An embodiment target time comparison circuit corresponding to a target approximate voltage range among 2.sup.K time comparison circuits in a second comparison circuit compares a comparison operation time difference included in voltage comparison results regarding two adjacent approximate voltage ranges that are vertically adjacent to the target approximate voltage range with 2.sup.L reference times corresponding to 2.sup.L specific voltage ranges and generates a target binary code of L bits indicating a target specific voltage range including the held voltage from the obtained time comparison results.

An embodiment target time comparison circuit corresponding to a target approximate voltage range among 2.sup.K time comparison circuits in a second comparison circuit compares a comparison operation time difference included in voltage comparison results regarding two adjacent approximate voltage ranges that are vertically adjacent to the target approximate voltage range with 2.sup.L reference times corresponding to 2.sup.L specific voltage ranges and generates a target binary code of L bits indicating a target specific voltage range including the held voltage from the obtained time comparison results.

A flash analog to digital converter includes a voltage generator circuit, an encoder circuit, and first and second double differential amplifier circuits. The voltage generator circuit generates reference voltages according to first and second voltages. The encoder circuit generates a digital signal corresponding to an input signal according to first signals. The first double differential amplifier circuit compares the input signal with a first reference voltage in the reference voltages, to generate a corresponding one of the first signals. The second double differential amplifier circuit compares the input signal with a second reference voltage in the reference voltages, to generate a corresponding one of the first signals. A difference between the first voltage and the first reference voltage is less than that between the first voltage and the second reference voltage, and the first and the second double differential amplifier circuits have different circuit architectures.

The present disclosure provides a signal conversion circuit and fingerprint identification system. The signal conversion circuit is configured to generate a first digital signal according to a first analog signal, and includes a comparator and counter. The comparator includes a first input terminal configured to receive the first analog signal, a second input terminal connected to a reference voltage generator and configured to receive a reference voltage, and an output terminal configured to output a second digital signal. The counter is connected to the output terminal, and is configured to generate a first digital signal. The signal conversion circuit according to the present disclosure has the advantages of simple circuit structure, small circuit area, low cost and low power consumption.

A receiver having an analog to digital converter with adjustable reference voltages that are calibrated to account for process variations. The receiver comprises an analog to digital converter. The analog to digital converter includes a reference generator to generate a set of N reference voltages. The reference generator adjusts voltage levels of the set of N reference voltages based on one or more control signals. A plurality of comparators compare an input signal to the set of N reference voltages. A calibration circuit generates the one or more control signals for adjusting the voltage levels of the N reference voltages based on outputs of the comparators.

A semiconductor integrated circuit according to an embodiment includes an A/D converter, first and second equalizer circuits, and first and second controllers. The first equalizer circuit includes a first tap. The first and second equalizer circuits receive a signal based on a digital signal, and output first and second signals, respectively. The first controller adjusts a phase of a clock signal based on the first signal. The second controller an operation of adjusting a control parameter including a tap coefficient. In the operation, the second controller adjusts a tap coefficient of each of taps of the second equalizer circuit, and adjusts a tap coefficient of the first tap based on an adjustment result of each tap coefficient of the second equalizer circuit.

A multi-instance time-interleaving (TI) system and method of operation therefor. The system includes a plurality of TI devices, each with a plurality of clock generation units (CGUs) coupled to an interleaver network. Within each TI device, the plurality of CGUs provides a plurality of clock signals needed by the interleaver network. A phase detector device is coupled to the plurality of TI devices and configured to determine any phase differences between the clock signals of a designated reference TI device and the corresponding clock signals of each other TI device. To determine the phase differences, the phase detector can use a logic comparator configuration, a time-to-digital converter (TDC) configuration, or an auto-correlation configuration. The phases of the clock signals of each other TI device can be aligned to the reference TI device using internal phase control, retimers, delay cells, finite state machines, or the like.

An analog-to-digital converter that converts an inputted analog signal into a digital value is disclosed that may include unit circuits that each generate reference voltages comprising regular potential intervals by a series resistor circuit connected between a high potential side reference voltage and a low potential side reference voltage and convert the reference voltages into a digital value by comparing the reference voltages with the inputted analog signal, and an adder that adds the digital values converted by the unit circuits. Each unit circuit may include coupling switches that couple the series resistor circuit with the series resistor circuit of another one of the unit circuits and connect the series resistor circuits between the high potential side reference voltage and the low potential side reference voltage and a sharing switch that shares the inputted analog signal with the other unit circuit that is coupled with the series resistor circuit.

In at least some examples, an integrated circuit includes an input pin and an analog-to-digital converter (ADC) comprising an input terminal coupled to the input pin and an output terminal. The integrated circuit further includes a logic circuit comprising an input terminal coupled to the output terminal of the ADC, a first output terminal, and a second output terminal. The integrated circuit further includes a resistance circuit. In an example, the resistance circuit includes a resistor coupled between the input pin and a first node, a first switch coupled between the first node and a reference voltage pin, and a second switch coupled between the first node and a ground pin.

An image sensor may contain an array of imaging pixels. Each pixel column outputs signals that are read out using a successive approximation register (SAR) analog-to-digital converter (ADC). The SAR ADC may include at least first and second input sampling capacitors, a comparator, a capacitive digital-to-analog converter (CDAC), and associated control circuitry. If desired, the SAR ADC may include a bank of more than two input sampling capacitors alternating between sampling and conversion. The first capacitor may be used to sample an input signal while conversion for the second capacitor is taking place. Prior to conversion, an input voltage of the comparator and an output voltage of the CDAC may be initialized. During conversion of the signal on the first capacitor, the first capacitor is embedded within the SAR ADC feedback loop to prevent charge sharing between the input sampling capacitor and the CDAC, thereby mitigating potential capacitor mismatch issues.