Provided is an X-ray generating tube including an electron gun, which includes a grid electrode secured to a support member. In the X-ray generating tube, thermal stress generated at a joining portion between the support member and the grid electrode is reduced, to thereby maintain a position of an electron beam on a target irradiated with the electron beam accurately for a long time. A grid electrode and a support member are secured to each other via a buffer member, which has an elastic coefficient that is lower than elastic coefficients of the grid electrode and the support member, and which is joined to the grid electrode and the support member through a first joining portion on the grid electrode side and a second joining portion on the support member side, respectively.

An x-ray phase contrast imaging apparatus and method of operating the same. The apparatus passes x-rays generated by an x-ray source through, in succession, a source grating, an object of interest, a phase grating, and an analyzer grating. The x-ray source, the source grating, the phase grating, and the analyzer grating move as a single entity relative to an object of interest. The phase grating and the analyzer grating remain in fixed relative location and fixed relative orientation with respect to one another. The detected x-rays are converted to a time sequence of electrical signals. In some cases, the apparatus is controlled, and the electrical signals are analyzed by, by a general purpose programmable computer provided with instructions recorded on a machine readable medium. One or more x-ray phase contrast images of the object of interest are generated, and can be recorded or displayed.

A method and an apparatus for generating x-ray inspection image of an electronic circuit board are disclosed. The method includes: respectively generating, according to data files of the electronic circuit board and parameters of an X-ray machine, analog images of both faces of the electronic circuit board; subjecting the electronic circuit board to X-ray imaging to generate a real image of the electronic circuit board, the real image comprising real image elements on both faces of the electronic circuit board; identifying, according to the analog images of both faces, from the real image an interference image element that needs to be filtered from the real image for generating a real image of a detected object; and filtering the interference image element from the real image to generate the real image of the detected object.

A method and an apparatus for generating x-ray inspection image of an electronic circuit board are disclosed. The method includes: respectively generating, according to data files of the electronic circuit board and parameters of an X-ray machine, analog images of both faces of the electronic circuit board; subjecting the electronic circuit board to X-ray imaging to generate a real image of the electronic circuit board, the real image comprising real image elements on both faces of the electronic circuit board; identifying, according to the analog images of both faces, from the real image an interference image element that needs to be filtered from the real image for generating a real image of a detected object; and filtering the interference image element from the real image to generate the real image of the detected object.

The present invention relates to determining baseline shift of an electrical signal generated by a photon detector (102) of an X-ray examination device (101). For this purpose, the photon detector comprises a processing unit (103) that is configured to determine a first crossing frequency of a first pulse height threshold by the electrical signal generated by the photon detector. The first pulse height threshold is located at a first edge of a noise peak in the pulse height spectrum of the electrical signal.

The present invention relates to determining baseline shift of an electrical signal generated by a photon detector (102) of an X-ray examination device (101). For this purpose, the photon detector comprises a processing unit (103) that is configured to determine a first crossing frequency of a first pulse height threshold by the electrical signal generated by the photon detector. The first pulse height threshold is located at a first edge of a noise peak in the pulse height spectrum of the electrical signal.

The invention relates to a system (31) for generating spectral computed tomography projection data. A spectral projection data generation device (6) comprising an energy-resolving detector generates spectral computed tomography projection databased on polychromatic radiation (4), which has been provided by a radiation device (2), after having traversed an examination zone (5), and a reference values generation device generates energy-dependent reference values based on radiation, which has not traversed the examination zone. A spectral parameter providing unit (12) provides a spectral parameter being indicative of a spectral property of the radiation device based on the energy-dependent reference values. In particular, spectral properties of the radiation device can be monitored over time, wherein this information can be used for, for instance, correcting the spectral computed tomography projection data, and/or, if undesired spectral properties of the radiation device are indicated, triggering a replacement of the radiation device.

X-ray sources including an electron source, an adjustment means for adjusting an orientation of the electron beam generated by the electron source, a focusing means configured to focus the electron beam in accordance with a focusing setting, a beam orientation sensor arranged to generate a signal indicating an orientation of the electron beam relative to a target position, and a controller that is operably connected to the focusing means, the beam orientation sensor and the adjustment means. Also, X-ray sources including a target orientation sensor and a target adjustment means, wherein the controller is configured to cause the beam adjustment means and/or target adjustment means to adjust the relative orientation between the electron beam and the target.

X-ray sources including an electron source, an adjustment means for adjusting an orientation of the electron beam generated by the electron source, a focusing means configured to focus the electron beam in accordance with a focusing setting, a beam orientation sensor arranged to generate a signal indicating an orientation of the electron beam relative to a target position, and a controller that is operably connected to the focusing means, the beam orientation sensor and the adjustment means. Also, X-ray sources including a target orientation sensor and a target adjustment means, wherein the controller is configured to cause the beam adjustment means and/or target adjustment means to adjust the relative orientation between the electron beam and the target.

Some embodiments include an x-ray source, comprising: an anode; a field emitter configured to generate an electron beam; a first grid configured to control field emission from the field emitter; a second grid disposed between the first grid and the anode; and a middle electrode disposed between the first grid and the anode wherein the second grid is either disposed between the first grid and middle electrode or between the middle electrode and the anode.