H04B10/0731

Method and apparatus for alignment of a line-of-sight communications link
10374705 · 2019-08-06 · ·

Techniques are disclosed for aligning a first optical scope with a second optical scope to achieve a line-of-sight communication link between the two optical scopes. In an example embodiment, each scope can include an optical transceiver and camera. The optical transceiver in the first optical scope can include a light array that is used to emit a bright pulse of light as a flash. The camera in the second optical scope captures this flash in a camera image. The camera image can then be processed to spatially localize the flash relative to a central region of a photodetector array in the optical transceiver of the second optical scope. A control system can then drive a positioning system for the second optical scope to adjust the second optical scope's positioning so that the second optical scope photodetector array's central region aligns with the spatially localized flash.

SINGLE-SHOT NETWORK ANALYZER (SINA)

Apparatus and/or method for performing single-shot network analysis of electrical, electronic and electro-optical elements (e.g., components, circuits, modules, sub-systems and/or systems) on a device, or devices, under test (DUT). A pulsed optical source is directed through a first dispersion element to an modulator, while a delayed version of the pulsed optical source is directed to the DUT (pulsed optical source converted to electrical signal if DUT has electrical input), whose electrical output is fed to the modulator whose modulated optical pulse output is stretched through a second optical dispersion element, then converted to an electrical signal and processed to provide analysis and/or display of DUT response.

Optical Fiber Test Apparatus with Combined Light Measurement and Fault Detection
20190219479 · 2019-07-18 ·

An optical fiber test apparatus includes an optical power meter operable to detect light at a predetermined wavelength, and a laser source operable to generate a visible laser beam. The optical fiber test apparatus further includes an optical fiber extending between a first end and a second end, and a diplexer which includes a first optical connector and is coupled to the optical power meter, the laser source, and the first end of the optical fiber. The optical fiber test apparatus further includes a second optical connector coupled to the second end of the optical fiber and including a test port. The diplexer is operable to transmit light at the predetermined wavelength from the second optical connector to the optical power meter and transmit the visible laser beam from the laser source to the second optical connector.

Electrical interface module

This disclosure provides an electrical interface module including a signal processor, a switch, and a connection component, wherein the signal processor includes a first interface, a second interface, and a third interface; the first interface and the second interface of the signal processor are connected with the connection component through the switch, and configured to output differential signals; the third interface of the signal processor is connected with the switch, and configured to output an enable signal; and the switch is configured to be controlled by the enable signal to be closed so that the differential signals are output through the connection component.

Method and system for optical vector analysis based on double-sideband modulation

An apparatus comprises an optical signal generator configured to provide a first radiation comprising a first nominal carrier frequency and a second nominal carrier frequency, and provide a second radiation comprising a third nominal carrier frequency and a fourth nominal carrier frequency; an optical to electrical converter coupled to the optical signal generator and configured to: generate a first electrical current based on the first radiation and the second radiation without the second radiation passing through the Device under Test (DUT); and generate a second electrical current based on the first radiation and the second radiation after the second radiation passes through the DUT; and a data processor configured to determine a transfer function of the DUT at the third nominal carrier frequency and the fourth nominal carrier frequency based on the first electrical current and the second electrical current.

Single-end optical fiber transfer matrix measurement using spatial pilot

Various embodiments relate to a method including: coupling one or more optical spatial pilot signals into a first end of optical fiber, wherein the optical fiber is a multimode optical fiber; Reflecting and modifying each mode of the optical pilot signals at a second end of the optical fiber; receiving a reflected portion of the one or more optical spatial pilot signals at the first end of the of the optical fiber in response to the reflected portion having propagated through the optical fiber in both directions; processing the reflected spatial pilot to determine components of one of a round-trip transfer matrix of the optical fiber and a single-direction transfer matrix of the optical fiber.

Method And System For Connectionless Integrated Optical Receiver and Transmitter Test
20190199436 · 2019-06-27 ·

Methods and systems for a connectionless integrated optical receiver and transmitter test are disclosed and may include an optoelectronic transceiver comprising a transmit (Tx) path and a receive (Rx) path, with each path comprising optical switches. The transceiver may be operable to: generate a first modulated optical signal utilizing a modulator in the Tx path, couple the first modulated optical signal to a first optical switch in the Rx path via a second optical switch in the Tx path when the optoelectronic transceiver is configured in a self-test mode, receive a second modulated optical signal via a grating coupler in the Rx path when the optoelectronics transceiver is configured in an operational mode, and communicate the second modulated optical signal to a photodetector in the Rx path via the first optical switch. The first modulated optical signal may be communicated to a grating coupler in the Tx path via the second optical switch.

TEST INSTRUMENT FOR TESTING DEVICES INTERNALLY PERFORMING SIGNAL CONVERSIONS
20190190750 · 2019-06-20 · ·

A test instrument measures performance of a transponder without direct access to a line interface of the transponder. The test instrument learns parameters of internal signal conversion processes of the transponder and measures performance of the transponder based on the learned parameters.

COHERENT OPTICAL RECEIVER TESTING
20190190616 · 2019-06-20 ·

An heterodyne apparatus and method for measuring performance parameters of a coherent optical receiver at RF frequencies is disclosed. Two coherent lights are launched into signal and LO ports of the receiver with an optical frequency offset f. One of the lights is modulated in amplitude at a test modulation frequency F. COR performance parameters are determined by comparing two frequency components of the COR output. CMRR is determined based on a strength of a direct detection spectral line at the modulation frequency relative to that of spectrally-shifted lines at (Ff). GDV information is obtained by modulating one of the lights at two phase-locked frequencies, such as F and 2F, and comparing phases of two time-domain traces corresponding to frequency components of the COR output signal at the two frequencies.

Method and System for Optical Vector Analysis Based on Double-Sideband Modulation
20190190614 · 2019-06-20 ·

An apparatus comprises an optical signal generator configured to provide a first radiation comprising a first nominal carrier frequency and a second nominal carrier frequency, and provide a second radiation comprising a third nominal carrier frequency and a fourth nominal carrier frequency; an optical to electrical converter coupled to the optical signal generator and configured to: generate a first electrical current based on the first radiation and the second radiation without the second radiation passing through the Device under Test (DUT); and generate a second electrical current based on the first radiation and the second radiation after the second radiation passes through the DUT; and a data processor configured to determine a transfer function of the DUT at the third nominal carrier frequency and the fourth nominal carrier frequency based on the first electrical current and the second electrical current.