Described are methods and apparatuses pertaining to stacked integrated circuits having application in ultra-low-power and small form factor design, with fast prototyping and mass-production cycle time, including application for millimeter wave radio frequency circuits.

A method for antenna calibration is proposed. The method may comprise setting a first control unit to a first operation mode. The first control unit may be located on a first antenna path of a first antenna array which has a plurality of antennas. Under the first operation mode of the first control unit, a calibration signal for the first antenna path can be isolated from interference. The method may further comprise obtaining a measurement based at least partly on the calibration signal for the first antenna path. The method may further comprise performing antenna calibration for the plurality of antennas of the first antenna array based at least partly on the obtained measurement.

A radio-frequency transceiver device includes a transmission circuit generating a transmission signal at a transmission pad connected to a transmission antenna by modulating a radio frequency signal as a function of a control signal. First and second reception circuits receive first and second signals at first and second reception pads connected to first and second reception antennas. The received first and second signals are demodulated via the radio frequency signal to generate first and second demodulated reception signals. A control circuit operates during a reception test phase to generate only the control signal in order to test, as a function of the first and second demodulated reception signals, whether the received first signal corresponds to the received second signal. A reception error signal indicating a reception error is generated when the test indicates that the received first and second reception signals do not correspond.

Disclosed is a radio-frequency (RF) circuit capable of performing an RF characteristic test in a test mode. The RF circuit includes: a test signal generator generating a test signal; an RF receiver, coupled to the test signal generator, transmitting the test signal and thereby generating a receiver analog signal; a coupling circuit transmitting the receiver analog signal to an RF transmitter in the test mode; the RF transmitter transmitting the receiver analog signal and thereby generating a transmitter analog signal; a test result generator, coupled between the RF transmitter and a test result output terminal, including a signal converter for generating a converted signal according to the transmitter analog signal in the test mode, wherein the output signal at the test result output terminal is the converted signal or originated therefrom and relates to the result of the RF characteristic test.

Disclosed is a radio-frequency (RF) circuit capable of performing an RF characteristic test in a test mode. The RF circuit includes: a test signal generator generating a test signal; an RF receiver, coupled to the test signal generator, transmitting the test signal and thereby generating a receiver analog signal; a coupling circuit transmitting the receiver analog signal to an RF transmitter in the test mode; the RF transmitter transmitting the receiver analog signal and thereby generating a transmitter analog signal; a test result generator, coupled between the RF transmitter and a test result output terminal, including a signal converter for generating a converted signal according to the transmitter analog signal in the test mode, wherein the output signal at the test result output terminal is the converted signal or originated therefrom and relates to the result of the RF characteristic test.

An electronic device discussed herein may include an imbalance compensation logic that determines an imbalance parameter based at least in part on received quadrature signals from quadrature generation circuitry. The imbalance parameter may be determined using noise received by a receiver as an input radio frequency signal. By using the systems and methods described herein, an accuracy of detecting the imbalance may improve. Furthermore, by including the imbalance compensation logic internal to the electronic device, the imbalance compensation logic may provide continued imbalance detection over a lifespan of the electronic device.

An electronic device discussed herein may include an imbalance compensation logic that determines an imbalance parameter based at least in part on received quadrature signals from quadrature generation circuitry. The imbalance parameter may be determined using noise received by a receiver as an input radio frequency signal. By using the systems and methods described herein, an accuracy of detecting the imbalance may improve. Furthermore, by including the imbalance compensation logic internal to the electronic device, the imbalance compensation logic may provide continued imbalance detection over a lifespan of the electronic device.

Systems and methods for improving testing and/or calibration efficiency of radio frequency system. In some embodiments, a testing system includes a beamformer radio frequency system, in which the beamformer radio frequency system includes first transceiver circuitry and a first plurality of antennas coupled to the first transceiver circuitry, a beamformee radio frequency system, in which the beamformee radio frequency system includes second transceiver circuitry and a second plurality of antennas coupled to the second transceiver circuitry, one or more wired connections coupled between the first transceiver circuitry of the beamformer radio frequency system and the second transceiver circuitry of the beamformee radio frequency system, in which each of the one or more wired connections bypasses the first plurality of antennas of the first radio frequency system and the second plurality of antennas of the second radio frequency system.

Test setup and calibration method for wideband, integrated assemblies of signal couplers with single (wideband) and multi-probe (harmonic) impedance tuners using two-port and four-port network analyzers for exact wave and time-domain measurements of strongly mismatched poor directivity ultra-wideband coupler-tuner configurations.

Test setup and calibration method for wideband, integrated assemblies of signal couplers with single (wideband) and multi-probe (harmonic) impedance tuners using two-port and four-port network analyzers for exact wave and time-domain measurements of strongly mismatched poor directivity ultra-wideband coupler-tuner configurations.