Methods, devices, and systems for improving the quality of electrospray ionization mass spectrometer (ESI-MS) data are described, as are methods, devices, and systems for achieving improved correlation between chemical separation data and mass spectrometry data.

In a method and apparatus for electron ionization liquid chromatography mass spectrometry (EI-LC-MS) analysis liquid chromatograph output solvent flow is directed together with spray formation gas into a spray formation and vaporization chamber for forming spray droplets which are vaporized to form vaporized sample compounds at a pressure equal to or greater than ambient pressure. A minor portion is conveyed into a heated flow restriction capillary that directly connects the spray formation and vaporization chamber and a non-fly-through electron ionization ion source of a mass spectrometer located inside a vacuum chamber. A major portion is released to atmosphere so that it does not enter the flow restriction capillary and therefore does not reach the non-fly-through electron ionization ion source. Also disclosed is an interface for a unified dual-mode mass spectrometer system for performing gas chromatography mass spectrometry (GC-MS) or electron ionization liquid chromatography mass spectrometry (EI-LC-MS) analyses.

For improving sensitivity, dynamic range, and specificity of GC-MS analysis there are disclosed embodiments of novel apparatuses based on improved characteristics of semi-open source with electron impact ionization, providing much higher brightness compared to known open EI sources. In an implementation, the source becomes compatible with multi-reflecting TOF analyzers for higher resolution analysis for improving detection limit. With improved schemes of spatial and temporal refocusing there are proposed various tandem TOF-TOF spectrometers with PSD, CID, and SID fragmentation and using either singly reflecting TOF or MR-TOF analyzers.

A magnet assembly for an ion source comprising a first magnet of a first magnet type; a second magnet of a second magnet type; a heat shield located between the first magnet and the second magnet; and a heat sink coupled to the heat shield; wherein the first magnet type having a higher Curie temperature than the second magnet type.

Certain configurations of ionization sources are described. In some examples, an ionization source comprises an ionization block, an electron source, an electron collector, an ion repeller and at least one electrode configured to provide an electric field when a voltage is provided to the at least one electrode. Systems and methods using the ionization source are also described.

A filament assembly for mounting to a source assembly of a mass spectrometer, the filament assembly comprising a body having one of: an aperture to receive a corresponding spigot provided by a source assembly; or a spigot to be received in a corresponding aperture on a source assembly.

A mass analyzer includes two chambers for ionizing gas to form ions and/or introducing reaction gases to aid in ionization. A first chamber includes an electron to allow electron bombardment of a first gas. A second chamber receives a second gas and ions from the first chamber to allow interaction between the second gas, and the ions from the first chamber. The first and/or second gas may include analyte.

Provided is a time-of-flight mass spectrometer including: an ionization part receiving electron beams to thereby emit ions; a cold electron supply part injecting the electron beams to the ionization part; an ion detection part detecting the ions emitted from the ionization part; and an ion separation part connecting the ionization part and the ion detection part, wherein the cold electron supply part includes a microchannel plate receiving ultraviolet rays to thereby emit the electron beams, the ions emitted from the ionization part pass through the ion separation part to thereby reach the ion detection part, and the ion separation part has a straight tube shape.

An ion generation apparatus according to the present invention includes an electron emission device, an opposite electrode, and a controller, the electron emission device includes a lower electrode, a surface electrode, and an intermediate layer provided between the lower electrode and the surface electrode, the opposite electrode is provided to be opposite to the surface electrode, and the controller is provided to apply a voltage to the surface electrode, the lower electrode, or the opposite electrode such that a potential of the surface electrode becomes higher than a potential of the lower electrode and a potential of the opposite electrode in a positive ion mode.

An atmospheric pressure electron impact ionization mass spectrometer system includes an atmospheric pressure ionization component operated at an atmospheric pressure. An electron impact ionization mass spectrometer includes an electron ionization source. An atmospheric pressure interface operates below about 10 Torr. The atmospheric pressure interface includes a source block to focus a plurality of molecules and ions from the atmospheric pressure ionization component at the atmospheric pressure into the electron ionization source which operates at a pressure below about 10.sup.?3 Torr.