Patent classifications
H
H05
H05K
2203/00
H05K2203/05
H05K2203/0502
H05K2203/0505
H05K2203/0505
Zero-misalignment via-pad structures
A photoresist is deposited on a seed layer on a substrate. A first region of the photoresist is removed to expose a first portion of the seed layer to form a via-pad structure. A first conductive layer is deposited onto the first portion of the seed layer. A second region of the photoresist adjacent to the first region is removed to expose a second portion of the seed layer to form a line. A second conductive layer is deposited onto the first conductive layer and the second portion of the seed layer.