A Unit Element (UE) has a positive UE and a negative UE, each having a digital X input and a digital W input with a sign bit, the sign bit is exclusive ORed with a chop clock to generate a chopped sign bit. The positive UE is enabled when the chopped sign bit is positive and the negative UE is enabled when the chopped sign bit is negative. Each positive and negative UE comprises groups of NAND gates generating an output and complementary output which are coupled to a differential charge transfer bus comprising a positive charge transfer line and a negative charge transfer line. The NAND gate outputs and complementary outputs are coupled through binary weighted charge transfer capacitors the positive charge transfer line and negative charge transfer line.

A Bias Unit Element (UE) has a digital input, a sign input, and a chop clock. The sign input is exclusive ORed with the chop clock to generate a signed chop clock. Each Bias UE comprises a positive Bias UE and a negative Bias UE, each comprising groups of NAND gates generating an output and a complementary output, each of which are coupled to differential charge transfer lines through binary weighted charge transfer capacitors to a differential charge transfer bus comprising a positive charge transfer line and a negative charge transfer line. The chopped sign input enables the positive Bias UE when the sign bit is positive and enables the negative Bias UE when the sign bit is negative.

An architecture for a multiplier-accumulator (MAC) uses a common Unit Element (UE) for each aspect of operation, the MAC formed as a plurality of MAC UEs, a plurality of Bias UEs, and a plurality of Analog to Digital Conversion (ADC) UEs which collectively perform a scalable MAC operation and generate a binary result. Each MAC UE, BIAS UE and ADC UE comprises groups of NAND gates with complementary outputs arranged in NAND-groups, each NAND gate coupled to a differential charge transfer bus through a binary weighted charge transfer capacitor to form an analog multiplication product as a charge applied to the differential charge transfer bus. The analog charge transfer bus is coupled to groups of ADC UEs with an ADC controller which enables and disables the ADC UEs using successive approximation to determine the accumulated multiplication result.

An architecture for a multiplier-accumulator (MAC) uses a common Unit Element (UE) for each aspect of operation, the MAC formed as a plurality of MAC UEs, a plurality of Bias UEs, and a plurality of Analog to Digital Conversion (ADC) UEs which collectively perform a scalable MAC operation and generate a binary result. Each MAC UE, BIAS UE and ADC UE comprises groups of NAND gates with complementary outputs arranged in NAND-groups, each NAND gate coupled to a differential charge transfer bus through a binary weighted charge transfer capacitor to form an analog multiplication product as a charge applied to the differential charge transfer bus. The analog charge transfer bus is coupled to groups of ADC UEs with an ADC controller which enables and disables the ADC UEs using successive approximation to determine the accumulated multiplication result.

A Unit Element (UE) has a digital X input and a digital W input, and comprises groups of NAND gates generating complementary outputs which are coupled to a differential charge transfer bus comprising a positive charge transfer line and a negative charge transfer line. The number of bits in the X input determines the number of NAND gates in a NAND-group and the number of bits in the W input determines the number of NAND groups. Each NAND-group receives one bit of the W input applied to all of the NAND gates of the NAND-group, and each unit element having the bits of X applied to each associated NAND gate input of each unit element. The NAND gate outputs are coupled through binary weighted charge transfer capacitors to a positive charge transfer line and negative charge transfer line.

Techniques for performing analog-to-digital conversion are disclosed. For example, a method performs an analog-to-digital conversion of an analog input to a digital output comprising a set of bits, the set of bits comprising a most significant bit and one or more additional bits, the analog-to-digital conversion starting at a given one of the one or more additional bits following the most significant bit.

Techniques for performing analog-to-digital conversion are disclosed. For example, a method performs an analog-to-digital conversion of an analog input to a digital output comprising a set of bits, the set of bits comprising a most significant bit and one or more additional bits, the analog-to-digital conversion starting at a given one of the one or more additional bits following the most significant bit.

A current steering digital-to-analog converter includes a plurality of current cells each including a current source circuit and a current switch circuit to selectively output a current in response to a first input signal corresponding to a digital signal; a dummy current cell including a dummy current source circuit and a dummy current switch circuit to output a current in response to a second input signal; and a current switch bias circuit coupled to the dummy current cell to track a first voltage of an internal node of the dummy current source circuit and configured to generate a first bias voltage applied to the current switch circuit.

A physical quantity detection circuit includes: a detection signal generation circuit generating a detection signal, based on an output signal from a physical quantity detection element; an analog/digital converter circuit converting the detection signal into a first digital signal and converting a test signal into a second digital signal; a test signal generation circuit generating the test signal; and a malfunction diagnosis circuit diagnosing a malfunction of the analog/digital converter circuit, based on the second digital signal. A full-scale voltage of the analog/digital converter circuit is selected from among a plurality of voltages having different magnitudes, according to a power supply voltage. The test signal includes an upper limit value test signal, a lower limit value test signal, and a first intermediate value test signal. The test signal generation circuit performs resistive voltage division of the full-scale voltage and thus generates the first intermediate value test signal.

In-memory computing architectures and methods of performing multiply-and-accumulate operations are provided. The method includes sequentially shifting bits of first input bytes into each row in an array of memory cells arranged in rows and columns. Each memory cell is activated based on the bit to produce a bit-line current from each activated memory cell in a column on a shared bit-line proportional to a product of the bit and a weight stored therein. Charges produced by a sum of the bit-line currents in a column are accumulated in first charge-storage banks coupled to a shared bit-line in each of the columns. Concurrently, charges from second input bytes accumulated in second charge-storage banks previously coupled to the columns are sequentially converted into output bytes. The charge-storage banks are exchanged after the first input bytes have been accumulated and the charges from the second input bytes converted. The method then repeats.