A sample support used for ionizing a component of a sample includes: a substrate having a first surface, a second surface opposite the first surface, and a plurality of through-holes that are open on the first surface and on the second surface; a conductive layer provided on at least the first surface; and an anionizing agent provided in the plurality of through-holes to anionize the component.

The invention relates to devices and methods for desorption scanning of analyte material deposited on a sample support, which can comprise the following mode of operation: (a) setting a position of the support to approach an impingement region onto which a beam is directed for local desorption of analyte material; (b) determining an actual position of the support after setting the position; (c) comparing the determined actual position with a target position of the support to determine any deviation; (d) adjusting a beam orientation, if a deviation is detected, so that the beam is directed onto the impingement region on the support that results when there is no deviation; (e) applying the beam to the impingement region to locally desorb analyte material and deliver it to an analyzer; and (f) checking whether a predetermined end condition is satisfied and, if not, repeating steps (a)-(e) for a subsequent non-congruent impingement region.

A surface-assisted laser desorption/ionization method according to an aspect includes: a first process of preparing a sample support (2) having a substrate (21) in which a plurality of through-holes (S) passing from one surface (21a) thereof to the other surface (21b) thereof are provided and a conductive layer (23) that covers at least the one surface (21a); a second process of placing a sample (10) on a sample stage (1) and arranging the sample support (2) on the sample (10) such that the other surface (21b) faces the sample (10); and a third process of applying a laser beam (L) to the one surface (21a) and ionizing the sample (10) moved from the other surface (21b) side to the one surface (21a) side via the through-holes (S) due to a capillary phenomenon.

An analysis apparatus includes a stage on which an analysis sample as an analysis target and a first adjustment sample used for adjusting a focus are provided. A laser generation unit generates a laser beam for vaporizing the analysis sample or the first adjustment sample by irradiating the sample with the laser beam. A detection unit detects a signal intensity of an element of the analysis sample or the first adjustment sample vaporized by irradiation with the laser beam. A controller determines a focus position of the laser beam with respect to a front surface position of the first adjustment sample based on the signal intensity of the first adjustment sample, and performs a control such that the focus position of the laser beam corresponds with a front surface of the analysis sample.

The invention provides a method for identifying a subject suitable for receiving a lung transplant, the method comprising: subjecting a sample to mass spectrometry analysis (in the negative ion mode or positive ion mode; preferably in the positive ion mode) and generating a mass spectrum output; wherein said sample is an isolated sample obtained from a subject that is a candidate for receiving a lung transplant; detecting one or more peak set in said mass spectrum output; wherein the presence of said one or more peak set indicates that the subject is not a suitable candidate for receiving a lung transplant; or wherein the absence of said one or more peak set indicates that the subject is a suitable candidate for receiving a lung transplant. The invention relies on the detection of peak sets specific to the membrane of pathogens, in particular mycobacteria.

One mode of the present invention provides a laser power adjustment method for ionization in a laser desorption/ionization mass spectrometer, the laser power adjustment method including: a measurement step (S1) in which intensity information on ions derived from a specific component in a specimen are acquired while changing laser power in n stages (n is 3 or more) for the identical specimen; and a processing step (S2, S6, and S7) in which a slope of a straight line connecting two adjacent plot points on a laser power axis is calculated in a two-axis graph in which a relationship between n ionic intensities obtained by the measurement step or a signal value, which is an SN ratio obtained from the ionic intensities, and laser power is plotted; an index value reflecting a ratio between a forward slope value, which is a slope of a straight line on a front side of the plot point, and a backward slope value, which is a slope of a straight line on a rear side, is obtained for each plot point; and appropriate laser power is selected using the index value.

A surface-assisted laser desorption/ionization method according to an aspect includes: a first process of preparing a sample support (2) having a substrate (21) in which a plurality of through-holes (S) passing from one surface (21a) thereof to the other surface (21b) thereof are provided and a conductive layer (23) that covers at least the one surface (21a); a second process of placing a sample (10) on a sample stage (1) and arranging the sample support (2) on the sample (10) such that the other surface (21b) faces the sample (10); and a third process of applying a laser beam (L) to the one surface (21a) and ionizing the sample (10) moved from the other surface (21b) side to the one surface (21a) side via the through-holes (S) due to a capillary phenomenon.

A trace of intensity versus time values is received for a series of samples produced by a mass spectrometer. Also, a series of ejections times corresponding to the series of samples produced by a sample introduction system is received. A series of expected peak times corresponding to the series of ejection times are calculated using a known delay time from ejection to mass analysis. At least one isolated peak of the trace is identified using the series of expected peak times. A peak profile is calculated by fitting a mixture of at least two different distribution functions to the at least one isolated peak. For at least one time of the series of expected peak times, an area of a peak at the one time is calculated by fitting the peak profile to the trace at the one time and calculating an area of the fitted peak profile.

A sample support according to an aspect is a sample support for a surface-assisted laser desorption/ionization method, and includes: a substrate in which a plurality of through-holes passing from one surface thereof to the other surface thereof are provided; and a conductive layer that is formed of a conductive material and covers at least the one surface. The through-holes have a width of 1 to 700 nm, and the substrate has a thickness of 1 to 50 μm.

A time of flight mass spectrometer that includes a first electrode; and a second electrode that is spaced apart from the first electrode. The ion source is configured to apply voltages to the first and second electrodes to produce an electric field in a region between the first and second electrodes so as to influence ions present in the region between the first and second electrodes when the mass spectrometer is in use. A shield is formed on the first electrode and/or second electrode. The shield is configured to inhibit an electric field formed between edges of the first and second electrodes from penetrating into the region between the first and second electrodes when the mass spectrometer is in use