The present technology relates to a solid-state imaging apparatus, a manufacturing method therefor, and an electronic apparatus by which fine pixel signals can be suitably generated. A charge accumulation section that is formed on a first semiconductor substrate and accumulates photoelectrically converted charges, a charge-retaining section that is formed on a second semiconductor substrate and retains charges accumulated in the charge accumulation section, and a transfer transistor that is formed on the first semiconductor substrate and the second semiconductor substrate and transfers charges accumulated in the charge accumulation section to the charge-retaining section are provided. A bonding interface between the first semiconductor substrate and the second semiconductor substrate is formed in a channel of the transfer transistor.

A vision sensor is provided. The vision sensor includes: a pixel array including a plurality of pixels, each of the plurality of pixels being configured to generate an event signal based on an event in which intensity of incident light changes; and an event detection circuit including a state register including a first flip-flop and a second flip-flop. The event detection circuit is configured to: based on the event signal, store first data in the first flip-flop, the first data indicating whether flicker has occurred in each of the plurality of pixels, store second data in the second flip-flop, the second data indicating whether the event has occurred in each of the plurality of pixels, and based on a comparison of the first data and the second data, identify and delete a portion of the second data in which the flicker has occurred.

A vision sensor is provided. The vision sensor includes: a pixel array including a plurality of pixels, each of the plurality of pixels being configured to generate an event signal based on an event in which intensity of incident light changes; and an event detection circuit including a state register including a first flip-flop and a second flip-flop. The event detection circuit is configured to: based on the event signal, store first data in the first flip-flop, the first data indicating whether flicker has occurred in each of the plurality of pixels, store second data in the second flip-flop, the second data indicating whether the event has occurred in each of the plurality of pixels, and based on a comparison of the first data and the second data, identify and delete a portion of the second data in which the flicker has occurred.

Provided is a photoelectric conversion device including a pixel array that includes pixels forming columns and is arranged in a substrate, first signal lines each transmitting a signal output from a pixel of a corresponding column, an analog circuit arranged in the substrate and configured to process signals from the pixels, second signal lines transmitting signals from the pixels to the analog circuit on a column basis, a switch configured to change a combination of connections between the first signal lines and the second signal lines, and a shift register arranged in the substrate, including a flip-flop, and configured to control the switch. In a plan view with respect to the substrate, the shift register is arranged between the pixel array and the analog circuit. In the plan view, the switch and the flip-flop are arranged in a direction different from a direction in which the first signal lines extend.

Provided is an imaging device including a pixel array including a plurality of pixels arranged to form a plurality of rows and a plurality of columns, each of the plurality of pixels generates signals in accordance with an incident light; a first output line and a second output line that are arranged corresponding to each of the plurality of columns of the pixel array and transmit signals output from the pixels arranged on a corresponding column; a scanning unit that drives the pixel array so as to output signals from at least two of the pixels arranged on different rows of a single column respectively to the first output line and the second output line; and an output line control unit that provide potentials that are different from each other to the first output line and the second output line, respectively, in a test mode.

An image sensor includes a pixel array including a plurality of pixels, an analog-to-digital converter having a first counter for converting an analog signal into a digital signal, and an output buffer having a first memory. A first counter test result value generated as a test result for the first counter is stored in the first memory in a test mode. The output buffer outputs the first counter test result value from the first memory to an outside of the output buffer in response to a first selection signal. The output buffer further includes a reset logic circuit for resetting the first memory depending on whether the first counter test result value is output or not. The plurality of pixels generate the analog signal in response to incident light.

A solid-state imaging device includes: a plurality of pixel circuits arranged in rows and columns; a plurality of unit power supply circuits that generate a second power supply voltage from a first power supply voltage based on a reference voltage and supply the second power supply voltage to amplifier transistors provided in the plurality of pixel circuits; and a regulator circuit that generates the reference voltage that is constant. Each of the unit power supply circuits is provided for a corresponding one of the columns of the plurality of pixel circuits or for a corresponding one of the pixel circuits, and supplies the second power supply voltage to the amplifier transistors in the pixel circuits that belong to the corresponding one of the columns or to the amplifier transistor in the corresponding one of the pixel circuits.

An image processing method is provided. The image processing method is configured to process the color-block image output by the image sensor. The brightness area is identified in the color-block image. A first part of the color-block image within the brightness area is converted into a first image using a first interpolation algorithm. The second part of the color-block image beyond the brightness area is converted into a second image using a second interpolation algorithm. The first image and the second image are merged to generate a simulation image corresponding to the color-block image. Moreover, an image processing apparatus and an electronic device are provided.

An image processing apparatus performs image processing on image data including blinking defective noise generated by an image sensor including pixels configured to generate a signal, and readout circuits configured to read out the signal as a pixel value. The image processing apparatus includes: an acquisition unit configured to acquire noise information including position information of a pixel in which there is a possibility that blinking defective noise attributed to the readout circuit occurs; a direction determination unit configured to determine, based on the noise information, and pixel values of neighboring pixels surrounding a pixel of interest in an image corresponding to the image data, a direction in which pixel values having highest correlation with a pixel value of the pixel of interest are consecutively arrayed; and an image processor configured to perform image processing on the image data based on a determination result.

Provided is a method of correcting a defective pixel of a digital image. In the method, the defective pixels are pre-corrected. The similarities of normal pixels and each defective pixel are calculated. The weight of each normal pixel to each defective pixel is calculated based on the similarities of the normal pixels and each defective pixel. The weight of each normal pixel to each defective pixel is normalized. The normalized weighted values of the normal pixels to each defective pixel are weighted summed to obtain the corrected pixel value of each defective pixel.