and a delay adjustment circuit (40) configured to adjust a delay time of the sampling clock signal (CLK) in the delay circuit (20) in accordance with a change in frequency of the sampling clock signal (CLK).

An integrator and an analog-to-digital converter are provided. The analog-to-digital converter includes the integrator, a comparison circuit and a control logic circuit. The integrator includes an operational amplifier, offset capacitors, input capacitors, integral capacitors and controllable switches. The input capacitors and the integral capacitors are connected to the operational amplifier via controllable switches, so that the integrator operates in various operation modes. Operation states of the offset capacitors in a first phase and a second phase of an operation cycle are controlled by switching on or off the controllable switches. Therefore, an offset voltage of the integrator is eliminated, and conversion efficiency and conversion accuracy of the analog-to-digital converter is improved.

A sample holding circuit includes a signal input terminal, a first sampling unit, a second sampling unit, and a holding unit. The signal input terminal receives a first reference voltage or a second reference voltage, the first sampling unit samples the first reference voltage when a first clock signal is triggered to obtain a first sampling voltage, the second sampling unit samples the second reference voltage when a second clock signal is triggered to obtain a second sampling voltage. The holding unit receives the first sampling voltage and the second sampling voltage when a third clock signal is triggered. The sample holding circuit effectively simplifies circuit structure and reduces the use of amplifiers, also improving the signal to noise ratio.