Some or all of a comparator circuit of an analog-to-digital converter (ADC) circuit can be efficiently repurposed or reused for residue amplification for efficient noise-shaping, e.g., in a noise-shaping feedback configuration. A preamplifier portion of a comparator circuit in an oversampling ADC can be re-purposed to provide an amplifier to amplify or otherwise modify a residue left after the bit trials of a conversion cycle. The amplified or modified residue can then be used elsewhere, for example, for noise-shaping by applying a noise transfer function (NTF), a result of which can then be fed back (e.g., summed with the next sampled input at an input of the comparator circuit for use in the N bit trials of the next ADC cycle).

The present invention relates to a successive approximation register (SAR)-type analog-digital converter (ADC), which can amplify a residual voltage without a non-linearity problem caused by an output voltage of a residual voltage amplifier, thereby performing high-resolution analog-digital conversion at low power consumption. The SAR-type ADC may include: a coarse/fine SAR conversion unit configured to receive an analog input voltage and convert the received voltage into an MSB digital signal in a coarse SAR conversion mode, and receive a feedback voltage and convert the received voltage into an LSB digital signal in a fine SAR conversion mode; and a residue integration unit configured to repeatedly amplify a residual voltage with a predetermined gain by a predetermined number of times and output the amplified voltage as a final target multiple, the residual voltage corresponding to a voltage difference between the analog input voltage and an analog voltage obtained by converting the digital signal into an analog signal.

The present invention relates to a successive approximation register (SAR)-type analog-digital converter (ADC), which can amplify a residual voltage without a non-linearity problem caused by an output voltage of a residual voltage amplifier, thereby performing high-resolution analog-digital conversion at low power consumption.

The SAR-type ADC may include: a coarse/fine SAR conversion unit configured to receive an analog input voltage and convert the received voltage into an MSB digital signal in a coarse SAR conversion mode, and receive a feedback voltage and convert the received voltage into an LSB digital signal in a fine SAR conversion mode; and a residue integration unit configured to repeatedly amplify a residual voltage with a predetermined gain by a predetermined number of times and output the amplified voltage as a final target multiple, the residual voltage corresponding to a voltage difference between the analog input voltage and an analog voltage obtained by converting the digital signal into an analog signal.

An A/D converter includes: an integrator circuit executing modulation to an analog signal to be converted; an adder outputting an addition result of at least an output signal of the integrator circuit and a first reference signal as a reference signal of modulation; a quantizer receives an output signal of the integrator circuit, an output signal of the adder, and a second reference signal as a reference signal in cyclic A/D conversion to generate a result of quantization of the output signal of the integrator circuit and the output signal of the adder; and a controller is configured to switch between a modulation mode and a cyclic mode.

An integrated circuit includes a continuous time delta sigma analog-to-digital converter (CTDS ADC) and a test circuit for testing the CTDS ADC. The test circuit converts multibit digital reference data to a single-bit digital stream. The test circuit then passes the single-bit digital stream to a finite impulse response digital-to-analog converter (FIR DAC). The FIR DAC converts the single-bit digital stream to an analog test signal. The analog test signal is then passed to the CTDS ADC. The CTDS ADC converts the analog test signal to digital test data. The test circuit analyzes the digital test data to determine the accuracy of the CTDS ADC.

Superconductor analog-to-digital converters (ADC) offer high sensitivity and large dynamic range. One approach to increasing the dynamic range further is with a subranging architecture, whereby the output of a coarse ADC is converted back to analog and subtracted from the input signal, and the residue signal fed to a fine ADC for generation of additional significant bits. This also requires a high-gain broadband linear amplifier, which is not generally available within superconductor technology. In a preferred embodiment, a distributed digital fluxon amplifier is presented, which also integrates the functions of integration, filtering, and flux subtraction. A subranging ADC design provides two ADCs connected with the fluxon amplifier and subtractor circuitry that would provide a dynamic range extension by about 30-35 dB.

The present disclosure provides a converting module formed in a first die. The first die is coupled to a bus having a bus bit width. The converting module includes an analog-to-digital converter, configured to generate a first digital signal having a first bit width different from the bus bit width; and a sigma-delta modulator, coupled to the analog-to-digital converter, and configured to generate a second digital signal according to the first digital signal. The second digital signal has a bit width equal to the bus bit width. The sigma-delta modulator includes a filter and a quantizer. The number of bits outputted by the quantizer is equal to the bus bit width.

An analog-to-digital converter includes a primary converter and a secondary converter. The primary converter executes conversion processing to convert an analog input signal to a first digital signal through delta-sigma modulation. The secondary converter outputs a second digital signal by converting amplified analog output of a quantization error in the primary converter to the second digital signal.

Some or all of a comparator circuit of an analog-to-digital converter (ADC) circuit can be efficiently repurposed or reused for residue amplification for efficient noise-shaping, e.g., in a noise-shaping feedback configuration. A preamplifier portion of a comparator circuit in an oversampling ADC can be re-purposed to provide an amplifier to amplify or otherwise modify a residue left after the bit trials of a conversion cycle. The amplified or modified residue can then be used elsewhere, for example, for noise-shaping by applying a noise transfer function (NTF), a result of which can then be fed back (e.g., summed with the next sampled input at an input of the comparator circuit for use in the N bit trials of the next ADC cycle).

A control system for an analog to digital converter (ADC) including a programmable configuration memory, a trigger selector, an input selector, and a conversion controller. The ADC is configurable for adjusting multiple operating parameters including speed and accuracy. The programmable configuration memory stores at least one configuration variable and an input value. The trigger selector enables at least one trigger input. The input selector selects from among multiple analog inputs according to the programmed input value. The conversion controller configures the ADC using the configuration variable, interfaces the input selector to provide an analog input to the ADC, and interfaces the trigger selector to prompt the ADC to perform a conversion process to provide a digital output sample in response to the enabled trigger input. Multiple entries may be stored, each selecting different analog inputs and corresponding configuration variables, in which the conversion controller dynamically reconfigures the ADC between conversions.