The present disclosure relates to an information processing apparatus and an information processing method for suppressing a decrease in the accuracy of image projection correction. By use of an image projection model using a distortion factor of an f lens with an image height of incident light expressed by the product of a focal point distance f and an incident angle of the incident light, the posture of a projection section for projecting an image and the posture of an imaging section for capturing a projection plane to which the image is projected are estimated. The present disclosure may be applied, for example, to information processing apparatuses, projection apparatuses, imaging apparatuses, projection imaging apparatuses, projection imaging control apparatuses, or image projection and imaging systems.

The luminance of a projected picture derived from an input picture is optimized in a manner suppressing the reduction of contrast in the projected picture. A signal processing apparatus includes a compensation coefficient application section configured to apply a posterior degradation compensation coefficient to a picture input signal input to a picture projection section, the posterior degradation compensation coefficient being based on scattered light caused by the picture projection section in a picture projected by the picture projection section.

Embodiments of the present disclosure relate to a method for analyzing an imaging quality of an imaging system. The imaging system comprises a spatial light modulator. The spatial light modulator comprises pixel units arranged in an array. The method comprises obtaining a transmittance distribution function of the spatial light modulator based on a structural parameter of the pixel unit, wherein the structural parameter is an aperture ratio. The imaging quality analysis parameter of the imaging system is obtained based on the transmittance distribution function of the spatial light modulator. Then, the imaging quality of the imaging system is analyzed based on the imaging quality analysis parameter.

A projection control apparatus includes a CPU configured to perform control to successively project a plurality of images for correction onto a projection target, each of the images for correction being configured such that a marker image is arranged at a preset position in the image, to acquire information of a plurality of photographed images including the images for correction projected onto the projection target, to detect a difference between the respective photographed images, based on positions of the marker images, and to set a correction condition for projecting an image, based on the information of the photographed images, in accordance with the detected difference of a projection image range.

A controller for a tiltable MEMS reflector is configured to oscillate the reflector about X axis or about X and Y axes, and to obtain information about current and past tilt angles. The controller is configured to evaluate tilt angles of the tiltable MEMS reflector at a later moment of time based on the previously obtained information about the tilt angles of the tiltable MEMS reflector at the different earlier moments of time. The controller may be further configured to energize the light source providing a light beam to the tiltable MEMS reflector at the later moment of time with brightness and color corresponding to the brightness and color of a pixel that will be painted by the tiltable MEMS reflector at the later moment of time. A statistical model may be combined with machine learning to accurately predict future tilt angles of the tiltable MEMS reflector.

Provided are a method and an apparatus for correcting a color convergence error, and a device. The method includes: in a darkroom environment, acquiring a projection image obtained by projecting a test pattern containing N white shape points by a projection system, where N is an integer greater than or equal to 2; performing color separation on N shape image points on the projection image, to obtain N shape image points corresponding to R, G, and B color components respectively; determining color coordinates corresponding to R, G, and B according to the N shape image points corresponding to R, G, and B color components respectively; and adjusting an assembly parameter of the projection system according to the color coordinates corresponding to the R, G, and B. The present disclosure may detect and correct color convergence error of the projection system.

An image mapping player includes an image mapping module for creating a mapping relation between each pixel of an image of a video to be mapped and each pixel of an image to be displayed and displaying the image according to the mapping relation, a brightness adjustment module for adjusting the brightness of the displayed image brightness, a controller selection module for selecting a controller type, a channel selection module for selecting a channel; a RB reverse selection module for selecting a color component R and a color component B whether or not applicable for reversing the image, a white light setting module, for selecting a white light mod, and a port brightness adjustment module for adjusting the brightness of a selected port. The invention also discloses a pixel debugging method by using the image mapping player.

An angle-of-view testing method for a projection display device, including setting a reference viewpoint at a same side as a reflective surface associated with the projection display device, setting a metrical marker plate with a metrical marker at another side opposite to the reflective surface at a first distance from the reference viewpoint, projecting a testing picture onto the reflective surface by the projection display device, where light of the testing picture is reflected by the reflective surface toward the reference viewpoint, such that a projected image as a virtual image of the testing picture is observed at the reference viewpoint as being projected onto the metrical marker plate, determining the coverage of the projected image with respect to the metrical marker of the metrical marker plate, and determining an angle of view of the projection display device based on the determined coverage.

A projection system including a processing device and a projector is provided. The projector is coupled to the processing device. The projector includes a projection unit and an image capturing unit. The projection unit is configured to project an image frame onto a projection plane, where the image includes a grid point array. The image capturing unit is configured to capture the image frame on the projection plane according to a plurality of setting parameters, so as to obtain a plurality of captured images corresponding to the setting parameters. The processing device selects one of the captured images meeting a preset image condition as a desired captured image, and sets the image capturing unit according to a desired setting parameter. In addition, an automatic setting method is also provided. The projection system of the invention can operate without complex manual setting procedures.

Provided is a computation method for obtaining information suitable for positional deviation correction and lens blur correction for a case where a part of or an entire projection image projected by each of a plurality of projectors is displayed in a superimposed manner. For this purpose, a light intensity distribution indicating a degree of lens blur of a base projector and peak coordinates of the light intensity distribution are calculated using a captured image obtained by capturing a test pattern projected by the base projector in an arrangement state in which a plurality of projectors is arranged such that a part of or an entire projection image projected by each of the plurality of projectors is displayed in a superimposed manner. Further, a light intensity distribution centered on the peak coordinates on the base projector side and corresponding to a degree of lens blur of a referencing projector is calculated using a captured image obtained by capturing the test pattern projected by the referencing projector in the same arrangement state. As a result, information indicating the degree of lens blur of the base projector and information corresponding to positional deviation and the degree of lens blur of the referencing projector are obtained.