A correction method and a correction circuit for a sigma-delta modulator (SDM) are provided. The SDM includes a loop filter, a quantizer, and a digital-to-analog converter (DAC). The correction method includes: generating a test signal for a frequency to be tested; inputting the test signal to a feedforward circuit that includes at least one adjustable impedance circuit, the test signal being inputted to the SDM through the impedance circuit; calculating an output signal of the SDM to obtain a value of a signal transfer function (STF) of the SDM at the frequency to be tested; and adjusting the impedance circuit.

A correction method and a correction circuit for a sigma-delta modulator (SDM) are provided. The SDM includes a loop filter, a quantizer, and a digital-to-analog converter (DAC). The correction method includes: generating a test signal for a frequency to be tested; inputting the test signal to a feedforward circuit that includes at least one adjustable impedance circuit, the test signal being inputted to the SDM through the impedance circuit; calculating an output signal of the SDM to obtain a value of a signal transfer function (STF) of the SDM at the frequency to be tested; and adjusting the impedance circuit.

A calibration circuit, including: a signal generator circuit configured to generate a modulated analog input signal, which is based on a digital input word that is modulated; an Analog-to-Digital Converter (ADC) configured to convert an analog reference signal to a digital calibration word, wherein the analog reference signal is a low-pass-filtered version of the analog input signal generated by the signal generator circuit; and a feedback circuit configured to output the digital input word by adjusting the digital calibration word depending on a digital feedback signal, which is based on a modulated version of the analog reference signal, wherein the signal generator circuit, the ADC, and the feedback circuit are provided on a same chip.

There are provided a signal generation unit that generates a predetermined digital signal, a level conversion unit that converts a level of the digital signal generated by the signal generation unit, a DA converter that converts the digital signal of which the level is converted by the level conversion unit into an analog signal in a predetermined intermediate frequency bandwidth, and a control unit that creates correction data for correcting a linearity of a level of an output signal of the DA converter for all frequencies to be used, based on actual data which is data of a level of an actual output signal when a setting of the level of the output signal of the DA converter is changed at a predetermined level interval, at a predetermined frequency, and converts a level of an input signal of the DA converter with the correction data.

Described is an apparatus which comprises: a first integrator to receive an input signal and to generate a first output; a second integrator to receive the first output or a version of the first output and to generate a second output; and an analog-to-digital converter (ADC) to quantize the second output into a digital representation, the ADC including a detection circuit to detect an overload condition in the second output.

System and methods for input path matching in pipelined continuous-time Analog-to Digital Converters (ADCs), including pipelined Continuous-Time Delta Sigma Modulator (CTDSM) based ADCs, includes an input delay circuit disposed in a continuous-time input path from an input of an analog input signal to a first summing circuit of the continuous-time ADC. At least one digital delay line is disposed between an output of an earlier stage sub-ADC (of a plurality of pipelined sub-ADCs) and a sub-digital-to-analog converter (DAC) that is coupled to the first summing circuit, and between the earlier stage sub-ADC and a digital noise cancellation filter. The digital delay line(s) is configured to enable calibration of delay of output of the earlier stage sub-ADC provided to the sub-DAC and the digital noise cancellation filter in accordance with process variations of the input delay match circuit to minimize residue output at first summing circuit.

Described is an apparatus which comprises: a first integrator to receive an input signal and to generate a first output; a second integrator to receive the first output or a version of the first output and to generate a second output; and an analog-to-digital converter (ADC) to quantize the second output into a digital representation, the ADC including a detection circuit to detect an overload condition in the second output.

Described is an apparatus which comprises: a first integrator to receive an input signal and to generate a first output; a second integrator to receive the first output or a version of the first output and to generate a second output; and an analog-to-digital converter (ADC) to quantize the second output into a digital representation, the ADC including a detection circuit to detect an overload condition in the second output.

Some embodiments include apparatus and methods using an integrator in a loop filter of a sigma-delta analog-to-digital converter (ADC), a digital-to-analog converter (DAC) located on a feedback path of the ADC, the DAC including output nodes coupled to input nodes of the integrator, and a comparator including input nodes to receive signals from output nodes of the integrator, and an output node to provide information during calibration of the DAC.

System and methods for input path matching in pipelined continuous-time Analog-to Digital Converters (ADCs), including pipelined Continuous-Time Delta Sigma Modulator (CTDSM) based ADCs, includes an input delay circuit disposed in a continuous-time input path from an input of an analog input signal to a first summing circuit of the continuous-time ADC. At least one digital delay line is disposed between an output of an earlier stage sub-ADC (of a plurality of pipelined sub-ADCs) and a sub-digital-to-analog converter (DAC) that is coupled to the first summing circuit, and between the earlier stage sub-ADC and a digital noise cancellation filter. The digital delay line(s) is configured to enable calibration of delay of output of the earlier stage sub-ADC provided to the sub-DAC and the digital noise cancellation filter in accordance with process variations of the input delay match circuit to minimize residue output at first summing circuit.