A method and a device for driving high-voltage X ray tube with positive and negative pulses are disclosed comprises a microprocessor unit having a first output port and a second output port, respectively outputting a first and a second timing sequence of control signals, a high-voltage X ray tube, a first high-frequency voltage boost circuit outputting a first regulated high-voltage, a first high-voltage protection circuit, a second high-frequency voltage boost circuit outputting a second high-voltage, and a second high-voltage protection circuit. The first high and the second voltages are respectively, regulated by the first timing sequence of control signal and the second timing sequence of control signal. Both regulated high-voltages are, respectively, inputted to anode and cathode of the high-voltage X ray tube vias the high-voltage protected circuits.

An industrial X-ray imaging apparatus including: an X-ray source; an X-ray detector configured to detect X-rays emitted from the X-ray source; a stage which is disposed between the X-ray source and the X-ray detector and is configured to support a subject; and a shielding chamber configured to accommodate the X-ray source, the X-ray detector, and the stage, in which the shielding chamber includes a door for carrying in and out the subject, and a lock mechanism for prohibiting the door from changing to an open state, and in which the X-ray imaging apparatus further includes an unlocking control unit configured to control unlocking of the lock mechanism based on a leakage dose leaking from the shielding chamber to an outside.

Provided is an X-ray inspection apparatus including: an X-ray tube configured to generate X-rays; a high-voltage power source configured to supply a tube voltage to the X-ray tube to generate X-rays; an X-ray irradiation control section configured to output a first control signal and a second control signal to the high-voltage power source to control the high-voltage power source; and a determination section configured to count at least one of the first control signal and the second control signal output from the X-ray irradiation control section to the high-voltage power source, compare a counted count value with a preset threshold value, and determine a deterioration state of a component constituting the X-ray tube.

Provided is an X-ray inspection apparatus including: an X-ray tube configured to generate X-rays; a high-voltage power source configured to supply a tube voltage to the X-ray tube to generate X-rays; an X-ray irradiation control section configured to output a first control signal and a second control signal to the high-voltage power source to control the high-voltage power source; and a determination section configured to count at least one of the first control signal and the second control signal output from the X-ray irradiation control section to the high-voltage power source, compare a counted count value with a preset threshold value, and determine a deterioration state of a component constituting the X-ray tube.

The invention includes various electronic devices for avoiding or minimizing XRF analyzer user fatigue. In one embodiment, the XRF analyzer can include a finger tap switch for activating the XRF analysis. In another embodiment, the XRF analyzer can include a hand sensor and a finger tap switch, activation of both required to activate the XRF analysis. In another embodiment, the XRF analyzer can include a microphone capable of receiving a verbal command from a user and a finger tap switch, both receipt of the verbal command and activation of the finger tap switch required to activate the XRF analysis. Additional benefits of some embodiments include improving XRF analysis safety and avoiding XRF analyzer theft.

In an X-ray generator an X-ray tube includes an anode and a cathode and is energized with at least a first high voltage potential. A dynamic damper with a frequency dependent impedance is interposed between the X-ray tube and a source of the high voltage potential. The impedance of the dynamic damper increases with an increase in frequency associated with tube-spit. In an X-ray generator with resonant switching to provide a first kV level and a second kV level to the X-ray tube, the impedance of the dynamic damper is low at the operational frequency of the resonant switch to promote energy recovery when the resonant switch operates to provide a first kV level to the X-ray tube.

An apparatus and method for actively managing the current provided to an X-ray filament is provided. A feedback measurement of the actual filament current supplied to an X-ray filament is provided into a current manager and feedback system. An error amplifier compares the feedback measurement to a filament reference command indicating the appropriate current amount to be supplied to the X-ray filament, and the output of the error amplifier runs a pulse width modulator to provide a signal to an inverter to supply a voltage to the X-ray filament transformer. When a comparator senses sufficient high voltage is supplied to the X-ray tube, a second error amplifier is allowed to add to the filament current command an amount sufficient to make the X-ray tube's emission current match the commanded emission current. Additional circuitry and electronic switches are provided to allow the apparatus to operate in a dual-filament system.

An apparatus and method for actively managing the current provided to an X-ray filament is provided. A feedback measurement of the actual filament current supplied to an X-ray filament is provided into a current manager and feedback system. An error amplifier compares the feedback measurement to a filament reference command indicating the appropriate current amount to be supplied to the X-ray filament, and the output of the error amplifier runs a pulse width modulator to provide a signal to an inverter to supply a voltage to the X-ray filament transformer. When a comparator senses sufficient high voltage is supplied to the X-ray tube, a second error amplifier is allowed to add to the filament current command an amount sufficient to make the X-ray tube's emission current match the commanded emission current. Additional circuitry and electronic switches are provided to allow the apparatus to operate in a dual-filament system.

An x-ray apparatus includes a source configured to generate electrons, a target configured to produce x-rays upon impingement of electrons, and a detector configured to detect electrons penetrating the target or reflected from the incident face of the target, indicative of damage to the target.

An emitter that can be lighted even if a line of any part thereof is broken by ensuring an electric pathway. The X-ray tube device includes an electron emission surface P having an electric pathway; electric heating elements 21, 22 that are connected electrically to both ends of said electron emission surface; and two branched terminals that are branched in the middle of the electric pathway of the electron emission surface P between electric heating elements 21 and 22; second electric heating element, in order from the electric heating element 21 as the supporting element 23 and the supporting element 24; and further comprises: a relay 33A that switches the electric heating element 21 and the supporting element 24 to be in a short-circuit/open condition and a relay 33B switches the electric heating element 22 and the supporting element 23 to be in a short-circuit/open condition. A bypass electric pathway may be formed where the short-circuit condition is switched on and such bypass electric pathway can exist at all locations relative to the electric pathway between the electric heating elements 21 and 22.