Patent classifications
H01J49/147
Analyzer apparatus and control method
An analyzer apparatus includes: an ionization unit that ionizes molecules to analyze; a filter unit that forms a field for selectively passing ions generated by the ionization unit; a detector unit that detects ions that have passed through the filter unit; an ion drive circuitry that electrically drives the ionization unit; a field drive circuitry that electrically drives the filter unit; a control unit that controls outputs of the ion drive circuitry and the field drive circuitry; a temperature detecting unit that detects the temperature of the ion drive circuitry and the field drive circuitry; and a correction unit that corrects output settings of the ion drive circuitry and the field drive circuitry based on the temperature detected by the temperature detecting unit.
GC-TOF MS with improved detection limit
For improving sensitivity, dynamic range, and specificity of GC-MS analysis there are disclosed embodiments of novel apparatuses based on improved characteristics of semi-open source with electron impact ionization, providing much higher brightness compared to known open EI sources. In an implementation, the source becomes compatible with multi-reflecting TOF analyzers for higher resolution analysis for improving detection limit. With improved schemes of spatial and temporal refocusing there are proposed various tandem TOF-TOF spectrometers with PSD, CID, and SID fragmentation and using either singly reflecting TOF or MR-TOF analyzers.
STIMULATED OR NON-EQUILIBRIUM ENERGY-LOSS AND ENERGY-GAIN SPECTROSCOPY DEVICE
A spectroscopy device including: an electron source arranged to emit a flux of electrons towards a sample, a pulsed photon source emitting photon pulses towards the sample, at least one spectrometer for receiving a flux of electrons originating from the sample, at least one electron detector; and
at least one deflector, between the electron source and the at least one electron detector, synchronized with the pulsed photon source to allow or prevent the passage of electrons emitted by the electron source, towards the electron detector.
AN ELECTRON SOURCE
An electron source in a gas-source mass spectrometer the electron source comprising: an electron emitter cathode presenting a thermionic electron emitter surface in communication with a gas-source chamber of the gas-source mass spectrometer for providing electrons there to; a heater element electrically isolated from the electron emitter cathode and arranged to be heated by an electrical current therein and to radiate heat to the electron emitter cathode sufficient to liberate electrons thermionically from said electron emitter surface, therewith to provide a source of electrons for use in ionising a gas the gas-source chamber.
MASS SPECTROMETER
A mass spectrometer includes: a vacuum chamber; and an ion trap and a surface emission-type electron emissive element, the ion trap and the surface emission-type electron emissive element being disposed inside the vacuum chamber.
ANALYZER APPARATUS AND CONTROL METHOD
An analyzer apparatus includes: an ionization unit that ionizes molecules to analyze; a filter unit that forms a field for selectively passing ions generated by the ionization unit; a detector unit that detects ions that have passed through the filter unit; an ion drive circuitry that electrically drives the ionization unit; a field drive circuitry that electrically drives the filter unit; a control unit that controls outputs of the ion drive circuitry and the field drive circuitry; a temperature detecting unit that detects the temperature of the ion drive circuitry and the field drive circuitry; and a correction unit that corrects output settings of the ion drive circuitry and the field drive circuitry based on the temperature detected by the temperature detecting unit.
SYSTEM AND METHOD TO INCREASE SURFACE FRICTION ACROSS A HYDROPHOBIC, ANTI-FOULING, AND OLEOPHOBIC COATED SUBSTRATE
A system and method to increase surface friction across a hydrophobic, anti-fouling, and oleophobic coated substrate. The substrate has a hydrophobic surface defined by a surface friction. The system works to increases the surface friction, or roughness, across the hydrophobic surface. The increase in surface friction is accomplished by generating power through an ion source to create an ion cloud. The ion cloud is generated in proximity to the substrate. The ions interact with the hydrophobic surface to create a roughing effect thereon. A gas carrier device introduces an inert carrier gas through the ion cloud to increase density of the ions, which in turn increases surface friction. The system is variable, selectively increasing and decreasing surface friction by: varying the duration that the hydrophobic surface is exposed to the ion cloud; varying power applied to ion source; and varying distance between the ion cloud and the hydrophobic surface.
Apparatus for mass analysis of analytes by simultaneous positive and negative ionization
Among other things, we describe methods and apparatus for the ionization of target molecular analytes of interest, e.g., for use in mass spectrometry. In some implementations, a thin molecular stream is emitted in either single or a split mode and encounters both an electron-impact ion source and trochoidal electron monochromator placed sequentially or coincidentally. The first ion source emits high-energy electrons (70 eV) to generate characteristic positively-charged mass fragment spectra while the second source emits low-energy electrons in a narrow bandwidth to generate negative molecular ions or other ions via electron capture ionization. The dual ion source may be coupled to analytical instruments such as a gas chromatograph and to any number of mass analyzers such as a polarity switching quadrupole mass analyzer or to multiple mass analyzers.
Ion transfer from electron ionization sources
An example system includes an electron ionization ion source and a mass analyzer. The electron ion source is configured, during operation of the system, to create from sample molecules a beam of ions extending along an ion beam axis. The system also includes a collision cooling chamber comprising a gas manifold and an electric field generator. The cooling chamber defines an entrance aperture and an exit aperture on respective opposing ends of the cooling chamber, the entrance aperture of the cooling chamber being in axial alignment with the ion beam axis. The cooling chamber is configured, during operation of the system, to generate a radio frequency (RF) field within the cooling chamber using the electric field generator, and receive collision gas through the gas manifold to pressurize the cooling chamber.
Methods, apparatus, and system for mass spectrometry
A miniature, low cost mass spectrometer capable of unit resolution over a mass range of 10 to 50 AMU. The mass spectrometer incorporates several features that enhance the performance of the design over comparable instruments. An efficient ion source enables relatively low power consumption without sacrificing measurement resolution. Variable geometry mechanical filters allow for variable resolution. An onboard ion pump removes the need for an external pumping source. A magnet and magnetic yoke produce magnetic field regions with different flux densities to run the ion pump and a magnetic sector mass analyzer. An onboard digital controller and power conversion circuit inside the vacuum chamber allows a large degree of flexibility over the operation of the mass spectrometer while eliminating the need for high-voltage electrical feedthroughs. The miniature mass spectrometer senses fractions of a percentage of inlet gas and returns mass spectra data to a computer.