A calibration circuit, including: a signal generator circuit configured to generate a modulated analog input signal, which is based on a digital input word that is modulated; an Analog-to-Digital Converter (ADC) configured to convert an analog reference signal to a digital calibration word, wherein the analog reference signal is a low-pass-filtered version of the analog input signal generated by the signal generator circuit; and a feedback circuit configured to output the digital input word by adjusting the digital calibration word depending on a digital feedback signal, which is based on a modulated version of the analog reference signal, wherein the signal generator circuit, the ADC, and the feedback circuit are provided on a same chip.

One or more examples relate to methods and apparatuses for measuring a voltage node. An example method may include providing, between an input of a measurement circuit and a voltage node associated with a higher voltage domain than the measurement circuit, a circuit including decoupled capacitors, the decoupled capacitors including at least a first capacitor and a second capacitor; generating, by the measurement circuit, a first digital value representing a voltage level related to a voltage level at the voltage node at least partially responsive to performing a measurement process utilizing the circuit; and generating, by a processor, a second digital value representing the voltage level at the voltage node at least partially responsive to the first digital value and a scaling factor, the scaling factor representing a pre-specified relationship between the voltage level represented by the first digital value and the voltage level at the voltage node.

One or more examples relate to methods and apparatuses for measuring a voltage node. An example method may include providing, between an input of a measurement circuit and a voltage node associated with a higher voltage domain than the measurement circuit, a circuit including decoupled capacitors, the decoupled capacitors including at least a first capacitor and a second capacitor; generating, by the measurement circuit, a first digital value representing a voltage level related to a voltage level at the voltage node at least partially responsive to performing a measurement process utilizing the circuit; and generating, by a processor, a second digital value representing the voltage level at the voltage node at least partially responsive to the first digital value and a scaling factor, the scaling factor representing a pre-specified relationship between the voltage level represented by the first digital value and the voltage level at the voltage node.

A time-interleaved analog to digital converter includes capacitor array circuits, at least one successive approximation register circuitry, and at least one noise shaping circuitry. The capacitor array circuits are configured to alternately sample an input signal, in order to generate a sampled input signal. The at least one successive approximation register circuitry is configured to perform an analog to digital conversion according to the sampled input signal and a residue signal, in order to generate at least one digital output. The at least one noise shaping circuitry is configured to utilize at least one first circuit in switched-capacitor circuits to transfer the residue signal from a first capacitor array circuit in the capacitor array circuits, and randomly select at least one second circuit from the switched-capacitor circuits to cooperate with a second capacitor array circuit in the capacitor array circuits to sample the input signal.

A method, which is applied in a driving circuit including an analog-to-digital convertor (ADC) and a switching circuit including an inductor and coupled to a load, includes steps of: performing an analog-to-digital conversion on a load voltage of the load at a first rate; and producing at least a current pulse flowing through the inductor at a second rate. Wherein, each current pulse among the at least a current pulse is accomplished within a second cycle corresponding to the second rate, all of the at least a current pulse are accomplished within a first cycle corresponding to the first rate, and a first length of the first cycle is longer than twice of a second length of the second cycle.

A method, which is applied in a driving circuit including an analog-to-digital convertor (ADC) and a switching circuit including an inductor and coupled to a load, includes steps of: performing an analog-to-digital conversion on a load voltage of the load at a first rate; and producing at least a current pulse flowing through the inductor at a second rate. Wherein, each current pulse among the at least a current pulse is accomplished within a second cycle corresponding to the second rate, all of the at least a current pulse are accomplished within a first cycle corresponding to the first rate, and a first length of the first cycle is longer than twice of a second length of the second cycle.

A time-interleaved analog to digital converter includes coarse converter circuitries, a control logic circuit, first and second transfer circuits, a fine converter circuitry, and an encoder circuit. The coarse converter circuitries sequentially sample an input signal and perform coarse conversions to generate decision signals. The control logic circuit generates coarse digital codes according to the decision signals. The first and second transfer circuits respectively transfer first and second residue signals. The fine converter circuitry performs a fine conversion according to a corresponding first residue signal and a corresponding second residue signal to generate a fine digital code. A sampling interval for sampling the input signal and a coarse conversion interval for performing the coarse conversion are determined based on a fine conversion interval for performing the fine conversion. The encoder circuit generates a digital output according to a corresponding coarse digital code and the fine digital code.

A time-interleaved analog to digital converter includes coarse converter circuitries, a control logic circuit, first and second transfer circuits, a fine converter circuitry, and an encoder circuit. The coarse converter circuitries sequentially sample an input signal and perform coarse conversions to generate decision signals. The control logic circuit generates coarse digital codes according to the decision signals. The first and second transfer circuits respectively transfer first and second residue signals. The fine converter circuitry performs a fine conversion according to a corresponding first residue signal and a corresponding second residue signal to generate a fine digital code. A sampling interval for sampling the input signal and a coarse conversion interval for performing the coarse conversion are determined based on a fine conversion interval for performing the fine conversion. The encoder circuit generates a digital output according to a corresponding coarse digital code and the fine digital code.

An N-channel interleaved Analog-to-Digital Converter (ADC) has a variable delay added to each ADC's input sampling clock. The variable delays are each programmed by a Successive-Approximation-Register (SAR) during calibration to minimize timing skews between channels. Each channel receives a sampling clock with a different phase delay. The sampling clocks are overlapping multi-phase clocks rather than non-overlapping. Overlapping the multi-phase clocks allows the sampling pulse width to be enlarged, providing more time for the sampling switch to remain open and allow analog voltages to equalize through the sampling switch. Higher sampling-clock frequencies are possible than when non-overlapping clocks are used. The sampling clock is boosted in voltage by a bootstrap driver to increase the gate voltage on the sampling switch, reducing the ON resistance. Sampling clock and component timing skews are reduced to one LSB among all N channels.

An N-channel interleaved Analog-to-Digital Converter (ADC) has a variable delay added to each ADC's input sampling clock. The variable delays are each programmed by a Successive-Approximation-Register (SAR) during calibration to minimize timing skews between channels. In each channel the ADC output is filtered, and a product derivative correlator generates a product derivative factor for correlation to two adjacent ADC channels. A matrix processor arranges the product derivative factors from the product derivative correlators into a matrix that is multiplied by a correlation matrix. The correlation matrix is a constant generated from an N×N shift matrix. The matrix processor outputs a sign-bit vector. Each bit in the sign-bit vector determines when tested SAR bits are set or cleared to adjust a channel's variable delay. Sampling clock and component timing skews are reduced to one LSB among all N channels.