H03M1/502

Multibit per stage pipelined time-to-digital converter (TDC)
10962933 · 2021-03-30 · ·

A multi-symbol per stage pipelined time-to-digital converter (TDC) is presented. The TDC includes a quantizer and a residue generator. The quantizer has an input to accept an analog input first time-differential signal comprising a binary level first edge separated from a binary level second edge by a first duration of time. The first time-differential signal is capable as being represented by m time intervals. The quantizer has an output to supply a first digital code representing Ceil(log.sub.2(m)) bit values responsive to (m1) time interval measurements. The first digital code is a time-to-digital conversion. For example, if the first time-differential signal is capable of being represented as a p-bit binary coded digital word, the quantizer outputs a first digital code representing the Ceil(log.sub.2(m)) most significant bit (MSB) values of the p-bit digital word.

Time to digital converter and A/D conversion circuit
10886934 · 2021-01-05 · ·

A time to digital converter includes a state transition section configured to start, based on a trigger signal, state transition in which an internal state transitions, a transition-state acquiring section configured to acquire, in synchronization with a reference signal, state information from the state transition section and hold the state information, and an arithmetic operation section configured to calculate, based on the state information, a time digital value corresponding to the number of times of transition of the internal state. The state transition section includes a tapped delay line to which a plurality of delay elements are coupled, a logic circuit, and a state machine. The state information is represented by count information output from the state machine and propagation information output from the tapped delay line. A hamming distance of the state information before and after the state transition is 1. A time from when the internal state transitions from a first internal state to a second internal state until when the internal state reverts to the first internal state is longer than a time interval for updating the state information held by the transition-state acquiring section.

A/D converter circuit
10862499 · 2020-12-08 · ·

An A/D converter circuit that converts analog information to numerical data is provided with a pulse delay circuit and an output unit. A sampling period is set so that a relationship between the sampling period and a circulation period of a pulse signal passing through a ring delay circuit satisfies a relational expression Trdln<Ts Trdl(n+1). In the relational expression, Ts is the sampling period, Trdl is the circulation period in which the pulse signal circulates through the pulse delay circuit, and n is an integer equal to or greater than 0.

A/D conversion circuit with shifted encode values
10840938 · 2020-11-17 · ·

An A/D conversion circuit converts an analog signal into numerical data. The A/D conversion circuit includes: a pulse delay circuit that includes an odd number of delay units connected in series, and inverting and delaying a pulse signal, and that changes the numeral number of the delay units which the pulse signal passes through in accordance with a value of the analog signal; latch circuits that synchronize the pulse signal with sampling clocks, and latch the pulse signal; encoders that set a position of the pulse signal to the numerical data by circulating encode values periodically set in order from an initial value to a final value to synchronously sample the encode values; subtractors that calculate each of differences between a previous value and a current value; and an adder that adds subtraction results. The encode values are set to be shifted between at least two encoders.

HIGH RESOLUTION TIME CAPTURE CIRCUIT AND CORRESPONDING DEVICE, CAPTURE METHOD AND COMPUTER PROGRAM PRODUCT
20200341505 · 2020-10-29 ·

A time capture circuit can measure time between edges of a logic input signal. A delay line generates consecutive increasingly delayed replicas of the logic input signal. A free running counter is clocked by a counter clock signal corresponding to an external clock signal multiplied by a clock scale factor. A counter value capture circuit captures the counter value upon occurrence of an edge in the input signal, outputs a captured counter value, and issues a trigger signal. A decoder determines a decoded value based on values of the input signal and of the plurality of consecutive increasingly replicas when the trigger signal is issued and computes a capture value as the difference of the captured counter value logical left shifted by a first scale factor and the decoded value logical right shifted by a second scale factor.

Time To Digital Converter And A/D Converstion Circuit
20200328755 · 2020-10-15 ·

A time to digital converter includes a state transition section configured to start, based on a trigger signal, state transition in which an internal state transitions, a transition-state acquiring section configured to acquire, in synchronization with a reference signal, state information from the state transition section and hold the state information, and an arithmetic operation section configured to calculate, based on the state information, a time digital value corresponding to the number of times of transition of the internal state. The state transition section includes a tapped delay line to which a plurality of delay elements are coupled, a logic circuit, and a state machine. The state information is represented by count information output from the state machine and propagation information output from the tapped delay line. A hamming distance of the state information before and after the state transition is 1. A time from when the internal state transitions from a first internal state to a second internal state until when the internal state reverts to the first internal state is longer than a time interval for updating the state information held by the transition-state acquiring section.

Digital average current-mode control voltage regulator and a method for tuning compensation coefficients thereof

A digital controller for controlling an average-current-mode voltage regulator with an output connected to a load. The controller comprises a digital voltage-sampling window Analog-to-Digital Converter (ADC), based on Delay-Lines (DLs) and configured to obtain a sample of a voltage error signal being the difference between the reference voltage and the output voltage, and to convert the voltage error signal from analog to digital representation; a digital current-sampling window ADC, based on DLs and configured to obtain a sample of the output current and to convert the current output from analog to digital representation; a digital compensator for voltage regulation, receiving as input the digital voltage error signal, configured to generate a current reference signal based thereupon; a digital compensator for current regulation, receiving as input the current error signal and the current reference signal, configured to generate a duty-ratio command signal based thereupon; and a digital hybrid High Resolution (HR) Digital Pulse Width Modulator (HR-DPWM) receiving as input the duty-ratio command signal and generating a pulse-width-modulated signal that is fed to the gates of the converter's transistors, to thereby control the current and voltage supplied to the load.

CONVERSION AND FOLDING CIRCUIT FOR DELAY-BASED ANALOG-TO-DIGITAL CONVERTER SYSTEM

An RF receiver including: an antenna cable of receiving an RF signal; a low noise amplifier coupled to the antenna and having an output; a bandpass filter coupled to the output of the low noise amplifier and having a voltage signal output, V.sub.IN; a conversion and folding circuit; and an analog-to-digital converter for converting the earlier-arriving or later-arriving delay signals into a digital code representing the voltage signal. The conversion and folding circuit having: a voltage-to-delay converter block, including preamplifiers, for converting the voltage signal into delay signals; and a folding block, including logic gates coupled to the preamplifiers, for selecting earlier-arriving and later-arriving ones of the delay signals; and

Time-to-digital converter

An apparatus is provided which comprises: a first clock line to provide a first clock; a second clock line to provide a second clock; a delay line having a plurality of delay cells, wherein the delay line is coupled to the first and second clock lines, wherein the first clock is to sample the second clock; and circuitry coupled to the delay line, wherein the circuitry is to determine first or latest edge transitions from the outputs of the plurality of delay cells.

Capaticance-to-digital converter

A capacitance-to-digital-converter includes a first delay block configured to output a first signal after a first delay based on a voltage at a capacitive sensor, the capacitive sensor configured to be iteratively discharged; a second delay block configured to output a second signal after a second delay; and a capacitance determination unit configured to determine a value indicative of a capacitance sensed by the capacitive sensor. This determination is based on: a number of clock periods during which the first delay is less than a third delay; a first time difference between receipt of the first signal and the second signal during a last clock period during which the first delay is less than the third delay; and a second time difference between receipt of the first signal and receipt of the second signal during a first clock period during which the first delay is greater than the third delay.