Power consumption is reduced in a solid-state imaging element that amplifies a voltage for each column.

The solid-state imaging element includes a pixel circuit, an input transistor, a reference side current source, and a feedback circuit. The pixel circuit generates an input voltage by photoelectric conversion. The input transistor outputs an output voltage depending on a voltage between a source to which the input voltage is input and a gate from a drain. The reference side current source is connected to a reference node at a predetermined reference voltage and supplies a predetermined current. The feedback circuit feeds back a part of the current to the gate of the input transistor.

A method includes obtaining, from an image sensor, one or more images that represent an object, and determining a speed of the object based on the one or more images. The method also includes determining that the speed of the object exceeds a threshold speed and, based on determining that the speed of the object exceeds the threshold speed, determining a region of interest (ROI) of the image sensor expected to represent the object. The method further includes causing the image sensor to generate one or more ROI images using the ROI.

Disclosed is an image sensing device including a plurality of selectors suitable for generating a plurality of selected pixel signals corresponding to one of a plurality of pixel signals; a plurality of signal converters suitable for: setting a plurality of initial voltages which are different from one another, on the basis of a plurality of initialization signals during an initialization period, and generating a plurality of converted pixel signals to which the plurality of initial voltages are respectively reflected, on the basis of the plurality of selected pixel signals and a ramp signal during a readout period; and a calculation circuit suitable for averaging the plurality of converted pixel signals.

An image capturing apparatus comprises a pixel array in which a plurality of column output lines including a first column output line and a second column output line are arranged for each column; and a readout circuit configured to read out signals from the pixels via the column output lines, wherein the readout circuit performs a first read-out scan of reading out signals via the first column output line from a first pixel group of the pixel array, and a second read-out scan of reading out signals via the second column output line from a second pixel group, and the readout circuit reads out a phase-difference signal of a horizontal direction by the first read-out scan, and reads out a phase-difference signal of a vertical direction by the second read-out scan.

Integrated-circuit imagers selectively multi-sample pixel array outputs according to luminance level indicated by an initial sample, avoiding the additional power/time required for multi-sampling in high-luminance, shot-noise-dominated conditions and, conversely, multi-sampling in readout-noise-dominated low-luminance conditions.

Techniques for facilitating vacuum health detection for imaging systems and methods are provided. In one example, an imaging device includes a detector configured to generate a first reference signal. The imaging device further includes a buffer circuit configured to store a value of the first reference signal. The imaging device further includes a processing circuit coupled to the buffer circuit. The processing circuit is configured to determine a first predetermined value based on a first temperature associated with the detector. The processing circuit is further configured to determine vacuum integrity associated with the detector based at least on the value of the first reference signal and the first predetermined value. Related methods and systems are also provided.

Techniques for facilitating vacuum health detection for imaging systems and methods are provided. In one example, an imaging device includes a detector configured to generate a first reference signal. The imaging device further includes a buffer circuit configured to store a value of the first reference signal. The imaging device further includes a processing circuit coupled to the buffer circuit. The processing circuit is configured to determine a first predetermined value based on a first temperature associated with the detector. The processing circuit is further configured to determine vacuum integrity associated with the detector based at least on the value of the first reference signal and the first predetermined value. Related methods and systems are also provided.

An image sensor includes a pixel including a first floating diffusion and a second floating diffusion, generating a first pixel signal based on a quantity of charge of the first floating diffusion, and generating a second pixel signal based on the quantity of charge of the first floating diffusion and a quantity of charge of the second floating diffusion; a column line connected to the pixel and transmitting the first pixel signal or the second pixel signal; and a readout circuit connected to the column line and generating an image signal based on a plurality of comparison results including a first comparison result obtained by comparing the first pixel signal with a first reference signal, a second comparison result obtained by comparing the second pixel signal with a first reference signal, and a third comparison result obtained by comparing the second pixel signal with a second reference signal.

Disclosed is a circuit which includes a first amplifier that generates a first output signal by comparing a first pixel signal corresponding to a first conversion gain and a first ramp signal and generates a second output signal by comparing a second pixel signal corresponding to a second conversion gain and a second ramp signal, and a second amplifier that generates a third output signal based on the first output signal and generates a fourth output signal based on the second output signal, the first conversion gain is higher than the second conversion gain, and a first power current of the first amplifier when the first pixel signal and the first ramp signal are compared is different from a second power current of the first amplifier when the second pixel signal and the second ramp signal are compared.

Systems and methods are disclosed to enable fast readout from an image sensor to support pixel-wise conversion gain selection for high dynamic range imaging. In embodiments, an image sensor integrated circuit performs the pixel-wise gain selection with its readout circuitry, so that the image sensor outputs pixels with only the selected gain option. In this manner, the image sensor is able to achieve faster frame rates and lower power consumption. Depending on the embodiment, the conversion gain may be selected by the readout logic, an image signal processor, or an auto-exposure engine. The gain selection may be made based on a previous image captured by the camera or other pixels in the same image. The image signal processor may interpolate a high-gain and a low-gain portion of the image to obtain full resolution images in the two gain options, and merge the two to obtain the final image.