A reading device including a position reference member having a reference pattern having a line extending along a first direction of the position reference member, the position reference member movable in a second direction orthogonal to the first direction; a reader including a plurality of sensor chips arranged along the first direction, each of the sensor chips having a length defined by a plurality of pixels; and circuitry. The circuitry is configured to detect the reference pattern of the position reference member using the reader; determine coordinates of at least two sensor chips in the second direction, based on the detected reference pattern of the position reference member; and correct a position of a reading target in the second direction based on the coordinates determined for the at least two sensor chips of the reader in the second direction.

An image processing apparatus includes a reading unit and a controller. The reading unit radiates light to a target from two directions with different angles and reads images of the target. The controller performs, when controlling the reading unit to acquire the two images of the target, control such that a resolution of the image read by radiating the light to the target from one of the two directions is lower than a resolution of the image read by radiating the light to the target from the other one of the two directions.

According to examples, an apparatus may include a processor and a memory on which is stored machine readable instructions that are to cause the processor to determine a size of a chip gap between a first sensor chip and a second sensor chip, access a model that estimates an amount of positional shift of a target centroid, and apply the determined chip gap size and the accessed model on an image captured using the first sensor chip and the second sensor chip to compensate for an estimated positional shift in a centroid of a calibration target in the captured image by causing a location of the calibration target centroid in the captured image to more accurately correspond to an actual location of the calibration target centroid on an object from which the captured image was captured.

According to examples, an apparatus may include a processor and a memory on which is stored machine readable instructions that are to cause the processor to determine a size of a chip gap between a first sensor chip and a second sensor chip, access a model that estimates an amount of positional shift of a target centroid, and apply the determined chip gap size and the accessed model on an image captured using the first sensor chip and the second sensor chip to compensate for an estimated positional shift in a centroid of a calibration target in the captured image by causing a location of the calibration target centroid in the captured image to more accurately correspond to an actual location of the calibration target centroid on an object from which the captured image was captured.

A photoelectric conversion device includes a plurality of pixels configured to output analog voltage signals in response to incident light; an analog memory configured to store the analog voltage signals output from the plurality of pixels; and an analog/digital (A/D) converter configured to perform A/D conversion on the analog voltage signal from the analog memory. The plurality of pixels includes N pixels configured to simultaneously output analog voltage signals to the analog memory. The A/D converter includes (N1) or less A/D converters configured to perform A/D conversion on the analog voltage signals that have been simultaneously output from the N pixels and stored in the analog memory.

A photoelectric conversion device includes a plurality of pixels configured to output analog voltage signals in response to incident light; an analog memory configured to store the analog voltage signals output from the plurality of pixels; and an analog/digital (A/D) converter configured to perform A/D conversion on the analog voltage signal from the analog memory. The plurality of pixels includes N pixels configured to simultaneously output analog voltage signals to the analog memory. The A/D converter includes (N1) or less A/D converters configured to perform A/D conversion on the analog voltage signals that have been simultaneously output from the N pixels and stored in the analog memory.

In a line sensor including color filters that are periodically disposed in a light-receiving-element row, a problem called a mixture of colors occurs. A mixture of colors occurs when light that has been transmitted through a color filter differing from a color filter corresponding to a light receiving element is incident upon the light receiving element.

In a CMOS sensor 107 including a light-receiving-element row in which a plurality of photodiodes 1204 are disposed side by side in a main scanning direction and a plurality of color filters 1202 that are disposed in correspondence with the plurality of photodiodes 1204, the center of each color filter 1202 is displaced in a direction of the center of the light-receiving-element row from the center of the photodiode 1204 corresponding to the color filter.

In a line sensor including color filters that are periodically disposed in a light-receiving-element row, a problem called a mixture of colors occurs. A mixture of colors occurs when light that has been transmitted through a color filter differing from a color filter corresponding to a light receiving element is incident upon the light receiving element.

In a CMOS sensor 107 including a light-receiving-element row in which a plurality of photodiodes 1204 are disposed side by side in a main scanning direction and a plurality of color filters 1202 that are disposed in correspondence with the plurality of photodiodes 1204, the center of each color filter 1202 is displaced in a direction of the center of the light-receiving-element row from the center of the photodiode 1204 corresponding to the color filter.

An image sensor module comprises: a substrate having a first side and second side, the first side being an opposite of the second side, an image sensor attached to the first side of the substrate, bonding wires to bond the image sensor to pads on the first side of the substrate, a protective structure disposed on the first side of the substrate surrounding the image sensor, the bonding wires, and the pads, the protective structure having a dam and a lid, a cover glass disposed on the protective structure, and a set of solder balls attached to the second side of the substrate.

In a line sensor including color filters that are periodically disposed in a light-receiving-element row, a problem called a mixture of colors occurs. A mixture of colors occurs when light that has been transmitted through a color filter differing from a color filter corresponding to a light receiving element is incident upon the light receiving element. In a CMOS sensor 107 including a light-receiving-element row in which a plurality of photodiodes 1204 are disposed side by side in a main scanning direction and a plurality of color filters 1202 that are disposed in correspondence with the plurality of photodiodes 1204, the center of each color filter 1202 is displaced in a direction of the center of the light-receiving-element row from the center of the photodiode 1204 corresponding to the color filter.