Disclosed are an analog-to-digital conversion circuit, an analog-to-digital conversion device, and a digital x-ray imaging system. The analog-to-digital conversion circuit includes a first reference voltage source, a second reference voltage source, a first analog-to-digital converter connected to the first reference voltage source, a second analog-to-digital converter connected to the second reference voltage source, a connecting circuit connected to the first analog-to-digital converter and the second analog-to-digital converter, respectively, and a current source having negative temperature coefficient configured to be connected to the first reference voltage source and the second reference voltage source, respectively.

An analog-to-digital circuit that digitizes an analog voltage. The analog-to-digital circuit includes plural comparators functionally connected to form a tree that has levels i, and each level i has branches j, and an encoder connected to the plural comparators and configured to generate a digitized value of an input analog voltage. Each comparator from a level i has first and second outputs, and each of the first and second outputs is electrically connected to an input of different comparators from a next level i+1 of the tree.

Provided is an AD converter, including: an analog signal input circuit, configured to be input with an analog input signal, and output a first analog output signal based on the analog input signal and a second analog output signal based on the analog input signal at different timing; an integral circuit, configured to integrate the first analog output signal and the second analog output signal and output the first integral signal and the second integral signal; a predictive circuit, configured to predict an integral signal output after the output by the integral circuit based on the first integral signal and the second integral signal output by the integral circuit, and output a predictive integral signal; and a quantization circuit, configured to generate a digital signal with the predictive integral signal quantized.

A tracking analog-to-digital converter (ADC) for a power converter includes a first tracking loop and a second tracking loop. The first tracking loop is configured to track a voltage input to the tracking ADC using one or more comparators and has a re-clocking circuit to mitigate the impact of comparator output metastability, but introduces multi-cycle latency which increases a residual error of the voltage tracking provided by the first tracking loop. The second tracking loop is configured to supplement the voltage tracking provided by the first tracking loop and to reduce the residual error of the voltage tracking for dynamic changes at the voltage input. The second tracking loop has a single-cycle latency and is implemented with logic that is less sensitive to logic errors due to comparator metastability. Corresponding methods of voltage tracking and an electronic system are also described.

An analog to digital converter (ADC) comprising: a delay circuit having a complementary signal output; a first comparator having an input coupled to the complementary signal output of the delay circuit, the first comparator having a first output and a second output; a first dummy comparator having a first dummy input coupled to the first output and a second dummy input coupled to the second output, the first dummy comparator having a dummy output; a first interpolation comparator having an interpolation output and a first interpolation input coupled to the first output; a second dummy comparator having an input coupled to the interpolation output; and a second interpolation comparator having a second interpolation input and a third interpolation input, the second interpolation input coupled to the interpolation output and the third interpolation input coupled to the dummy output.

An analog to digital converter is provided and includes column processing units that convert analog signal to digital signal. One or more counters count time of analog to digital conversion and one or more comparators compares the voltage of reference signal and analog signal from neuromorphic device. One or more generators generates the reference signal for the comparator.

An analog to digital converter is provided and includes column processing units that convert analog signal to digital signal. One or more counters count time of analog to digital conversion and one or more comparators compares the voltage of reference signal and analog signal from neuromorphic device. One or more generators generates the reference signal for the comparator.

A time-interleaved circuit includes an input buffer, a plurality of track-and-hold circuits, and a plurality of isolation inductors. The input buffer is configured to receive an input signal having an input voltage and to output an output signal having an output voltage. The track-and-hold circuits are electrically coupled in parallel with each other. Each track-and-hold circuit is electrically coupled in series with the input buffer. Each isolation inductor is electrically coupled to the output of the input buffer and at least one of the track-and-hold circuits.

An embodiment target time comparison circuit corresponding to a target approximate voltage range among 2.sup.K time comparison circuits in a second comparison circuit compares a comparison operation time difference included in voltage comparison results regarding two adjacent approximate voltage ranges that are vertically adjacent to the target approximate voltage range with 2.sup.L reference times corresponding to 2.sup.L specific voltage ranges and generates a target binary code of L bits indicating a target specific voltage range including the held voltage from the obtained time comparison results.

An embodiment target time comparison circuit corresponding to a target approximate voltage range among 2.sup.K time comparison circuits in a second comparison circuit compares a comparison operation time difference included in voltage comparison results regarding two adjacent approximate voltage ranges that are vertically adjacent to the target approximate voltage range with 2.sup.L reference times corresponding to 2.sup.L specific voltage ranges and generates a target binary code of L bits indicating a target specific voltage range including the held voltage from the obtained time comparison results.