The invention relates to a temperature control plasma source analyzer arrangement (1) comprising a plasma source (3), at least one preheating device (2), preferably comprising a temperature control means (21) for heating and/or cooling at least one gas flow of the plasma source (3) relative to room temperature, of, and an analyzer (4); wherein the at least one gas flow comprises a sample gas flow (5) with a sample aerosol (15), the plasma source (3) is configured to ionize the sample aerosol (15) of the sample gas flow (5), and the analyzer (4) is configured to analyze the ionized sample aerosol (15); wherein the preheating device (2) is configured to increase temperature of the at least one gas flow; the preheating device (2) is located in front of the plasma source (3) so that the at least one gas flow reaches the plasma source (3) only after leaving the preheating device (2); the preheating device (2) is configured to controllably increase the temperature of the at least one gas flow; and the arrangement (1) is designed as a modular system, wherein the preheating device (2) is constructed as a separate module

A temperature monitoring system (16) for use with a thermocouple (21) and a heater controller (24) to control a heater (1). The system (16) comprises a differential amplifier (17) which comprises a first input terminal (18) which is configured to connect to a first terminal (20) of the thermocouple (21) and a second input terminal (19) which is configured to connect to a second terminal (22) of the thermocouple (21). The differential amplifier (17) comprises an output terminal (23) which is configured to provide a temperature sense signal to the heater controller to control the heater (1). The system (16) further comprises a protection circuit (24) which is connected to the first input terminal (18) and the second input terminal (19). The protection circuit (24) is configured to operate in a first mode in the event that a leakage current flows into the first input terminal (18) or the second input terminal (19); and a second mode in the event that a leakage current flows out from the first input terminal (18) or the second input terminal (19), such that the protection circuit (24) controls the differential amplifier (17) to output a temperature sense signal which controls the heater (1) to operate at a temperature at or below a predetermined temperature to reduce the risk of damage being caused by the heater (1).

A heating device having a heating element patterned into a robust MEMs substrate, wherein the heating element is electrically isolated from a fluid reservoir or bulk conductive sample, but close enough in proximity to an imagable window/area having the fluid or sample thereon, such that the sample is heated through conduction. The heating device can be used in a microscope sample holder, e.g., for SEM, TEM, STEM, X-ray synchrotron, scanning probe microscopy, and optical microscopy.

A TOFMS includes an ion ejection unit, a flight tube, a vacuum chamber in which the flight tube is enclosed, a temperature control unit that controls the temperature of the flight tube, a temperature control section that controls a temperature control operation by the temperature control unit based on an indirectly or directly measured temperature of the flight tube and a target temperature; a temperature sensor that measures an ambient temperature, which is a temperature outside the vacuum chamber; a prediction unit that predicts, based on the ambient temperature and the target temperature, a possibility that the temperature of the flight tube will not reach the target temperature or will not fall within a predetermined allowable temperature range including the target temperature even with the temperature control using the temperature control unit; and a notification unit that performs a notification to a user according to a prediction result.