A sensor device according to the present technology includes: a pixel array unit in which a plurality of pixel units each having one or a plurality of pixels and capable of generating a gradation signal indicating intensity of a light reception amount and an event signal indicating a change in the light reception amount is two-dimensionally arranged; and a row control unit that can sequentially execute in rows selection of a pixel from which the event signal is to be read and selection of a pixel from which the gradation signal is to be read at different timings.

The present technology relates to a signal processing device and method, and a program that enable easier and more accurate failure detection. The signal processing device includes: an addition unit that adds test data for failure detection to valid data on which predetermined processing is to be performed, two or more samples processed in parallel in different paths having a same sample value in the test data; and a signal processing unit that performs the predetermined processing on the valid data and the test data that has been added to the valid data by a plurality of the paths. The present technology can be applied to in-car cameras.

To improve the correction accuracy in a solid-state image sensor that performs dark current correction. A solid-state image sensor includes a bias voltage supply unit and a signal processing unit. The bias voltage supply unit supplies a bias voltage of a predetermined value to a light-shielded pixel impervious to light in a period in which a light-shielded pixel signal is output from the light-shielded pixel, and supplies a bias voltage of a value different from the predetermined value to a photosensitive pixel not impervious to light in a period in which a photosensitive pixel signal is output from the photosensitive pixel. The signal processing unit executes processing of removing dark current noise from the photosensitive pixel signal using the light-shielded pixel signal.

An imaging device including: a semiconductor substrate including a pixel region and a peripheral region; an insulating layer that covers the pixel and peripheral regions; first electrodes located on the insulating layer above the pixel region; a photoelectric conversion layer that covers the first electrodes; a second electrode that covers the photoelectric conversion layer; detection circuitry configured to be electrically connected to the first electrodes; peripheral circuitry configured to be electrically connected to the detection circuitry, and including analog circuitry; and a third electrode electrically connected to the second electrode. The third electrode overlaps the analog circuitry in a plan view, and in all cross-sections perpendicular to a surface of the semiconductor substrate, parallel to the column direction or the row direction, intersecting at least one of the first electrodes, and intersecting the third electrode, no transistor of the digital circuitry is located directly below the third electrode.

Techniques for facilitating unit cell selection verification systems and methods are provided. In one example, a method includes detecting, by each detector of a focal plane array (FPA), electromagnetic radiation. Each detector is selectively coupled to a readout circuit of the FPA via a selection circuit of the FPA. The method further includes, during a frame period, applying a predetermined signal pattern to a portion of the selection circuit, where the portion is associated with a subset of detectors of the FPA, and performing a readout of the FPA to obtain a respective output signal associated with each respective detector of the FPA. The method further includes determining whether the portion of the selection circuit is operating properly based at least on the output signal associated with the detectors of the subset from the readout. Related systems and devices are also provided.

Techniques for facilitating unit cell selection verification systems and methods are provided. In one example, a method includes detecting, by each detector of a focal plane array (FPA), electromagnetic radiation. Each detector is selectively coupled to a readout circuit of the FPA via a selection circuit of the FPA. The method further includes, during a frame period, applying a predetermined signal pattern to a portion of the selection circuit, where the portion is associated with a subset of detectors of the FPA, and performing a readout of the FPA to obtain a respective output signal associated with each respective detector of the FPA. The method further includes determining whether the portion of the selection circuit is operating properly based at least on the output signal associated with the detectors of the subset from the readout. Related systems and devices are also provided.

An electronic device includes a reset circuit and a first image sensing circuit. The reset circuit is used to receive a reset signal and includes a plurality of transistors. The first image sensing circuit is coupled to the reset circuit and includes a photodiode, a first transistor and a second transistor. The photodiode has a first terminal. The first transistor has a first terminal coupled to the first terminal of the photodiode, and a second terminal. The second transistor has a first terminal coupled to the second terminal of the first transistor, and a second terminal configured to receive a row selection signal.

In order to achieve a photoelectric conversion device that enables suppressing the lowering in tone, a photoelectric conversion device has a pixel including a photoelectric conversion element that outputs a signal according to an incident photon; a photon counter that outputs a measured value according to the number of photons incident to the pixel, a time counter that measures a time until the measured value of the photon counter reaches a first threshold after the photon counter starts the measurement, and a sensitivity adjustment unit configured to perform a sensitivity change for the pixel during a time until the measured value of the photon counter reaches the first threshold after the photon counter starts the measurement.

An information processing apparatus including a specification section specifying, from among a plurality of blocks that are set by dividing pixels included in at least a partial region of a pixel region having a plurality of pixels arrayed therein and each of which includes at least one or more of the pixels, at least one or more of the blocks, and a generation section generating a unique value based on pixel values of the pixels included in the specified blocks.

An image sensor includes image sensor cells generating an image signal in response to one or more control signals, and a first driver generating a first control signal. The first driver includes a first positive supply terminal connected to a first power supply node. The image sensor also includes a voltage generator generating a first voltage at the first power supply node, where the voltage generator includes charge pump cells to receive clock signals and to source charge to the first power supply node, a delay line including delay line elements generating clock signals, where a first charge pump cell receives a first clock signal generated by a first delay line element, where a second charge pump cell receives a second clock signal generated by a second delay line element, and where a delay between the first clock signal and the second clock signal is determined by the delay line.