A multiply-accumulate (MAC) computation circuit includes: a bit-cell array configured to generate an analog output corresponding to a MAC operation result of an input signal; a first analog-to-digital conversion (ADC) circuit configured to determine an upper part of a digital output corresponding to the analog output; and a second ADC circuit configured to determine a lower part of the digital output based on a reference voltage corresponding to the upper part.

A multiply-accumulate (MAC) computation circuit includes: a bit-cell array configured to generate an analog output corresponding to a MAC operation result of an input signal; a first analog-to-digital conversion (ADC) circuit configured to determine an upper part of a digital output corresponding to the analog output; and a second ADC circuit configured to determine a lower part of the digital output based on a reference voltage corresponding to the upper part.

Disclosed is a system comprising a plurality of operational amplifiers, each operational amplifier having individually adjustable operational parameters, and a trimming circuit. The trimming circuit includes successive approximation register (SAR) logic that determines associated memory values. The trimming circuit changes the adjustable operational parameters of each operation amplifier based on the associated memory values.

Disclosed is a system comprising a plurality of operational amplifiers, each operational amplifier having individually adjustable operational parameters, and a trimming circuit. The trimming circuit includes successive approximation register (SAR) logic that determines associated memory values. The trimming circuit changes the adjustable operational parameters of each operation amplifier based on the associated memory values.

An apparatus is disclosed for pipelined analog-to-digital conversion. In an example aspect, the apparatus includes a pipelined analog-to-digital converter (ADC). The pipelined ADC includes a first stage and a second stage. The first stage includes a sampler and a quantizer coupled to the sampler. The first stage also includes a current distribution circuit coupled to the sampler. The second stage includes a sampler coupled to the current distribution circuit and a quantizer coupled to the sampler of the second stage.

An apparatus is disclosed for pipelined analog-to-digital conversion. In an example aspect, the apparatus includes a pipelined analog-to-digital converter (ADC). The pipelined ADC includes a first stage and a second stage. The first stage includes a sampler and a quantizer coupled to the sampler. The first stage also includes a current distribution circuit coupled to the sampler. The second stage includes a sampler coupled to the current distribution circuit and a quantizer coupled to the sampler of the second stage.

Analogue-to-digital converter, ADC, circuitry, including: an analogue input terminal; a comparator having first and second comparator-input terminals; and successive-approximation control circuitry to apply a potential difference across the first and second comparator-input terminals based on an input voltage signal, and to control the potential difference for a series of successive approximation operations to cause the comparator to test in each successive approximation operation whether a magnitude of an analogue input voltage signal is larger or smaller than a corresponding test value, the test value for each successive approximation operation being, dependent on a comparison result generated by the comparator in the preceding approximation operation, bigger or smaller than the test value for the preceding approximation operation by a difference amount configured for that successive approximation operation.

Analogue-to-digital converter, ADC, circuitry, including: an analogue input terminal; a comparator having first and second comparator-input terminals; and successive-approximation control circuitry to apply a potential difference across the first and second comparator-input terminals based on an input voltage signal, and to control the potential difference for a series of successive approximation operations to cause the comparator to test in each successive approximation operation whether a magnitude of an analogue input voltage signal is larger or smaller than a corresponding test value, the test value for each successive approximation operation being, dependent on a comparison result generated by the comparator in the preceding approximation operation, bigger or smaller than the test value for the preceding approximation operation by a difference amount configured for that successive approximation operation.

Mixed-signal circuitry including a set of capacitive digital-to-analogue converter, CDAC, units for carrying out digital-to-analogue conversion operations to convert respective digital values into corresponding analogue values; and control circuitry, where: each CDAC unit includes an array of capacitors at least some of which are configured to be individually-switched dependent on the digital values, the capacitors configured to have nominal capacitances; a given capacitor of the array of capacitors in each of the CDAC units is a target capacitor; the set of CDAC units includes a plurality of sub-sets of CDAC units; at least one of the target capacitors per sub-set of CDAC units is a variable capacitor, controllable by the control circuitry to have any one of a plurality of nominal capacitances defined by the configuration of that capacitor.

Mixed-signal circuitry including a set of capacitive digital-to-analogue converter, CDAC, units for carrying out digital-to-analogue conversion operations to convert respective digital values into corresponding analogue values; and control circuitry, where: each CDAC unit includes an array of capacitors at least some of which are configured to be individually-switched dependent on the digital values, the capacitors configured to have nominal capacitances; a given capacitor of the array of capacitors in each of the CDAC units is a target capacitor; the set of CDAC units includes a plurality of sub-sets of CDAC units; at least one of the target capacitors per sub-set of CDAC units is a variable capacitor, controllable by the control circuitry to have any one of a plurality of nominal capacitances defined by the configuration of that capacitor.