The present disclosure relates to a radar device, including a transmitter circuit configured to generate an RF oscillator signal and to transmit an RF fault detection signal based on the RF oscillator signal, a receiver circuit configured to receive an RF reception signal based on the RF fault detection signal and to mix the RF reception signal with the RF oscillator signal in order to obtain a down-converted reception signal, and a fault detection circuit configured to detect a hardware fault of the radar device based on a phase of the down-converted reception signal.

The present disclosure relates to a radar device, including a transmitter circuit configured to generate an RF oscillator signal and to transmit an RF fault detection signal based on the RF oscillator signal, a receiver circuit configured to receive an RF reception signal based on the RF fault detection signal and to mix the RF reception signal with the RF oscillator signal in order to obtain a down-converted reception signal, and a fault detection circuit configured to detect a hardware fault of the radar device based on a phase of the down-converted reception signal.

A cell range determination is made by determining a sector straddling an azimuth line of a first base station with a center at the coordinates of a first base station. The sector is divided into a plurality of subsectors. A nearest neighbor base station is determined in each of the plurality of subsectors. A set of coordinates is determined for the nearest neighbor base station. An average distance between the nearest neighbor base stations is determined. A bearing angle difference between the nearest neighbor base station and the first base station is determined based on the set of coordinates of the nearest neighbor base station. A gain is determined for each of the plurality of subsectors based on the bearing angle difference. A cell range is determined for the first base station based on the gain.

A cell range determination is made by determining a sector straddling an azimuth line of a first base station with a center at the coordinates of a first base station. The sector is divided into a plurality of subsectors. A nearest neighbor base station is determined in each of the plurality of subsectors. A set of coordinates is determined for the nearest neighbor base station. An average distance between the nearest neighbor base stations is determined. A bearing angle difference between the nearest neighbor base station and the first base station is determined based on the set of coordinates of the nearest neighbor base station. A gain is determined for each of the plurality of subsectors based on the bearing angle difference. A cell range is determined for the first base station based on the gain.

A transmitter device includes a transmitter circuit, a voltage generator circuit, and a calibration circuit. The transmitter circuit is configured to selectively operate in a calibration mode or a normal mode in response to a first control signal, in which the transmitter circuit has a first output terminal and a second output terminal. The voltage generator circuit is configured to generate a bias voltage, in which the bias voltage has a first level in the calibration mode and has a second level in the normal mode, and the first level is different from the second level. The calibration circuit is configured to be turned on in the calibration mode according to the bias voltage and a second control signal, in order to calibrate a level of the first output terminal and a level of the second output terminal.

A transmitter device includes a transmitter circuit, a voltage generator circuit, and a calibration circuit. The transmitter circuit is configured to selectively operate in a calibration mode or a normal mode in response to a first control signal, in which the transmitter circuit has a first output terminal and a second output terminal. The voltage generator circuit is configured to generate a bias voltage, in which the bias voltage has a first level in the calibration mode and has a second level in the normal mode, and the first level is different from the second level. The calibration circuit is configured to be turned on in the calibration mode according to the bias voltage and a second control signal, in order to calibrate a level of the first output terminal and a level of the second output terminal.

Disclosed are a method and an apparatus for selecting a transmission path, and a storage medium. The method for selecting the transmission path includes: determining performance parameters of each of a plurality of transmission paths in a terminal; selecting a transmission path or a transmission path combination according to the performance parameters of the plurality of transmission paths, a service requirement and a usage scenario; switching to the selected transmission path or the selected transmission path combination.

Embodiments of apparatus and method for generating waveforms for self-testing of radio frequency (RF) chips are disclosed. In an example, an RF chip includes an RF front-end and a digital front-end. The digital front-end includes an inverse fast Fourier transform (IFFT) module configured to generate at least one M-point IFFT sample, where M is a positive integer, and an IFFT sample transformation module configured to generate an L-point IFFT testing signal based on the at least one M-point IFFT sample. L is a positive integer greater than M and the L-point IFFT testing signal is configured to test a function of the RF chip.

Embodiments of apparatus and method for generating waveforms for self-testing of radio frequency (RF) chips are disclosed. In an example, an RF chip includes an RF front-end and a digital front-end. The digital front-end includes an inverse fast Fourier transform (IFFT) module configured to generate at least one M-point IFFT sample, where M is a positive integer, and an IFFT sample transformation module configured to generate an L-point IFFT testing signal based on the at least one M-point IFFT sample. L is a positive integer greater than M and the L-point IFFT testing signal is configured to test a function of the RF chip.

A user equipment (UE) may simulate transmissions received from a BS to perform on-device testing of the UE. For example, the UE may be configured to loopback uplink data from the UL data path and input the uplink data as simulated downlink data for processing in the DL data path. The uplink data may include data related to a video call or network diagnostics. The user application data generated by the application and proceeding through the UL data path may be used to validate the DL data path. Downlink control information (DCI) may be determined by the UE and provided to the DL data path to accompany the uplink data. The DCI may include simulated uplink grants and/or simulated downlink scheduling assignments. The simulated downlink scheduling assignments may be determined based on availability of the uplink data in the UE's memory.