Patent classifications
H01J49/147
Ion source
Provided herein is an ion source containing a plurality of components, at least one of which is partially coated with a layer of silicon. The ion source reduces reactivity between the sample and the carrier gas, reduces or eliminates tailing in ion chromatograms, and/or improves mass spectral fidelity. Also provided are methods of using the ion source in a mass spectrometer or gas chromatograph-mass spectrometer.
ION SOURCE
Provided herein is an ion source containing a plurality of components, at least one of which is partially coated with a layer of silicon. The ion source reduces reactivity between the sample and the carrier gas, reduces or eliminates tailing in ion chromatograms, and/or improves mass spectral fidelity. Also provided are methods of using the ion source in a mass spectrometer or gas chromatograph-mass spectrometer.
SATELLITE SYSTEM FOR REDUCING PLANETARY WARMING THROUGH SOLAR GAIN MITIGATION
A satellite system designed to address planetary warming by reducing solar gain is disclosed. The system tackles the technical challenge of ineffective current methods in combating climate change. This technology employs transmitted resonance to decompose Carbon Dioxide and Sulfur Dioxide in the atmosphere, inducing lightning to vitrify sulfur compounds and sequester carbon. The primary application is to test climate mitigation strategies without harming Earth's atmosphere, with the satellite positioned in high day-side Venusian orbit to validate carbon sequestration. The system includes components such as electron emitters, particle accelerators, and inert gas pressure tanks. This approach offers a novel method for atmospheric repair and space debris management, potentially transforming Venus's atmosphere into a more stable state.
MASS SPECTROMETRY METHOD AND MASS SPECTROMETER
A mass spectrometer includes: measurement execution units separate and detect product ions according to a mass-to-charge ratio, generated by irradiating a precursor ion of a sample component with an oxygen radical, a hydroxyl radical, or a nitrogen radical; a candidate molecule estimation unit to determine a candidate molecule assuming that the sample component is a compound having a heterocyclic ring containing a double bond between carbon atoms based on the mass-to-charge ratio of the precursor ion; an assumed product ion estimation unit to calculate a mass-to-charge ratio of an assumed product ion assumed to be generated by dissociation of the heterocyclic ring of the precursor ion of the candidate molecule or a bond adjacent to the heterocyclic ring; and a determination unit to determine whether the sample compound is the candidate molecule by comparing the mass-to-charge ratio of the detected product ion with th at of the assumed product ion.
Ion source assembly with multiple elliptical filaments
An electron bombardment ion source assembly for use in a mass spectrometer and including an anode extending along an axis and surrounding an ionization volume. At least two filaments are each configured to thermionically emit electrons and are positioned outside the ionization volume and proximate to the anode. The at least two filaments each comprise an elliptically-shaped portion and non-elliptical portions on either end of the elliptically-shaped portion. The non-elliptically-shaped portions are configured to be mounted in a fixed position relative to the anode to maintain a constant distance between the elliptically-shaped portion and the anode. The elliptically-shaped portion extends along a plane that intersects a plane perpendicular to the axis of the anode at a non-zero angle.
Mass spectrometer
One mode of the mass spectrometer according to the present invention is a mass spectrometer including an ion source configured to ionize a component contained in a sample gas, the ion source including: an ionization chamber having an ion ejection opening and forming a space substantially partitioned from an outside inside the ionization chamber; a thermal electron supply unit configured to supply thermal electrons to an inside of the ionization chamber; a magnetic field forming unit configured to form a magnetic field inside the ionization chamber such that the thermal electrons move helically; and a deflection electric field forming unit configured to form a deflection electric field deflecting ions derived from the component generated in the ionization chamber by a direct or indirect action of the thermal electrons in a direction against a force received from the magnetic field when the ions are moving toward the ion ejection opening.