An imaging device includes a pixel array, a first converter, a second converter, a first ramp signal generation circuit that is disposed closer to the first converter than to the second converter and supplies a first ramp signal to the first converter and the second converter, a first connection line having one end connected to an output terminal of the first ramp signal generation circuit and including a portion extending away from an input terminal of the first converter in a path from the one end to the other end of the first connection line, and a second connection line having one end connected to the other end of the first connection line and the other end connected to the input terminal and including a portion extending closer to the input terminal in a path from the one end to the other end of the second connection line.

An integrated circuit for controlling a sensor chip capable of sensing various materials includes a plurality of amplifier clusters, a plurality of analog multiplexers, and at least one analog-to-digital converter coupled the analog multiplexers and configured to generate digital code values representative of electrical signals. Each of the amplifier clusters include four amplifiers, each amplifier has a first input coupled to a sensor of the sensor chip, and a second input coupled to a programmable voltage reference. Each one of the analog multiplexers is coupled to one of the amplifier clusters and configured to selectively pass through an electrical signal to the at least one analog-to-digital converter.

An integrating Analog-to-digital converter has a global counter that outputs a counter code signal including a multiphase signal. It also has a column circuit including: a ramp wave generation circuit outputting a ramp wave voltage; a comparator comparing the ramp wave voltage with a pixel voltage; and a latch circuit latching the counter code signal at output inversion timing of the comparator. An output value of the latch circuit is used as a digital conversion output value per the column circuit. The counter has a phase division circuit outputting, as an LSB of the digital conversion output value of the integrating analog-to-digital converter, a phase division signal to the latch circuit, the phase division signal dividing a phase of the counter code signal. The phase division circuit is arranged to a plurality of column circuits, and the LSB is shared by a plurality of phase division circuits.

Disclosed is a circuit which includes a first amplifier that generates a first output signal by comparing a ramp signal and a reset signal of a pixel signal output from a pixel array in a first operating period and comparing the ramp signal and an image signal of the pixel signal output from the pixel array in a second operating period, a second amplifier that generates a second output signal based on the first output signal, and a counter. During at least one operating period of the first operating period and the second operating period, the first output signal controls a first source current of the first amplifier, or the second output signal controls at least one of the first source current of the first amplifier and a second source current of the second amplifier.

Disclosed is a circuit which includes a first amplifier that generates a first output signal by comparing a ramp signal and a reset signal of a pixel signal output from a pixel array in a first operating period and comparing the ramp signal and an image signal of the pixel signal output from the pixel array in a second operating period, a second amplifier that generates a second output signal based on the first output signal, and a counter. During at least one operating period of the first operating period and the second operating period, the first output signal controls a first source current of the first amplifier, or the second output signal controls at least one of the first source current of the first amplifier and a second source current of the second amplifier.

A column analog-to-digital converter and the local counting method is provided. The column analog-to-digital converter includes a plurality of analog-to-digital converters in parallel. Each of the analog-to-digital converters includes a comparator and a counting circuit. The comparator compares the ramp voltage with one of the plurality of column signals to generate a comparator output signal. The counting circuit generates a local clock by means of a voltage-controlled oscillator of the counting circuit according to the base clock and the comparator output signal, counts the base clock and the local clock respectively to generate a first counting output and a second counting output, and combines the first counting output with the second counting output to generate the counting output.

There is provided an imaging device including a pixel array section including pixel units two-dimensionally arranged in a matrix pattern, each pixel unit including a photoelectric converter, and a plurality of column signal lines disposed according to a first column of the pixel units. The imaging device further includes an analog to digital converter that is shared by the plurality of column signal lines.

The present technology relates to a comparator that can easily modify operating point potential of the comparator, and an imaging device. A pixel signal output from a pixel, and, a reference signal with changeable voltage are input to a differential pair. A current mirror connected to the differential pair, and a voltage drop mechanism allowed to cause a predetermined voltage drop is connected between a transistor that configures the differential pair, and a transistor that configures the current mirror. A switch is connected in parallel to the voltage drop mechanism. The present technology can be applied, for example, to an image sensor that captures an image.

A self-calibration-function-equipped AD converter that does not require a measurement device for calibration includes: a control unit including a calibration control unit configured to control an operation of calibrating the self-calibration-function-equipped AD converter, and a conversion control unit configured to control an operation of converting an input voltage to be subjected to conversion into a digital signal; a reference voltage unit configured to output a reference voltage; and an integration/conversion unit including an integrating unit configured to generate an integration voltage obtained by integrating two or more types of unit voltages, a comparator that has two inputs and is configured to compare the integration voltage and the input voltage or the reference voltage, and a crossbar switch configured to switch a connection depending on whether the integration voltage is to be input to one input of the comparator and the input voltage or the reference voltage is to be input to another input, or the input voltage or the reference voltage is to be input to the one input of the comparator and the integration voltage is to be input to the other input.

An image sensor includes a pixel array including first pixels and second pixels, each of the first and second pixels including photodiodes, a sampling circuit detecting a reset voltage and a pixel voltage from the first and second pixels and generating an analog signal, an analog-to-digital converter image data from the analog signal, and a signal processing circuit generating an image using the image data. Each of the first pixels includes a first conductivity-type well separating the photodiodes and having impurities of a first conductivity-type. The photodiodes have impurities of a second conductivity-type different from the first conductivity-type. Each of the second pixels includes a second conductivity-type well separating the photodiodes and having impurities of the second conductivity-type different from the first conductivity-type. A potential level of the second conductivity-type well is higher than a potential level of the first conductivity-type well.