The present application relates to a nano-liter photoionization mass spectrometry ion source device and an operation method thereof. The nano-liter photoionization mass spectrometry ion source device includes a nano-tip, configured to load a sample solution, thus achieving a nano-electrospray process; a metal electrode, inserted into the nano-tip to contact with the sample solution directly, thus providing a high-voltage electric field for the nano-electrospray; and a UV lamp, configured to emit a high-energy ultraviolet photon to be combined with a gaseous molecule obtained by vaporizing the sample solution, thus achieving a photoionization process. Directed to the problems such as low ionization efficiency, poor sensitivity and more impurity interference existing in the unicellular mass spectrometry process of trace low-polar compounds in small-volume samples, a nano-liter photoionization mass spectrometry ion source device suitable for the analysis on low-polar compounds in small volume, e.g., polycyclic aromatic hydrocarbons (PAHs) is designed in the present application.

The support unit includes a first support body and a second support body. The first support body includes an ionization substrate. The second support body is disposed to face the first support body. The second support body includes a support substrate and an adhesive layer. A placement surface of the support substrate has a first region and a second region. The first region overlaps the measurement region when viewed in a Z-axis direction. The second region has conductivity and includes a region configured not to overlap the first support body when viewed in the Z-axis direction. The adhesive layer has a first portion and a second portion. The first portion is provided in the first region. The second portion has conductivity and electrically connects the second region and the conductive layer of the first support body.

A system and method comprising an ion production chamber having a ultra-violet light source disposed towards said chamber, a harvest gas disposed to flow through the chamber from an inlet to an outlet, and a jet, said jet operable to introduce a sample into the harvest gas flow. In some embodiments the system includes using helium as the harvest gas. Certain embodiments include introducing a sample perpendicular to the harvest gas flow and using multiple sample introduction jets to increase mixing efficiency. The charge sample may be coupled to a MEMS-based electrometer.

A system and method comprising a charger for ionizing aerosols; a spectrometer coupled to the charger and operable to select for a predetermined particle size; a porous charge collector coupled to the spectrometer, and a MEMS electrometer. In some embodiments the charge collector may be a metal frit electrically coupled to the electrometer. The electrometer may include a comb drive actuator coupled to a moving shuttle supported on flexures.

A charged particle image measuring device includes a sample stage, a charged particle lens opposite the sample stage, a two-dimensional detector, a first diaphragm disposed between the sample stage and a position of a crossover that is formed by the charged particle lens and that is closest to a sample, and a second diaphragm disposed between the first diaphragm and the two-dimensional detector.

A thermal analysis step, a molecule ionization step and a molecular structure analysis step are executed in parallel to a temperature increasing step. In the molecule ionization step, component molecules contained in gas evolved from a sample S due to temperature increase are ionized, and in the molecular structure analysis step, any selected ion out of molecular ions obtained in the molecule ionization step is dissociated to generate fragment ions corresponding to the structural factors of the molecule, and the structure of the molecule is analyzed on the basis of the fragment ions.

An ion source for a mass spectrometer comprises: an evacuated chamber having an interior receiving a gaseous sample effluent stream; a source of light pulses of pulse width 150 femtoseconds or less; a window of the evacuated chamber through which the light pulses pass into the evacuated chamber interior; one or more mirrors within the evacuated chamber disposed such that the light pulses are reflected from each of the one or mirrors such that the reflected pulses are caused to focus at one or more focal regions within the effluent stream within the evacuated chamber interior; and a pair of electrodes disposed at opposite sides of the one or more focal regions.

The present invention relates to compact, low noise, ultra-short pulse sources based on fiber amplifiers, and various applications thereof. At least one implementation includes an optical amplification system having a fiber laser seed source producing seed pulses at a repetition rate corresponding to the fiber laser cavity round trip time. A nonlinear pulse transformer, comprising a fiber length greater than about 10 m, receives a seed pulse at its input and produces a spectrally broadened output pulse at its output, the output pulse having a spectral bandwidth which is more than 1.5 times a spectral bandwidth of a seed pulse. A fiber power amplifier receives and amplifies spectrally broadened output pulses. A pulse compressor is configured to temporally compress spectrally broadened pulses amplified by said power amplifier. Applications include micro-machining, ophthalmology, molecular desorption or ionization, mass-spectroscopy, and/or laser-based, biological tissue processing.

The present disclosure provides methods for detecting biological print(s) or biological fluid(s) or target low molecular weight analyte(s) therein comprising contacting the suspected print(s) or fluid(s) with porous semiconductor substrates or microparticles (MPs) under conditions to allow said semiconductor substrates or microparticles to adhere to the print(s) or fluid(s) or analyte(s) therein, and analysing the adhered porous semiconductor substrates or MPs to detect the print(s), fluid(s) or analytes when present. The disclosure also includes method for making porous semiconductor substrates.

A charged particle image measuring device includes a sample stage, a charged particle lens opposite the sample stage, a two-dimensional detector, a first diaphragm disposed between the sample stage and a position of a crossover that is formed by the charged particle lens and that is closest to a sample, and a second diaphragm disposed between the first diaphragm and the two-dimensional detector.