Methods for determining calibration parameters to correct for frequency responses of one or more dielectric waveguides coupling a control unit to a first antenna node or to a series of antenna nodes that includes the first antenna node. An example method comprises transmitting, via a first dielectric waveguide coupling the control unit to the first antenna node, a radiofrequency (RF) test signal having a signal bandwidth covering a bandwidth of interest. The method further comprises receiving, via a second dielectric waveguide coupling the control unit to the first antenna node, a looped-back version of the transmitted RF test signal, and estimating a first one-way frequency response corresponding to the first (or second) dielectric waveguide, based on the RF test signal and the received loop-back version of the transmitted RF test signal.

Methods for determining calibration parameters to correct for frequency responses of one or more dielectric waveguides coupling a control unit to a first antenna node or to a series of antenna nodes that includes the first antenna node. An example method comprises transmitting, via a first dielectric waveguide coupling the control unit to the first antenna node, a radiofrequency (RF) test signal having a signal bandwidth covering a bandwidth of interest. The method further comprises receiving, via a second dielectric waveguide coupling the control unit to the first antenna node, a looped-back version of the transmitted RF test signal, and estimating a first one-way frequency response corresponding to the first (or second) dielectric waveguide, based on the RF test signal and the received loop-back version of the transmitted RF test signal.

Automatic synchronization of a magnetic field transmitter and receiver is performed to resolve phase ambiguity so that phase information, used in determining the position and orientation of the receiver, may be derived and maintained. Inertial measurement unit (IMU) information is used to infer gravity-relative orientations of the transmitter and receiver, which are then used as constraints in the synchronization process to determine the position and orientation of the receiver from all four possible solutions or variations. The variation that best conforms to the MU orientations is chosen as the sync candidate.

A system for providing efficient, reliable, and accurate calibration and measurements of a satellite communication (SATCOM) test system, especially in E-band frequencies where precision of measurement and calibration plays a large role in reliable communications at terabit data rates. The system may include a vector network analyzer (VNA), at 67 GHz operation, calibrated using SOLT-type calibrations. The vector network analyzer (VNA) may be communicatively coupled to a device under test (DUT) or system under test (SUT) to obtain calibration and measurement data. The system may also include a signal generator for generating at least one signal. The system may further include an active mixer communicatively coupled to the signal generator. The active mixer may up-convert the least one signal to E-band frequencies. In some examples, the vector network analyzer (VNA), the local oscillator (LO) signal generator, and the active mixer may be synchronized or phase-locked using a reference.

A system for providing efficient, reliable, and accurate calibration and measurements of a satellite communication (SATCOM) test system, especially in E-band frequencies where precision of measurement and calibration plays a large role in reliable communications at terabit data rates. The system may include a vector network analyzer (VNA), at 67 GHz operation, calibrated using SOLT-type calibrations. The vector network analyzer (VNA) may be communicatively coupled to a device under test (DUT) or system under test (SUT) to obtain calibration and measurement data. The system may also include a signal generator for generating at least one signal. The system may further include an active mixer communicatively coupled to the signal generator. The active mixer may up-convert the least one signal to E-band frequencies. In some examples, the vector network analyzer (VNA), the local oscillator (LO) signal generator, and the active mixer may be synchronized or phase-locked using a reference.

A test apparatus and method for testing a semiconductor device. The semiconductor device includes an integrated circuit and a plurality of external radiating elements located at a surface of the device. The external radiating elements include at least one transmit element and receive element. The test apparatus includes a plunger. The plunger includes a dielectric portion having a surface for placing against the surface of the device. The plunger also includes at least one waveguide. Each waveguide extends through the plunger for routing electromagnetic radiation transmitted by one of the transmit elements of the device to one of the receive elements of the device. Each waveguide comprises a plurality of waveguide openings for coupling electromagnetically to corresponding radiating elements of the device. The dielectric portion is configured to provide a matched interface for the electromagnetic coupling of the waveguide openings to the plurality of external radiating elements of the device.

Systems and methods are provided for phased array passband calibration, which permits repeated calibration of the antenna system in the field without a moving far field sensor. An implementation includes an equalization filter coupled to a phased array feed; a calibration probe disposed to couple with an antenna array to transfer radio frequency (RF) energy; a database of probe-to-far-field (FF) transforms having a probe-to-FF transform for each of a plurality of incidence angles; a calibration component operable to: receive calibration probe measurements for a plurality of frequencies; and determine a calculated phased array passband response for at least a first incidence angle, based at least on the calibration probe measurements and a probe-to-FF transform for the first incidence angle; and a filter generation component operable to generate a tuning configuration for the equalization filter, based at least on the calculated phased array passband response.

A user equipment (UE) configured to perform self-calibration. The UE includes a first radio configured to perform implicit beamforming and further configured to transmit and receive signals during the calibration procedure. The UE further includes a first plurality of antennas communicatively coupled to the first radio, a second radio configured to transmit and receive signals during the calibration procedure and at least one second antenna communicatively coupled to the second radio. The calibration procedure includes the second radio transmitting a tone signal over the calibration frequency and a first antenna of the first radio receiving the tone signal and a second antenna of the first radio receiving the tone signal.

A user equipment (UE) configured to perform self-calibration. The UE includes a first radio configured to perform implicit beamforming and further configured to transmit and receive signals during the calibration procedure. The UE further includes a first plurality of antennas communicatively coupled to the first radio, a second radio configured to transmit and receive signals during the calibration procedure and at least one second antenna communicatively coupled to the second radio. The calibration procedure includes the second radio transmitting a tone signal over the calibration frequency and a first antenna of the first radio receiving the tone signal and a second antenna of the first radio receiving the tone signal.

A semiconductor chip includes a first wireless communication circuit, a local oscillator (LO) buffer, and an auxiliary path. The first wireless communication circuit has a signal path, wherein the signal path has a mixer input port and a signal node distinct from the mixer input port. The auxiliary path is used to electrically connect the LO buffer to the signal node of the signal path. The LO buffer is reused for a loop-back test function through the auxiliary path.