A single-ended to differential circuit is presented. The circuit may be a single-ended to differential integrator or a single-ended to differential amplifier. The circuit determines a first output and a second output voltage based on an input voltage, first and second reference voltages. The circuit has a first, a second and a third input memory element. The circuit in a first phase, samples a voltage indicative of the input voltage on the first input memory element. The circuit in the first phase, samples a voltage indicative of the first reference voltage on the second input memory element. The circuit in the first phase, samples a voltage indicative of the second reference voltage on the third input memory element. The circuit, in a second phase, determines the first and second output voltage based on the sampled voltages on the first, second, and third input memory elements.

An amplifier includes an input circuit configured to receive an analog input signal and a feedback signal, and output an analog error signal based on the analog input signal and the feedback signal. An ADC is configured to convert the analog error signal into a digital signal in a phase domain. A digital control circuit is configured to generate a digital control signal based on the digital signal in the phase domain. An output circuit is configured to generate an amplified output signal based on the digital control signal, and a feedback circuit is configured generate the feedback signal based on the amplified output signal.

Disclosed are a system and a battery management integration circuit using an incremental analog-to-digital converter (ADC), which can reduce the consumption of the amount of a bias current. The system includes an incremental ADC configured to perform accumulation on an analog signal during an oversampling period and a bias current generator configured to provide a bias current for the accumulation of the incremental ADC. The bias current generator provides a first amount of the bias current in a first period defined from start timing of oversampling to preset timing during the oversampling period, and provides a second amount of the bias current, smaller than the first amount of the bias current, in a second period subsequent to the first period.

A delta-sigma modulator generates a bitstream signal from a differential input signal including a first input signal and a second input signal by repeating a first operation and a second operation alternately. The delta-sigma modulator includes a first sampling capacitor, a second sampling capacitor, a third sampling capacitor, a fourth sampling capacitor, an operational amplifier, a first feedback capacitor, a second feedback capacitor, and a quantizer.

According to one embodiment, a semiconductor integrated circuit 1 includes a sample and hold circuit and a clock generation circuit. The sample and hold circuit has a device with a first withstand voltage and a device with a second withstand voltage that is higher than the first withstand voltage. The clock generation circuit generates a first clock signal to be supplied to the first withstand voltage device and generates a second clock signal to be supplied to the second withstand voltage device based on the first clock signal. The clock generation circuit has a delay adjustment circuit that performs adjustment to delay the second clock signal and bring a phase of the second clock signal close to a phase of the first clock signal in the generation of the second clock signal.

An analog-to-digital converter (ADC) is provided. The ADC receives an analog input signal and generates a digital code. The ADC includes a sigma-delta modulator (SDM), a decimation filter and a detection circuit. The SDM includes a loop filter, a quantizer and a digital-to-analog converter (DAC). The loop filter receives the analog input signal. The quantizer is coupled to the loop filter and quantizes an output of the loop filter to generate a digital output signal. The DAC is coupled to the quantizer and the loop filter. The decimation filter is coupled to the SDM and converts the digital output signal into the digital code. The detection circuit is coupled to the SDM and detects a node voltage of the SDM and generate a control signal. The control signal is utilized to control the loop filter, the quantizer, a feedback path of the SDM and/or a feedforward path of the SDM.

According to one embodiment, a semiconductor integrated circuit 1 includes a sample and hold circuit and a clock generation circuit. The sample and hold circuit has a device with a first withstand voltage and a device with a second withstand voltage that is higher than the first withstand voltage. The clock generation circuit generates a first clock signal to be supplied to the first withstand voltage device and generates a second clock signal to be supplied to the second withstand voltage device based on the first clock signal. The clock generation circuit has a delay adjustment circuit that performs adjustment to delay the second clock signal and bring a phase of the second clock signal close to a phase of the first clock signal in the generation of the second clock signal.

Described herein are apparatus and methods for low speed characterization of a high-speed signal. A circuit includes a sub-sampling circuit configured to sub-sample a high-speed signal received from a device, a reconstruction loop circuit configured to reconstruct a low-speed signal from the sub-sampled high-speed signal, a low pass filter configured to filter the reconstructed low-speed signal, a discrete time low pass filter configured to mitigate skew rate requirements of the filtered low-speed signal for a digitization circuit, a continuous time low pass filter configured to smooth the skew rate mitigated low-speed signal and the digitization circuit is configured to generate a digital representation of the smoothed low-speed signal for characterization by a characterization device, and shape a noise associated with the smoothed low-speed signal outside a frequency range of interest of the smoothed low-speed signal.

Methods and devices to mitigate time varying impairments in sensors are described. The application of such methods and devices to pressure sensors facing time varying parasitic capacitances due to water droplets is detailed. Benefits of auto-zeroing technique as adopted in disclosed devices is also described.

A delta-sigma modulator generates a bitstream signal from a differential input signal including a first input signal and a second input signal by repeating a first operation and a second operation alternately. The delta-sigma modulator includes a first sampling capacitor, a second sampling capacitor, a third sampling capacitor, a fourth sampling capacitor, an operational amplifier, a first feedback capacitor, a second feedback capacitor, and a quantizer.