Provided is an imaging device that includes an imaging unit that performs an imaging operation, a data generator that generates first power supply voltage data corresponding to a first power supply voltage and a flag generation section that generates a flag signal for the first power supply voltage by comparing the first power supply voltage data and first reference data. The first power supply voltage is supplied to the imaging unit.

Processing circuitry may be configured to detect an abnormal pixel among a plurality of pixels based on pixel values of the plurality of pixels and one or more reference pixel values corresponding to the plurality of values; generate first encoded data by encoding pixel data of the plurality of pixels based on the pixel values with a first encoder; generate second encoded data by encoding the pixel data based on remaining pixels of the plurality of pixels excluding the detected abnormal pixel with a second encoder; and output the first encoded data or the second encoded data based on detecting the abnormal pixel.

A processing device includes: a processor including hardware, the processor being configured to acquire image data; determine, for each pixel of an image corresponding to the acquired image data, whether a pixel value of the pixel is equal to or less than a preset threshold as a dark level; accumulate, for a predetermined number of frames, the pixel value that has been determined to be equal to or less than the preset threshold and positional information regarding a position of the pixel whose pixel value has been determined to be equal to or less than the preset threshold, on the image sensor; calculate a statistical value of the accumulated pixel values for each pixel; determine, for each pixel, whether the statistical value falls outside a preset range; and correct a pixel value of the pixel whose statistical value has been determined to fall outside the preset range.

Provided is a technology with which defective pixel information in taking a radiation image and defective pixel information in detecting a dose can be generated efficiently. Provided is a radiation imaging apparatus including: a plurality of pixels arranged to convert radiation into an electric signal; and a generation unit configured to generate, based on the electric signal obtained as a result of a conversion by the plurality of pixels, first defective pixel information indicating a defective pixel in taking a radiation image among the plurality of pixels, and second defective pixel information indicating a defective pixel in detecting a dose among the plurality of pixels.

A method of defect pixel correction, includes, receiving at least one center pixel signal in a plurality of frames, receiving a plurality of neighboring pixel signals adjacent the center pixel in the plurality of frames, determining a brightness of the center pixel signal, determining the brightness of the plurality of neighboring pixel signals, determining if the brightness of the center pixel signal exceeds a wounded pixel threshold of the plurality of neighboring pixel signals, determining a location of the center pixel having the brightness greater than the wounded pixel threshold in at least one frame, determining a number of reoccurrences of the center pixel having the brightness greater than the wounded pixel threshold, determining if the number of reoccurrences exceeds a defect pixel threshold and updating the at least one center pixel signal to a mean of the plurality of neighboring pixel signals.

A radiation imaging apparatus is provided. The apparatus comprises: an imaging unit including a plurality of pixels configured to convert incident radiation into an electrical signal; a storage unit configured to store position information of a first pixel, among the pixels, which always outputs an abnormal pixel value; a correction unit configured to detect a second pixel, among the pixels, which is not stored in the storage unit and outputs an abnormal pixel value, and correct the pixel value of the second pixel; and an interpolation unit configured to, after image data output from the imaging unit is processed by the correction unit, generate a pixel value of the first pixel based on the position information and a pixel value of a pixel, among the pixels, which is arranged near the first pixel.

An image-sensing system for the efficient detection of defective pixels is shown. An arithmetic logic unit (ALU) determines a defective pixel candidate of an image sensor based on the first frame captured by the image sensor, performs a lower-part comparison on the defective pixel candidate based on the first frame, and performs an upper-part comparison on the defective pixel candidate based on the second frame captured by the image sensor. The defective pixel candidate is confirmed to be defective based on the first frame as well as the second frame. Only limited pixel data is buffered for the defective pixel detection.

A solid-state imaging device includes a first detection pixel and a second detection pixel, each of the first detection pixel and the second detection pixel including a transfer transistor and an amplifier transistor connected to the transfer transistor via a first node, a voltage supply unit that supplies a predetermined voltage, and a connection switch connected between the voltage supply unit and a second node at which the transfer transistor of the first detection pixel and the transfer transistor of the second detection pixel are connected.

An imaging device includes an image pickup device having pixels and a correction processing unit that corrects signals output from the image pickup device, the pixels include a visible light pixel that receives light corresponding to a visible light wavelength range and an infrared light pixel that is arranged adjacent to the visible light pixel and receives light corresponding to an infrared wavelength range, and the correction processing unit includes a calculation unit that performs a first process of reducing, from a signal of the infrared light pixel, a component in the pixel signal of the infrared light pixel and based on an inflow amount of charges to the infrared light pixel from another pixel adjacent to the infrared light pixel and a second process of obtaining a signal corresponding to a difference between pixel signals of the visible light pixel and the infrared light pixel after the first process.

A defective pixel is easily identified in a solid-state imaging element that detects an address event. An address event detecting unit detects, as an address event, a fact that an absolute value of a change amount of luminance exceeds a predetermined threshold value with regard to each of a plurality of pixels, and outputs a detection signal indicating a result of the detection. A detection frequency acquisition unit acquires a detection frequency of the address event with regard to each of the plurality of pixels. A defective pixel identification unit identifies, on the basis of a statistic of the detection frequency, a defective pixel where an abnormality has occurred among the plurality of pixels.