Patent classifications
H05K1/0268
TEMPERATURE MEASUREMENT DEVICE
A temperature measurement device includes: a case fixed to a measurement target product; a flexible printed circuit board attached to the case; and a thermistor element mounting portion having a thermistor element to be electrically connected to a wiring provided on the flexible printed circuit board, the case has a holding portion for holding the thermistor element mounting portion and a support portion for supporting the holding portion, the holding portion is connected through a hinge portion to a case body provided with the support portion, and the holding portion is supported by the support portion in such a manner that the holding portion is folded back to bend the hinge portion.
SHORT INTERCONNECT ASSEMBLY WITH STRIP ELASTOMER
An electrical contact assembly that uses an elastomer strip for each row of individual contacts. Each contact comprises a rigid bottom pin and a flexible top pin with a pair of arms which extend over and slide along sloped concave surfaces of the bottom contact. The elastomer strip is located between rows of the bottom and top pins. A bottom socket housing is provided with grooves which receive each elastomer strip. A row of top pins is then placed over each elastomer strip, and through ducts in the bottom socket housing. Bottom pins are then snapped into place in between the pair of arms.
MANUFACTURING METHOD OF ELECTRONIC DEVICE
A manufacturing method of an electronic device is provided. The manufacturing method of the electronic device includes following steps: providing a substrate; bonding at least one electronic component to the substrate, wherein the at least one electronic component is mainly driven by a reverse bias in an operating mode; applying a forward bias to the at least one electronic component, and determining whether the at least one electronic component is normal or failed; and transporting the substrate configured with the at least one electronic component determined to be normal to a next production site or repairing the at least one electronic component determined to be failed.
Electronic device and method for detecting connection state of connection interface
An electronic device according to certain embodiments comprises a printed circuit board (PCB); a processor mounted on the PCB; and a connection interface configured to connect the PCB to an off-board electronic component, wherein the processor is configured to: output an inspection signal to the connection interface according to a particular bit pattern at a designated bit rate; identify a voltage level of a reception signal input to the processor, during a designated time, in response to the output of the inspection signal particular bit pattern; and determine a connection state of the connection interface based on the identified voltage level of the reception signal.
BATTERY WIRING MODULE
A battery wiring module includes a plurality of connecting members to be connected to electrode terminals and a flexible printed circuit board having a plurality of voltage detection lines for detecting the voltages of a plurality of power storage elements via the plurality of connecting members, at least one of the plurality of voltage detection lines being constituted to include a front surface wiring and a back surface wiring respectively formed on a front surface and a back surface of the flexible printed circuit board, and a front-back conduction part passing through the flexible printed circuit board in the plate thickness direction and connecting the front surface wiring and the back surface wiring, and the resistance value per unit length of the front-back conduction part being less than or equal to the maximum resistance value per unit length of the front surface wiring and the back surface wiring.
Substrate motherboard and manufacturing method thereof, driving substrate and display device
The present disclosure provides a substrate motherboard including: a first substrate base, a first conductive pattern layer, at least one first insulating layer and a second conductive pattern layer which are sequentially arranged. The first conductive pattern layer includes a plurality of signal lines in the active region. The second conductive pattern layer includes a plurality of connection terminals in the active region, and the plurality of connection terminals are electrically coupled to corresponding signal lines in the plurality of signal lines. The substrate motherboard further includes a plurality of leading-out wires and a plurality of detection terminals in the non-active region, first ends of the plurality of leading-out wires are electrically coupled to corresponding connection terminals and extending to the non-active region to be electrically coupled to corresponding detection terminals through second ends thereof.
Chip-on-film packages and display apparatuses including the same
A chip-on-film package includes a base film having a top surface and a bottom surface, and a circuit region; a source driver chip and a gate driver chip mounted on the circuit region; a first conductive line on the top surface of the base film, a second conductive line on the bottom surface of the base film, and a conductive via that connects the first and second conductive lines to each other; a first row of bonding pads on the circuit region and connected to the source driver chip; a second row of bonding pads on the circuit region and connected to the source driver chip and the gate driver chip; and a test pad outside the circuit region and connected to the first and second conductive lines and the conductive via.
Redistribution plate
A single-layer redistribution plate functioning as a space translator between a device under testing (“DUT”) and a testing PCB may comprise a hard ceramic plate. A DUT side of the plate may have pads configured to interface with a device under testing. Both sides of the plate may comprise traces, vias, and pads to fan out the DUT pad pattern so that the plate side opposite the DUT side has spatially translated pads configured to interface with the pads on a testing PCB. Fabricating a redistribution plate may comprise calibrating and aligning, laser milling vias, laser milling trenches and pads, copper plating, grinding and polishing, removing residual copper, and coating the copper surfaces.
REDISTRIBUTION PLATE
A single-layer redistribution plate functioning as a space translator between a device under testing (“DUT”) and a testing PCB may comprise a hard ceramic plate. A DUT side of the plate may have pads configured to interface with a device under testing. Both sides of the plate may comprise traces, vias, and pads to fan out the DUT pad pattern so that the plate side opposite the DUT side has spatially translated pads configured to interface with the pads on a testing PCB. Fabricating a redistribution plate may comprise calibrating and aligning, laser milling vias, laser milling trenches and pads, copper plating, grinding and polishing, removing residual copper, and coating the copper surfaces.
Film type package comprising a plurality of test lines and a plurality of first and second connection pads and display apparatus having the same
A film type package includes: a base film having first and second sides; a driver integrated circuit mounted on the base film; first connection pads disposed on a first area of the base film that is adjacent to the first side of the base film, and configured to be connected to a first external circuit; second connection pads disposed on a second area of the base film that is adjacent to the second side of the base film, and configured to be connected to a second external circuit; first signal lines disposed on the base film, and connecting the driver integrated circuit and the first connection pads; second signal lines disposed on the base film, and connecting the driver integrated circuit and the second connection pads; and a plurality of test lines extending from the driver integrated circuit to the first side of the base film.