A control apparatus for registering a connection state between component devices constituting a distributed optical transmission apparatus in a database includes: a device setting unit which performs setting such that light is output from a component device that is a connection source; and a registration processing unit which acquires a light reception level of each port in each component device on a side receiving the light, identifies a port having a light reception level higher than light reception levels of other ports, and registers a component device having the identified port and the identified port in the database as a connection destination of the component device that is the connection source.

The technology generally relates to determining a status of an optical channel between two components. For example, the components may be connected via an optical link including a plurality of optical channels. A first portion of the optical channels may be in use such that a second portion of the optical channels may be redundant channels. The component may include a test generator that transmits and receives a data pattern over each channel. The test generator may determine, based on the received data pattern, a status of each of the channels. If the status of a given channel is a failure status, the component may divert data for the given channel to a redundant channel.

An optical device with an optical transmitter circuit and an optical receiver circuit integrated on a substrate has at least one of a first oblique waveguide extending obliquely with respect to an edge of the substrate at or near an incident port for introducing a light emitted from a light source to the optical device, a second oblique waveguide extending obliquely with respect to the edge of the substrate at or near a signal receiving port optically connected to the optical receiver circuit, and a third oblique waveguide extending obliquely with respect to the edge of the substrate at or near a signal transmission port optically connected to the optical transmitter circuit.

An electronic device obtains, from a first optical device, a first performance parameter indicative of a detection performance of a first detection model on the first optical device and a second performance parameter indicative of a detection performance of a second detection model on the first optical device. The electronic device obtains, from a second optical device, a third performance parameter indicative of a detection performance of the first detection model on the second optical device and a fourth performance parameter indicative of a detection performance of the second detection model on the second optical device. The electronic device assigns, based on the first performance parameter, the second performance parameter, the third performance parameter, and the fourth performance parameter, the first detection model to the first optical device or the second optical device and the second detection model to the first optical device or the second optical device.

Architectures and techniques are presented that improve or enhance a network planning procedure such as by selecting a more efficient test buffer that is used to identify objects that might intersect a Fresnel zone between two transceivers. An improved test buffer (e.g., buffer region) can be one that is constructed from a plurality of rectangles situated along a line of sight of the two transceivers and that are oriented according to cardinal directions.

A method to determine the types of optical fibers forming a link of an optical communication network. By scanning a signal's bit error rate at a receiver end, as a function of a pre-dispersion applied to a signal at a transmitter end, local minimums in the curve indicate the presence of amplifiers, and therefore fiber span extremities. By determining the accumulated dispersion at each fiber extremity, a ratio of dispersion per span length can be obtained and the span's coefficient of chromatic dispersion be inferred, thereby identifying the type of fiber. Alternatively, a signal's signal-to-noise ratio can be scanned, instead of its bit error rate. In a typical network, the required instrumentation is pre-existing.

Methods for estimating the Effective Modal Bandwidth (EMB) of laser optimized Multimode Fiber (MMF) at a specified wavelength, λ.sub.S, based on the measured EMB at a first reference measurement wavelength, λ.sub.M. In these methods the Differential Mode Delay (DMD) of a MMF is measured and the Effective Modal Bandwidth (EMB) is computed at a first measurement wavelength. By extracting signal features such as centroids, peak power, pulse widths, and skews, as described in this disclosure, the EMB can be estimated at a second specified wavelength with different degrees of accuracy. The first method estimates the EMB at the second specified wavelength based on measurements at the reference wavelength. The second method predicts if the EMB at the second specified wavelength is equal or greater than a specified bandwidth limit.

An optical system includes a transmitter including transmitter circuitry configured to cause transmission of a transmitted optical signal over a fiber link on an X polarization and a Y polarization; and a receiver including receiver circuitry configured to receive a received optical signal from the fiber link on the X polarization and the Y polarization, wherein the transmitter circuitry is configured to cause State of Polarization (SOP) changes on the X polarization and the Y polarization for a test of the fiber link. The transmitter circuitry and the receiver circuitry are built-in with the transmitter and the receiver, respectively, for performance of the test.

System and methods of measuring nonlinear interference (NLI) on a per-span basis in an optical system with a plurality of spans are provided. The method includes steps of varying power based on phase sensitive detection method on a span under test of the plurality of spans; observing total noise, at an optical receiver, from all of the plurality of spans; and isolating noise for the span under test from the total noise based on the varying power. The optical system can be in-service with one or more traffic-carrying channels, and the varying power is small enough on the span under test which does not impact the one or more traffic-carrying channels.

A semiconductor wafer includes a semiconductor chip that includes a photonic device. The semiconductor chip includes an optical fiber attachment region in which an optical fiber alignment structure is to be fabricated. The optical fiber alignment structure is not yet fabricated in the optical fiber attachment region. The semiconductor chip includes an in-plane fiber-to-chip optical coupler positioned at an edge of the optical fiber attachment region. The in-plane fiber-to-chip optical coupler is optically connected to the photonic device. A sacrificial optical structure is optically coupled to the in-plane fiber-to-chip optical coupler. The sacrificial optical structure includes an out-of-plane optical coupler configured to receive input light from a light source external to the semiconductor chip. At least a portion of the sacrificial optical structure extends through the optical fiber attachment region.