H04N25/683

Imaging apparatus and imaging method, camera module, and electronic apparatus capable of detecting a failure in a structure in which substrates are stacked

The present disclosure relates to an imaging apparatus and an imaging method, a camera module, and an electronic apparatus that are capable of detecting a failure in an imaging device having a structure in which a plurality of substrates are stacked. The timing at which a row drive unit provided in a second substrate outputs a control signal for controlling accumulation and reading of pixel signals in a pixel array provided in a first substrate is compared with the timing at which the control signal output from the row drive unit is detected after passing through the pixel array. Depending on whether or not the timings coincides with each other, a failure is detected. The present disclosure can be applied to an imaging apparatus mounted on a vehicle.

Dynamic defect detection and correction for quadra image sensors
11589035 · 2023-02-21 · ·

Embodiments relate to correcting pixels of images captured using a quadra image sensor. A defect detection circuit analyzes the pixels in the captured image and determines whether a pixel is defective. The defect detection circuit generates a first defect indication by determining whether pixel data of a pixel under test is brighter or darker by a first threshold value than pixel data of pixels in pixel tiles surrounding the pixel tile corresponding to the pixel under test. Moreover, the defect detection circuit generates a second defect indication by determining whether pixel data of the pixel under test is brighter or darker by a second threshold value than pixel data of other pixels in the pixel tile corresponding to the pixel under test. Using the first and second defect indications, the defect detection circuit identifies whether the pixel data of the pixel under test is defective.

Image-sensing system and detection and correction method for defective pixel
11503236 · 2022-11-15 · ·

An image-sensing system for the efficient detection of defective pixels is shown. An arithmetic logic unit (ALU) determines a defective pixel candidate of an image sensor based on the first frame captured by the image sensor, performs a lower-part comparison on the defective pixel candidate based on the first frame, and performs an upper-part comparison on the defective pixel candidate based on the second frame captured by the image sensor. The defective pixel candidate is confirmed to be defective based on the first frame as well as the second frame. Only limited pixel data is buffered for the defective pixel detection.

Image processing device configured to regenerate timestamp and electronic device including the same

An image processing device includes a vision sensor and a processor. The vision sensor generates a plurality of events in which an intensity of light changes and generates a plurality of timestamps depending on times when the events occur. In addition, the processor may regenerate a timestamp of a pixel where an abnormal event occurs, based on temporal correlation of the events.

APPARATUS AND METHOD FOR INTERBAND DENOISING AND SHARPENING OF IMAGES
20230034109 · 2023-02-02 ·

A method includes obtaining a blended red-green-blue (RGB) image frame of a scene. The method also includes performing, using at least one processing device of an electronic device, an interband denoising operation to remove at least one of noise and one or more artifacts from the blended RGB image frame in order to produce a denoised RGB image frame. Performing the interband denoising operation includes performing filtering of red, green, and blue color channels of the blended RGB image frame to remove at least one of the noise and the one or more artifacts from the blended RGB image frame. The filtering of the red and blue color channels of the blended RGB image frame is based on image data of at least one of the green color channel and a white color channel of the blended RGB image frame.

TIME DELAY INTEGRATION SENSOR HANDLING DEFECT PIXELS
20230123405 · 2023-04-20 ·

The present disclosure provides a time delay integration (TDI) sensor using a rolling shutter. The TDI sensor includes multiple pixel columns. Each pixel column includes multiple pixels arranged in an along-track direction, wherein two adjacent pixels or two adjacent pixel groups in every pixel column have a separation space therebetween. The separation space is equal to a pixel height multiplied by a time ratio of a line time difference of the rolling shutter and a frame period, or equal to a summation of at least one pixel height and a multiplication of the pixel height by the time ratio of the line time difference and the frame period. The TDI sensor further records defect pixels of a pixel array such that in integrating pixel data to integrators, the pixel data associated with the defect pixels is not integrated into corresponding integrators.

Solid-state image sensor and imaging device

In a solid-state image sensor that detects presence or absence of an address event, erroneous detection of the address event is suppressed. Each of a plurality of pixels executes detection processing for detecting whether or not a change amount of an incident light amount exceeds a predetermined threshold, and outputting a detection result. An abnormal pixel determination unit determines whether or not each of the plurality of pixels has an abnormality, and enables a pixel without an abnormality and disables a pixel with an abnormality. A control unit performs control for causing the enabled pixel to execute detection processing and control for fixing the detection result of the disabled pixel to a specific value.

IMAGING APPARATUS AND IMAGING METHOD, CAMERA MODULE, AND ELECTRONIC APPARATUS CAPABLE OF DETECTING A FAILURE IN A STRUCTURE IN WHICH SUBSTRATES ARE STACKED

The present disclosure relates to an imaging apparatus and an imaging method, a camera module, and an electronic apparatus that are capable of detecting a failure in an imaging device having a structure in which a plurality of substrates are stacked.

The timing at which a row drive unit provided in a second substrate outputs a control signal for controlling accumulation and reading of pixel signals in a pixel array provided in a first substrate is compared with the timing at which the control signal output from the row drive unit is detected after passing through the pixel array. Depending on whether or not the timings coincides with each other, a failure is detected. The present disclosure can be applied to an imaging apparatus mounted on a vehicle.

IMAGING APPARATUS AND IMAGING METHOD, CAMERA MODULE, AND ELECTRONIC APPARATUS CAPABLE OF DETECTING A FAILURE IN A STRUCTURE IN WHICH SUBSTRATES ARE STACKED

The present disclosure relates to an imaging apparatus and an imaging method, a camera module, and an electronic apparatus that are capable of detecting a failure in an imaging device having a structure in which a plurality of substrates are stacked.

The timing at which a row drive unit provided in a second substrate outputs a control signal for controlling accumulation and reading of pixel signals in a pixel array provided in a first substrate is compared with the timing at which the control signal output from the row drive unit is detected after passing through the pixel array. Depending on whether or not the timings coincides with each other, a failure is detected. The present disclosure can be applied to an imaging apparatus mounted on a vehicle.

ANOMALOUS PIXEL DETECTION

Systems and methods are disclosed herein to detect pixels exhibiting anomalous behavior in captured image frames. In some examples, temporal anomalous behavior may be identified, such as flickering pixels exhibiting large magnitude changes in pixel values that vary rapidly from frame-to-frame. In some examples, spatial anomalous behavior may be identified, such as pixels exhibiting values that deviate from an expected linear response in comparison with other neighbor pixels.